Defect inspection method and apparatus therefor

• US 20020030807A1
• Filed: 05/22/2001
• Published: 03/14/2002
• Est. Priority Date: 07/27/2000
• Status: Active Grant

• Current Assignee: Hitachi, Ltd.
• Original Assignee: Hitachi, Ltd.
• Inventors: Uto, Sachio, Yoshida, Minoru, Yoshida, Atsushi, Nakata, Toshihiko, Maeda, Shunji, Shishido, Hiroaki, Shibata, Yukihiro
• Granted Patent: US 6,556,290 B2
• Time in Patent Office: Days
• US Class Current: 356/237.2
• CPC Class Codes: G01N 21/956 Inspecting patterns on the surface of objects contactless testing of electronic circuits G01R31/308; testing currency G07D; manufacturing processes per se of semiconductor devices implementing a measuring step H01L22/10

Abstract

A defect inspection apparatus for inspecting a fine circuit pattern with high resolution to detect a defective portion is constructed to have an objective lens for detecting an image of a sample, a laser illumination unit for illuminating the sample through the objective lens, a unit for reducing the coherence of the laser illumination, an accumulation type detector, and a unit for processing the detected image signal.

Claims

1. A defect inspection apparatus comprising:

laser source means for emitting a laser beam;

coherence reducing means for reducing the coherence of said laser beam emitted from said laser source;

irradiation means for irradiating on a sample said coherence-reduced laser beam from said coherence reducing means;

image detecting means for detecting an image of said sample on which said laser beam is irradiated by said irradiation means;

polarized state control means placed between said laser source and said image detecting means; and

defect detecting means for detecting a defect of a pattern formed on said sample on the basis of information about said image of said sample detected by said image detecting means.

2. A defect inspection apparatus according to claim 1, wherein said image detecting means for detecting the image of said sample is parallel-output accumulation type image sensor means.

3. A defect inspection apparatus according to claim 2, wherein said accumulation type image sensor has a maximum quantum efficiency of 40% or above.

4. A defect inspection apparatus according to claim 2, wherein said laser source means emits ultraviolet laser light, and said accumulation type image sensor is of the rear-side irradiation type in which the rear side is sensitive to ultraviolet light.

5. A defect inspection apparatus according to claim 1, wherein said accumulation type image sensor is a time delay integration type image sensor, said apparatus further comprising:

table means for moving said sample while holding said sample thereon;

memory means for storing a reference image signal; and

control means for controlling said table means and said time delay integration type image sensor to operate in synchronism with each other, whereby said defect detecting means can detect said defect of said pattern formed on said sample by comparing said reference image signal stored in said memory means and an image signal based on said image of said sample detected by said time delay integration type image sensor.

6. A defect inspection apparatus according to claim 1, wherein said polarized state control means has a ¼

wave plate, or a ½

wave plate and ¼

wave plate.

7. A defect inspection apparatus according to claim 1, wherein said polarized state control means has a movable or rotatable ½

wave plate or ¼

wave plate.

8. A defect inspection apparatus according to claim 1, wherein said laser source emits a plurality of laser beams which are then synthesized by a polarization beam splitter.

9. A defect inspection apparatus according to claim 1, wherein said laser source emits a plurality of laser beams of different wavelengths.

10. A defect inspection apparatus according to claim 9, further comprising a wavelength plate for changing the polarized state of at least one of said plurality of laser beams of different wavelengths.

11. A defect inspection apparatus according to claim 9, further comprising a dichroic mirror for synthesizing said plurality of laser beams.

12. A defect inspection apparatus according to claim 1, wherein said laser source means emits laser light of 2 W or above.

13. A defect inspection apparatus according to claim 1, wherein said coherence reducing means has a light path portion that is formed of a plurality of glass rod lenses or an array of a plurality of cylindrical lens, and a condenser, whereby said laser light rays emitted from said laser source means are made incident to said plurality of glass rod lenses or said array of said plurality of cylindrical lenses, and to said condenser of said light path portion so that said laser light rays exit from the other ends and enter an objective lens to scan a pupil plane of said objective lens.

14. A defect inspection apparatus according to claim 1, wherein said laser source emits a plurality of laser beams including any one of wavelengths 266 nm and 257 nm.

15. A defect inspection apparatus according to claim 4, wherein said accumulation type image sensor is sensitive to a wavelength of either 266 nm or 257 nm.

16. A defect inspection apparatus according to claim 4, wherein said accumulation type image sensor is capable of producing 64-ch or above parallel outputs.

17. A defect inspection apparatus according to claim 2, wherein said image sensor is of CMOS type or MOS type.

18. A defect inspection apparatus according to claim 2, wherein said image detecting means has an objective lens of which NA is 0.75 or above and of which field of view is 0.5 mm or above.

19. A defect inspection apparatus comprising:

laser source means for emitting laser right;

coherence reducing means for reducing the coherence of said laser light emitted from said laser source;

irradiating means for irradiating said coherence-reduced laser light from said coherence reducing means onto a sample;

image detecting means for detecting an image of said sample on which said laser light is irradiated from said irradiating means; and

image processing means for processing said image of said sample detected by said image detecting means, whereby wafer disks of 200 mm in diameter can be processed at a speed corresponding to a throughput of three disks or above per hour, the pixels of said image can be processed at 50 MHz or below, and a pattern formed on said sample can be detected including defects of 50 nm or below.

20. A defect inspection method comprising the steps of:

emitting laser light;

reducing the coherence of said emitted laser light;

irradiating said coherence-reduced laser light on a sample;

imaging said sample on which said coherence-reduced laser light is irradiated, while the polarized state of said laser light is being controlled; and

detecting a defect of a pattern formed on said sample on the basis of information about an image obtained by imaging while the polarized state is being controlled.

21. A method according to claim 20, wherein said imaging is performed by use of a parallel output accumulation type image sensor.

22. A method according to claim 21, wherein said accumulation type image sensor has a maximum quantum efficiency of 40% or above.

23. A method according to claim 21, wherein said laser light emitted from a laser source is ultraviolet light, and said accumulation type image sensor is of a rear-side irradiation type in which the rear side is sensitive to ultraviolet light.

24. A method according to claim 21, wherein said accumulation type image sensor is a time delay integration type image sensor which is driven in synchronism with the movement of said sample.

25. A method according to claim 20, wherein said polarized state controlling is made by use of a ¼

wave plate, or a ½

wave plate and ¼

wave plate.

26. A method according to claim 20, wherein said polarized state controlling is made by use of a movable or rotatable ½

wave plate and ¼

wave plate.

27. A method according to claim 20, wherein said emitted laser light is formed of a plurality of laser beams, which are synthesized by a polarization beam splitter.

28. A method according to claim 20, wherein said emitted laser light is formed of a plurality of laser beams of different wavelengths.

29. A method according to claim 20, wherein the polarized state of one of said different wavelengths or the polarized states of both are changed by a wave plate.

30. A method according to claim 20, wherein said emitted laser light has power of 2 W or above.

31. A method according to claim 20, wherein at the step of irradiating on said sample said coherence-reduced laser light, said laser light is irradiated through an objective lens on said sample, and a pupil plane of said objective lens is scanned by said laser light.

32. A method according to claim 28, wherein said laser beams include a wavelength of either 266 nm or 257 nm.

33. A method according to claim 21, wherein said accumulation type image sensor is sensitive to a wavelength of either 266 nm or 257 nm.

34. A method according to claim 21, wherein said accumulation type image sensor is capable of 64-ch or above parallel outputs.

35. A method according to claim 21, wherein said accumulation type image sensor is of CMOS type or MOS type.

36. A method according to claim 21, wherein said imaging is performed by use of an objective lens of which NA is 0.75 or above, and of which field of view is 0.5 mm or above.

37. A defect inspection method comprising the steps of:

emitting laser light;

reducing the coherence of said emitted laser light;

irradiating said coherence-reduced laser light on a sample;

imaging said sample on which said coherence-reduced laser light is irradiated; and

inspecting a defect of a pattern by processing an image obtained by said imaging,

wherein said pattern defect inspection is performed by processing wafer disks of 200 mm in diameter at a speed corresponding to a throughput of three disks or above per hour, and processing the respective pixels of said image at a rate of 50 MHz or below so that defects including sizes of 50-nm or below can be detected from said pattern formed on said sample.