X-ray scatter and transmission system with coded beams

• US 20020031202A1
• Filed: 06/06/2001
• Published: 03/14/2002
• Est. Priority Date: 06/07/2000
• Status: Abandoned Application

• Current Assignee: Joseph Callerame, Lee Grodzins, William Adams
• Original Assignee: Joseph Callerame, Lee Grodzins, William Adams
• Inventors: Callerame, Joseph, Grodzins, Lee, Adams, William
• Application Number:
  US09/875,793
• Publication Number:
  US 20020031202A1
• Time in Patent Office: Days
• US Class Current: 378/57
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01V 5/104 and detecting secondary Y-rays as well as reflected or back-scattered neutrons
• CPC Class Codes: G01V 5/107 and detecting reflected or back-scattered neutrons
• CPC Class Codes: G01V 5/22 Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays

Abstract

A system and method for inspecting an object with transmitted and/or scattered penetrating radiation using either a fan beam or multiple pencil beams while maintaining resolution comparable to that achievable using a single scannable pencil beam. The system and method provide for spatial resolution of transmitted radiation using a fan beam or multiple pencil beams and a nonsegmented detector.

Claims

1. An inspection device for inspecting an object, the inspection device comprising:

a. a source of penetrating radiation for irradiating the object at a plurality of positions;

b. at least one detector for detecting the penetrating radiation after interaction with the object;

c. a modulator for modulating the incident penetrating radiation in such a manner as to characterize the position of irradiation; and

d. a processor for deriving the position of irradiation giving rise to the penetrating radiation detected by the at least one detector.

2. An inspection device according to claim 1, wherein the modulator includes a rotating wheel with concentric rings of holes.

3. An inspection system according to claim 1, wherein the penetrating radiation is x-ray radiation.

4. An inspection device according to claim 3, wherein the modulator modulates x-ray source emissions at a frequency higher than any pixel coding.

5. An inspection device for inspecting an object, the inspection device comprising:

a. a source of penetrating radiation for irradiating the object with a plurality of beams;

b. a modulation system for coding each of the beams with a distinct temporal pattern of intensity variation in such a manner that by decoding the detected signal, a signal component may be uniquely associated with each of the plurality of beams.

c. at least one detector for detecting the penetrating radiation after interaction with the object;

d. a processor for deriving the position of irradiation giving rise to the penetrating radiation detected by the at least one detector.

6. An inspection device according to claim 5, wherein the modulation system includes a rotating wheel with concentric rings of holes.

7. An inspection system according to claim 5, wherein the penetrating radiation is x-ray radiation.

8. An inspection device according to claim 7, wherein the modulation system modulates x-ray source emissions at a frequency higher than any pixel coding.

9. A method for illuminating an object with a beam of penetrating radiation, the beam having a specified cross-section, the method comprising:

a. coding each pixel-sized component of the beam;

b. detecting the penetrating radiation after interaction with the object in such a manner as to produce a signal; and

c. decoding the detected signal into a plurality of components; and

d. uniquely associating each component of the detected signal with one particular pixel.

11. An inspection device for inspecting an object, the inspection device comprising:

a. a source of penetrating radiation for irradiating the object with a beam;

b. a modulation system for coding the beam after transmission through the object with a distinct temporal pattern of intensity variation in such a manner that by decoding the detected signal, a signal component may be uniquely associated with the modulated portion of the beam.

c. at least one detector for detecting the penetrating radiation after interaction with the object;

d. a processor for deriving the position of irradiation giving rise to the penetrating radiation detected by the at least one detector.

10. A method according to claim 10, further including modulating emission of the beam at a frequency higher than any pixel coding of the beam.

12. An inspection device according to claim 11, wherein the modulation system includes a rotating tube including concentric rings of slots.

13. An inspection device according to claim 11, wherein the modulation system includes a rotating vane.

14. An inspection device according to claim 11, wherein the modulation system includes a vibrating reed.

15. An inspection system according to claim 11, wherein the penetrating radiation is x-ray radiation.

17. A method according to claim 16, further including modulating emission of the beam at a frequency higher than any pixel coding of the beam.

16. A method for illuminating an object with a beam of penetrating radiation, the beam having a specified cross-section, the method comprising:

a. coding each pixel-sized component of the beam after traversing the object;

b. detecting the penetrating radiation after interaction with the object in such a manner as to produce a signal; and

c. decoding the detected signal into a plurality of components; and

d. uniquely associating each component of the detected signal with one particular pixel.