Integrated conductance and load test based electronic battery tester

• US 20020036504A1
• Filed: 05/30/2001
• Published: 03/28/2002
• Est. Priority Date: 04/16/1999
• Status: Active Grant

• Current Assignee: Midtronics Incorporated
• Original Assignee: Midtronics Incorporated
• Inventors: Troy, Michael E., Bertness, Kevin I.
• Granted Patent: US 6,456,045 B1
• Time in Patent Office: Days
• US Class Current: 324/430
• CPC Class Codes: G01R 31/007 using microprocessors or computers
• CPC Class Codes: G01R 31/3647 for determining the ability of a battery to perform a critical function, e.g. cranking
• CPC Class Codes: G01R 31/3648 comprising digital calculation means, e.g. for performing an algorithm
• CPC Class Codes: G01R 31/382 Arrangements for monitoring battery or accumulator variables, e.g. SoC
• CPC Class Codes: G01R 31/389 Measuring internal impedance, internal conductance or related variables

Abstract

An electronic battery tester for testing a storage battery includes first and second Kelvin connections configured to couple to the battery. A forcing function applies a time varying signal to the battery through the first and second Kelvin connections. Further, a resistive load is configured to couple across the first and second terminals of the battery and draw a relatively large current. The storage battery is tested as a function of a dynamic parameter measured through the first and second Kelvin connections and as a function of a response of the storage battery to the relatively large current drawn through the resistive load.

Claims

1. An electronic battery tester for testing a storage battery comprising:

a first Kelvin connection configured to electrically couple to a first terminal of the battery;

a second Kelvin connection configured to electrically couple to a second terminal of the battery;

a forcing function configured to apply a time varying signal to the battery through the first and second Kelvin connections;

a load resistance R_L configured to couple across the first and second terminals of the battery and draw a relatively large current therethrough; and

a microprocessor configured to test the storage battery as a function of a dynamic parameter measured through the first and second Kelvin connections in response to applied time varying signal and as a function of a response of the storage battery to the relatively large current drawn through the load resistance.

2. The electronic battery tester of claim 1 wherein the dynamic parameter is measured by the microprocessor when the load resistance is coupled across the terminals of the battery.

3. The electronic battery tester of claim 1 wherein the dynamic parameter is measured by the microprocessor prior to coupling the load resistance across the terminals of the battery.

4. The electronic battery tester of claim 1 wherein the dynamic parameter is measured when the load resistance is disconnected from the first and second terminals of the battery.

5. The electronic battery tester of claim 1 wherein the dynamic parameter measured when the load resistance is coupled across the terminals of the battery is compared to the dynamic parameter measured prior to the load resistance being coupled across the battery.

6. The electronic battery tester of claim 1 wherein the dynamic parameter measured when the load resistance is coupled across the terminals of the battery is compared to the dynamic parameter measured after the load resistance is disconnected from the battery.

7. The electronic battery tester of claim 1 wherein the dynamic parameter measured prior to the load resistance is coupled across the terminals of the battery is compared to the dynamic parameter measured after the load resistance is disconnected from the battery.

8. The electronic battery tester of claim 1 wherein the battery test is a function of voltage measured while the load resistance is applied to the battery.

9. The electronic battery tester of claim 1 wherein the battery test is a function of a slope of the voltage measured while the load resistance is applied to the battery.

10. The electronic battery tester of claim 9 wherein the battery test is a function of a change in voltage slope measured while the load resistance is applied to the battery.

11. The electronic battery tester of claim 1 wherein the battery test is a function of the difference in a voltage measured while the load resistance is applied to the battery and a voltage prior to application of the load.

12. The electronic battery tester of claim 1 wherein the battery test is a function of a voltage measured subsequent to disconnection of the load resistance from the battery.

13. The electronic battery tester of claim 1 wherein the battery test is a function of a slope of the voltage measured subsequent to disconnection of the load resistance from the battery.

14. The electronic battery tester of claim 1 wherein the battery test is a function of a change in voltage slope measured subsequent to disconnection of the load resistance from the battery.

15. The electronic battery tester of claim 1 wherein the battery test is a function of a difference in voltage measured while the load resistance is applied to the battery and a voltage after disconnection of the load.

16. The electronic battery tester of claim 1 wherein a duration of application of the load resistance is variable.

17. The electronic battery tester of claim 1 wherein the duration of voltage measurements subsequent to removal of the load resistance is variable.

18. The electronic battery tester of claim 1 wherein the resistance of the load resistance is variable.

19. The electronic battery tester of claim 18 wherein the variable load is controlled by the microprocessor.

20. The electronic battery tester of claim 1 wherein a pass/fail voltage threshold measured while the load resistance is applied is determined by the microprocessor as a function of the measured dynamic parameter.

21. The electronic battery tester of claim 1 wherein the microprocessor provides a state of health output as a function of the test.

22. The electronic battery tester of claim 1 wherein the microprocessor provides an output indicative of a sulfated battery as a function of the test.

23. The electronic battery tester of claim 1 wherein the microprocessor provides a battery life expectancy output as a function of the test.

24. The electronic battery tester of claim 1 wherein the microprocessor provides an output indicative of a shorted cell within the storage battery.

25. The electronic battery tester of claim 24 wherein an indication of the shorted cell is a function of a voltage measured while the load resistance is coupled across the battery.

26. The electronic battery tester of claim 24 wherein an indication of the shorted cell is a function of a voltage slope measured while the load resistance is coupled across the battery.

27. The electronic battery tester of claim 24 wherein an indication of the shorted cell is a function of a voltage slope measured after the load resistance is disconnected from the battery.

28. The electronic battery tester of claim 24 wherein an indication of the shorted cell is a function of a voltage difference after the load resistance is disconnected from the battery compared with a voltage prior to application of the load resistance.

29. The electronic battery tester of claim 1 wherein the load resistance is coupled to the battery through the first and second Kelvin connections.

30. The electronic battery tester of claim 1 wherein the microprocessor provides an output indicative of an open circuit in the battery.

31. The electronic battery tester of claim 30 wherein the indication of an open circuit is a function of an open circuit voltage measurement across the battery and a load voltage measurement across the battery obtained while the load resistance is applied to the battery.

32. The electronic battery tester of claim 30 wherein the indication of an open circuit is a function of the slope of a voltage measurement across the battery after the load is disconnected from the battery.

33. The electronic battery tester of claim 1 wherein the microprocessor applies the load resistance to the battery prior to measuring the dynamic parameter to thereby reduce a surface charge voltage associated with the battery.

34. The electronic battery tester of claim 33 wherein the test is a function of battery voltage subsequent to the reduction of surface charge.

35. The electronic battery tester of claim 1 wherein the resistance load is connected externally to the tester.

36. The electronic battery tester of claim 35 wherein the resistive load is located within a Kelvin cable assembly.