System, method, and apparatus for product diagnostic and evaluation testing

• US 20020039030A1
• Filed: 08/03/2001
• Published: 04/04/2002
• Est. Priority Date: 08/03/2000
• Status: Abandoned Application

• Current Assignee: Qualcomm, Inc.
• Original Assignee: Qualcomm, Inc.
• Inventors: Khazei, Mehyar
• Application Number:
  US09/922,413
• Publication Number:
  US 20020039030A1
• Time in Patent Office: Days
• US Class Current: 324/750
• CPC Class Codes: G01R 29/0871 Complete apparatus or systems; circuits, e.g. receivers or amplifiers G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857
• CPC Class Codes: G01R 31/002 where the device under test is an electronic circuit

Abstract

A diagnostic method calculates a radiation intensity according to a characterization of near-field emissions of an electronic device and identifies a source or mechanism responsible for electromagnetic compatibility (EMC) or electromagnetic interference (EMI) violations. An evaluation method compares a radiation intensity to one or more emissions limits. Additional embodiments of systems, methods, and apparatus according to embodiments of the invention include obtaining spectrum content information of an electronic device.

Claims

1. A method for diagnostic testing, said method comprising:

obtaining a characterization of near-field emissions for a device under test;

receiving an emissions limit including a radiation intensity and a corresponding distance; and

calculating an radiation intensity of the device under test at the corresponding distance.

2. The method for diagnostic testing according to claim 1, wherein the device under test is an electronic device.

3. The method for diagnostic testing according to claim 1, wherein the device under test is a radio-frequency generating device.

4. The method for diagnostic testing according to claim 1, wherein the device under test includes at least one integrated circuit.

5. The method for diagnostic testing according to claim 1, further comprising presenting a visual display of at least a portion of the characterization of near-field emissions.

6. The method for diagnostic testing according to claim 1, further comprising comparing the calculated radiation intensity with a value based on the radiation intensity of the emissions limit.

7. The method for diagnostic testing according to claim 6, further comprising indicating a result of said comparing.

8. The method for diagnostic testing according to claim 1, wherein the characterization of near-field emissions includes a characterization of a magnetic field vector at each of a plurality of locations,

wherein the plurality of locations reside within a plane above the device under test.

9. The method for diagnostic testing according to claim 8, wherein the characterization of the magnetic field vector at each of the plurality of locations includes an intensity of the vector and a direction of the vector.

10. A method for evaluation testing, said method comprising:

obtaining a plurality of characterizations of near-field emissions for a device under test, each characterization of near-field emissions relating to a corresponding frequency;

receiving at least one emissions limit including a radiation intensity and a corresponding distance; and

for each of the corresponding frequencies, calculating an radiation intensity of the device under test at the corresponding distance.

11. The method for evaluation testing according to claim 10, further comprising obtaining a measure of level of emissions of the device under test across a range of frequencies, and

determining a plurality of frequencies, within the range of frequencies, at which the measure of level of emissions exceeds a predetermined threshold.

13. The method for diagnostic testing according to claim 12, said method further comprising modifying a design of the device under test.

14. The method for diagnostic testing according to claim 12, said method further comprising comparing the radiated field with an emissions limit.

15. The method for diagnostic testing according to claim 12, wherein the characterization of near-field emissions includes a characterization of a magnetic field vector at each of a plurality of locations,

wherein the plurality of locations reside within a plane above the device under test.

16. The method for diagnostic testing according to claim 15, wherein the characterization of the magnetic field vector at each of the plurality of locations includes an intensity of the vector and a direction of the vector.

17. The method for diagnostic testing according to claim 12, further comprising presenting a visual display of at least a portion of the characterization of near-field emissions.

19. The method for diagnostic testing according to claim 18, said method further comprising modifying a design of the device under test.

20. The method for diagnostic testing according to claim 18, wherein the characterization of near-field emissions includes a characterization of a magnetic field vector at each of a plurality of locations,

wherein the plurality of locations reside within a plane above the device under test.

21. The method for diagnostic testing according to claim 18, wherein the characterization of the magnetic field vector at each of the plurality of locations includes an intensity of the vector and a direction of the vector.

22. The method for diagnostic testing according to claim 18, further comprising presenting a visual display of at least a portion of the characterization of near-field emissions.

12. A method for diagnostic testing, said method comprising:

obtaining a characterization of near-field emissions for a device under test;

based on the characterization, calculating a radiated field of the device under test at a predetermined distance from the device under test; and

identifying a region of high radiation intensity.

18. A method for emissions measurement, said method comprising:

obtaining spectrum content information for a device under test over a frequency range;

selecting a frequency within the frequency range;

obtaining a characterization of near-field emissions for the device under test at the selected frequency;

receiving an emissions limit including a radiation intensity;

calculating an radiation intensity of the device under test; and

comparing the calculated radiation intensity to the radiation intensity of the emissions limit.