Differential numerical aperture methods and device
First Claim
1. An apparatus for determining parameters of a sample comprising:
- a source for generating a beam of light;
a variable illumination numerical aperture component, variable over a numerical aperture range while obtaining data for determining parameters, the varying numerical aperture thereby varying the range of angles at which illuminating rays strike the sample;
a variable observation numerical aperture component, variable over a numerical aperture range while obtaining data for determining parameters, the varying numerical aperture thereby varying the range of angles at which scattered rays from the sample are accepted; and
a first detection system positioned to receive and characterize the light accepted by the variable observation numerical aperture component.
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Accused Products
Abstract
Devices and methods for differential numerical aperture analysis of samples, utilizing angle-of-incidence measurements resulting from variable illumination or observation numerical apertures, or both. Metrology applications are provided, and more particularly including scatterometer, ellipsometer and similar analysis methods, including bi-directional reflectance or transmission distribution function measurement. The provided devices and methods enable analysis of critical dimensions of samples utilizing a minimum of moving parts, with the range of striking or scattering angles varied by means of a variable numerical aperture or apertures.
71 Citations
41 Claims
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1. An apparatus for determining parameters of a sample comprising:
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a source for generating a beam of light;
a variable illumination numerical aperture component, variable over a numerical aperture range while obtaining data for determining parameters, the varying numerical aperture thereby varying the range of angles at which illuminating rays strike the sample;
a variable observation numerical aperture component, variable over a numerical aperture range while obtaining data for determining parameters, the varying numerical aperture thereby varying the range of angles at which scattered rays from the sample are accepted; and
a first detection system positioned to receive and characterize the light accepted by the variable observation numerical aperture component. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 26, 27, 28, 29, 30, 31, 32, 33, 34, 36, 37, 38, 39, 40, 41)
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14. An apparatus for determining parameters of a sample comprising:
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a source for generating a beam of light;
a variable illumination numerical aperture component for varying the numerical aperture over a numerical aperture range while obtaining data for determining parameters, thereby varying the range of angles at which illuminating rays strike the sample;
an observation aperture component, accepting scattered rays from the sample at a fixed range of angles; and
a first detection system positioned to receive and characterize the light accepted by the observation aperture component.
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25. An apparatus for determining parameters of a sample comprising:
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a source for generating a beam of light;
an illumination aperture component, determining the range of angles at which illuminating rays strike the sample;
a variable observation numerical aperture component for varying the numerical aperture over an incremental numerical aperture range while obtaining data for determining parameters, thereby varying the range of angles at which scattered rays from the sample are accepted; and
a first detection system positioned to receive and characterize the light accepted by the variable observation aperture component.
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35. A method for determining parameters of a sample comprising the steps of:
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generating a beam of light;
focusing the beam of light on the sample;
varying at least one parameter selected from the group consisting of the range of angles of incidence of the beam of light to the sample and the range of angles of detected scatter from the sample by means of at least one variable numerical aperture; and
detecting and characterizing the scattered light.
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Specification