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Contact-less probe of semiconductor wafers

  • US 20020047722A1
  • Filed: 04/11/2001
  • Published: 04/25/2002
  • Est. Priority Date: 10/20/1998
  • Status: Active Grant
First Claim
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1. A device comprising:

  • a test circuit including a frequency generator for generating a detectable radio frequency energy when powered; and

    a power generator, coupled to said frequency generator, for generating power when exposed to light.

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