Contact-less probe of semiconductor wafers
First Claim
Patent Images
1. A device comprising:
- a test circuit including a frequency generator for generating a detectable radio frequency energy when powered; and
a power generator, coupled to said frequency generator, for generating power when exposed to light.
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Abstract
A device, having circuits formed thereon, comprises a circuit including a frequency generator for generating a detectable radio frequency energy when powered and a power generator, coupled to the frequency generator, for generating power when exposed to light.
6 Citations
23 Claims
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1. A device comprising:
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a test circuit including a frequency generator for generating a detectable radio frequency energy when powered; and
a power generator, coupled to said frequency generator, for generating power when exposed to light. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A power generating circuit comprising:
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a substrate;
a plurality of diodes each formed in a separate well in said substrate and coupled in series for generating voltage when exposed to light; and
an opaque layer overlapping at least a border formed by said well and said substrate for preventing activating a parasitic diode when exposed to said light. - View Dependent Claims (11, 12, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
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13. A system for testing semiconductor chips comprising:
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a circuit including a frequency generator for generating a detectable radio frequency energy when powered;
a power generator, coupled to said frequency generator, for generating power when exposed to light;
an optical device for generating said light;
a receiver for detecting said radio frequency energy;
an analyzer connected to said receiver for analyzing said radio frequency energy.
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Specification