Method, apparatus, and computer program of searching for clustering faults in semiconductor device manufacturing
First Claim
Patent Images
1. A method of searching for clustering imperfect entities, comprising:
- entering data on imperfect entities present in a search target;
calculating a frequency distribution of the imperfect entities in unit cells divided from the search target;
approximating the frequency distribution by overlaying at least two discrete distribution functions; and
searching for clustering imperfect entities according to weights of the discrete distribution functions on the frequency distribution.
1 Assignment
0 Petitions
Accused Products
Abstract
A method of searching for clustering faults is employed for semiconductor device manufacturing, The method enters data on faults present in a search target, calculates a frequency distribution of the faults in unit cells divided from the search target, approximates the frequency distribution by overlaying at least two discrete distribution functions, and searches for clustering faults according to weights of the discrete distribution functions on the frequency distribution.
-
Citations
22 Claims
-
1. A method of searching for clustering imperfect entities, comprising:
-
entering data on imperfect entities present in a search target;
calculating a frequency distribution of the imperfect entities in unit cells divided from the search target;
approximating the frequency distribution by overlaying at least two discrete distribution functions; and
searching for clustering imperfect entities according to weights of the discrete distribution functions on the frequency distribution. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
-
-
10. An apparatus for searching for clustering imperfect entities, comprising:
-
an input unit entering data on imperfect entities present in a search target;
a frequency distribution calculator calculating, according to the entered data, a frequency distribution of the imperfect entities in unit cells divided from the search target;
a discrete distribution function calculator approximating the frequency distribution by overlaying at least two discrete distribution functions; and
a clustering faults searcher searching for clustering imperfect entities according to weights of the discrete distribution functions on the frequency distribution. - View Dependent Claims (11, 12, 19)
-
-
13. A program executable by computer, comprising:
-
entering data on imperfect entities present in a search target;
calculating a frequency distribution of the imperfect entities in unit cells divided from the search target;
approximating the frequency distribution by overlaying at least two discrete distribution functions; and
searching for clustering imperfect entities according to weights of the discrete distribution functions on the frequency distribution.
-
-
14. A method of optimizing redundant circuits, comprising:
-
entering the number of redundant circuits required to repaired faults in chips divided from a wafer;
calculating a frequency distribution of the redundant circuits on the chips; and
calculating an optimum number of redundant circuits that maximizes the number of acceptable chips producible from the wafer according to a relationship between the number of redundant circuits and the number of acceptable chips producible from the wafer.
-
-
15. A method of managing processes, comprising:
-
taking one of search targets;
entering data on imperfect entities present in the taken search target;
calculating a frequency distribution of the imperfect entities in unit cells divided from the taken search target;
approximating the frequency distribution by overlaying at least two discrete distribution functions;
searching for clustering imperfect entities according to weights of the discrete distribution functions on the frequency distribution; and
repeating these acts on each of the search targets.
-
-
16. A method of managing a clean room, comprising, in an imperfect-entity testing process carried out in the clean room:
-
entering data on imperfect entities present in a search target;
calculating a frequency distribution of the imperfect entities in unit cells divided from the search target;
approximating the frequency distribution by overlaying at least two discrete distribution functions; and
searching for clustering imperfect entities according to weights of the discrete distribution functions on the frequency distribution.
-
-
17. A method of manufacturing semiconductor devices, comprising, in an imperfect-entity testing process taking place in semiconductor device manufacturing:
-
entering data on imperfect entities present in a search target;
calculating a frequency distribution of the imperfect entities in unit cells divided from the search target;
approximating the frequency distribution by overlaying at least two discrete distribution functions; and
searching for clustering imperfect entities according to weights of the discrete distribution functions on the frequency distribution.
-
-
18. A method of identifying problematic processes and equipment, comprising:
-
taking one of search targets;
entering data on imperfect entities present in the taken search target;
calculating a frequency distribution of the imperfect entities in unit cells divided from the search target;
approximating the frequency distribution by overlaying at least two discrete distribution functions and calculating weights of the discrete distribution functions;
repeating the above acts on each of the search targets;
calculating, equipment by equipment for each process, a frequency distribution of the discrete-distribution-function weights according to the calculated weights and equipment history of each search target;
calculating, for each process, a difference between the frequency distributions of the discrete-distribution-function weights calculated equipment by equipment; and
extracting processes and equipment related to the calculated differences in descending order of the calculated differences.
-
-
20. A program executable by computer, comprising:
-
taking one of search targets;
entering data on imperfect entities present in the taken search target;
calculating a frequency distribution of the imperfect entities in unit cells divided from the search target;
approximating the frequency distribution by overlaying at least two discrete distribution functions and calculating weights of the discrete distribution functions;
repeating the above acts on each of the search targets;
calculating, equipment by equipment for each process, a frequency distribution of the discrete-distribution-function weights according to the calculated weights and equipment history of each search target;
calculating, for each process, a difference between the frequency distributions of the discrete-distribution-function weights calculated equipment by equipment; and
extracting processes and equipment related to the calculated differences in descending order of the calculated differences.
-
-
21. An apparatus for identifying a problematic process and equipment, comprising:
-
a data memory at least storing data on imperfect entities present in search targets each divided into unit cells and equipment history showing the search targets and processes and equipment that processed the search targets;
a frequency distribution calculator calculating, for each of the search targets according to the data on imperfect entities, a frequency distribution of imperfect entities in the unit cells of the search target;
a discrete distribution function calculator approximating each of the frequency distributions by overlaying at least two discrete distribution functions and calculating weights of the discrete distribution functions;
a weight frequency distribution calculator calculating, equipment by equipment for each process, a frequency distribution of the discrete-distribution-function weights according to the calculated weights and the equipment history; and
a difference calculator calculating, for each process, a difference between the frequency distributions of the discrete-distribution-function weights calculated equipment by equipment.
-
-
22. A method of determining whether or not a search target must be scrapped, comprising:
-
evaluating, in a testing process in semiconductor device manufacturing, the characteristics of semiconductor elements on the search target and detecting imperfect entities present in the search target;
calculating a frequency distribution of the imperfect entities in unit cells divided from the search target;
approximating the frequency distribution by overlaying at least two discrete distribution functions and calculating parameters related to the discrete distribution functions;
calculating a yield of the search target according to the calculated parameters; and
determining, according to the yield, whether or not the search target must be scrapped.
-
Specification