Near-field microscope
First Claim
1. A near-field microscope comprising:
- a probe for scattering a near-field light;
light emitting means including a light source for emitting light to a sample or said probe; and
light sampling means for sampling and detecting a light that includes information of the sample scattered by said probe, said microscope comprising;
control means for spacing said sample or probe from a field of a near-field light generated by said light emission or disposing the sample or probe at a position that is shallow in a field of near-field light, thereby detecting a noise by said light sampling means;
inserting said sample or probe deeply into a field of near-field light generated by said light emission, thereby detecting light intensity by said light sampling means; and
computing means for computing a measurement result obtained by subtracting a noise from said light intensity.
1 Assignment
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Accused Products
Abstract
A near-field microscope comprising: a probe for scattering a near-field light; light emitting device including a light source for emitting light to a sample or said probe; and light sampling device for sampling and detecting a light that includes information of the sample scattered by said probe, said microscope comprising: control device for spacing said sample or probe from a field of a near-field light generated by said light emission or disposing the sample or probe at a position that is shallow in a field of near-field light, thereby detecting a noise by said light sampling device; inserting said sample or probe deeply into a field of near-field light generated by said light emission, thereby detecting light intensity by said light sampling device; and computing device for computing a measurement result obtained by subtracting a noise from said light intensity
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Citations
17 Claims
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1. A near-field microscope comprising:
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a probe for scattering a near-field light;
light emitting means including a light source for emitting light to a sample or said probe; and
light sampling means for sampling and detecting a light that includes information of the sample scattered by said probe, said microscope comprising;
control means for spacing said sample or probe from a field of a near-field light generated by said light emission or disposing the sample or probe at a position that is shallow in a field of near-field light, thereby detecting a noise by said light sampling means;
inserting said sample or probe deeply into a field of near-field light generated by said light emission, thereby detecting light intensity by said light sampling means; and
computing means for computing a measurement result obtained by subtracting a noise from said light intensity. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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Specification