Nitride semiconductor light emitting device and apparatus including the same
First Claim
1. A nitride semiconductor light emitting device comprising:
- a worked substrate including grooves and lands formed on a main surface of a nitride semiconductor substrate;
a nitride semiconductor underlayer covering said grooves and said lands of said worked substrate; and
a nitride semiconductor multilayer emission structure including an emission layer including a quantum well layer or both a quantum well layer and a barrier layer in contact with said quantum well layer between an n-type layer and a p-type layer over said nitride semiconductor underlayer, wherein width of said grooves is within the range of 11 to 30 μ
m, and width of said lands is within the range of 1 to 20 μ
m.
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Accused Products
Abstract
A nitride semiconductor light emitting device includes a worked substrate including grooves and lands formed on a main surface of a nitride semiconductor substrate, a nitride semiconductor underlayer covering the grooves and the lands of the worked substrate and a nitride semiconductor multilayer emission structure including an emission layer including a quantum well layer or both a quantum well layer and a barrier layer in contact with the quantum well layer between an n-type layer and a p-type layer over the nitride semiconductor underlayer, while the width of the grooves is within the range of 11 to 30 μm and the width of the lands is within the range of 1 to 20 μm.
44 Citations
11 Claims
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1. A nitride semiconductor light emitting device comprising:
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a worked substrate including grooves and lands formed on a main surface of a nitride semiconductor substrate;
a nitride semiconductor underlayer covering said grooves and said lands of said worked substrate; and
a nitride semiconductor multilayer emission structure including an emission layer including a quantum well layer or both a quantum well layer and a barrier layer in contact with said quantum well layer between an n-type layer and a p-type layer over said nitride semiconductor underlayer, wherein width of said grooves is within the range of 11 to 30 μ
m, andwidth of said lands is within the range of 1 to 20 μ
m. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification