Method for sorting integrated circuit devices

• US 20020088743A1
• Filed: 03/06/2002
• Published: 07/11/2002
• Est. Priority Date: 01/17/1997
• Status: Active Grant

• Current Assignee: Raymond J. Beffa
• Original Assignee: Raymond J. Beffa
• Inventors: Beffa, Raymond J.
• Granted Patent: US 7,446,277 B2
• Time in Patent Office: Days
• US Class Current: 209/583
• CPC Class Codes: B07C 5/3412 according to a code applied to the object which indicates a property of the object, e.g. quality class, contents or incorrect indication sorting according to size measured by light-responsive means B07C5/10; sorting according to optical properties B07C5/342; for packages B65D79/02; for information carriers G06K7/00
• CPC Class Codes: B07C 5/344 according to electric or electromagnetic properties sorting according to size measured electrically or electronically B07C5/08; material testing by magnetic means G01N24/00, G01N27/00, by electrical means G01N27/00; electrical measuring devices in general G01R; coin testing G07D5/00
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801
• CPC Class Codes: H01L 2223/5444 for electrical read out
• CPC Class Codes: H01L 2223/54473 for use after dicing
• CPC Class Codes: H01L 23/544 Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps test patterns for characterising or monitoring manufacturing processes H01L22/00
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.

Claims

1. A testing method for an integrated circuit of an integrated circuit device of a plurality of integrated circuit devices comprising:

storing an enhanced reliability testing flag associated with a unique identification code of each integrated circuit device of the plurality of integrated circuit devices for indicating whether each integrated circuit device requires enhanced reliability testing;

automatically reading the unique identification code of each integrated circuit device of the plurality of integrated circuit devices;

accessing the enhanced reliability testing flag stored for each unique identification code of each integrated circuit device;

sorting the plurality of integrated circuit devices in accordance with whether their enhanced reliability testing flag indicates they are in need of the enhanced reliability testing; and

performing the enhanced reliability testing for the integrated circuit devices requiring the enhanced reliability testing.

2. A reliability testing method for an integrated circuit of an integrated circuit device of a plurality of integrated circuit devices comprising:

storing an reliability testing flag associated with a unique identification code of each integrated circuit device of the plurality of integrated circuit devices for indicating whether each integrated circuit device requires further reliability testing;

automatically reading the unique identification code of each integrated circuit device of the plurality of integrated circuit devices;

accessing the reliability testing flag stored for each unique identification code of each integrated circuit device;

sorting the plurality of integrated circuit devices in accordance with whether their reliability testing flag indicates they are in need of the further reliability testing; and

performing further reliability testing for the integrated circuit devices requiring the further reliability testing.

3. A manufacturing method for an integrated circuit of an integrated circuit device of a plurality of integrated circuit devices comprising:

storing a reliability testing flag associated with a unique identification code of each integrated circuit device of the plurality of integrated circuit devices for indicating whether each integrated circuit device requires further reliability testing;

automatically reading the unique identification code of each integrated circuit device of the plurality of integrated circuit devices;

accessing the reliability testing flag stored for each unique identification code of each integrated circuit device;

sorting the plurality of integrated circuit devices in accordance with whether their reliability testing flag indicates they are in need of the further reliability testing; and

performing further reliability testing for the integrated circuit devices requiring the further reliability testing.