×

Method for sorting integrated circuit devices

  • US 20020088743A1
  • Filed: 03/06/2002
  • Published: 07/11/2002
  • Est. Priority Date: 01/17/1997
  • Status: Active Grant
First Claim
Patent Images

1. A testing method for an integrated circuit of an integrated circuit device of a plurality of integrated circuit devices comprising:

  • storing an enhanced reliability testing flag associated with a unique identification code of each integrated circuit device of the plurality of integrated circuit devices for indicating whether each integrated circuit device requires enhanced reliability testing;

    automatically reading the unique identification code of each integrated circuit device of the plurality of integrated circuit devices;

    accessing the enhanced reliability testing flag stored for each unique identification code of each integrated circuit device;

    sorting the plurality of integrated circuit devices in accordance with whether their enhanced reliability testing flag indicates they are in need of the enhanced reliability testing; and

    performing the enhanced reliability testing for the integrated circuit devices requiring the enhanced reliability testing.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×