Method and apparatus for detecting aberrations in an optical system
First Claim
1. A method of detecting aberrations associated with an optical system utilized in a lithographic projection apparatus comprising:
- a radiation system for supplying a projection beam of radiation;
a support structure for supporting patterning means, the patterning means serving to pattern the projection beam according to a desired pattern;
a substrate table for holding a substrate; and
a projection system for projecting the patterned beam onto a target portion of the substrate, said optical system comprising at least one of the radiation system and projection system, said method comprising the steps of;
providing said desired pattern to comprise a monitor having a plurality of non-resolvable features, where the plurality of non-resolvable features is arranged so as to form a predetermined test pattern when projected on the substrate;
projecting the monitor onto the substrate using the projection system, and;
analyzing the position of said predetermined test pattern and the position of the plurality of non-resolvable features in the monitor so as to determine if there is an aberration
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Accused Products
Abstract
A method of detecting aberrations associated with a projection lens utilized in an optical lithography system. The method includes the steps of forming a mask for transferring a lithographic pattern onto a substrate, forming a plurality of non-resolvable features disposed on the mask, where the plurality of non-resolvable features are arranged so as to form a predetermined pattern on the substrate, exposing the mask using an optical exposure tool so as to print the mask on the substrate, and analyzing the position of the predetermined pattern formed on the substrate and the position of the plurality of non-resolvable features disposed on the mask so as to determine if there is an aberration. If the position of the predetermined pattern formed on the substrate differs from an expected position, which is determined from the position of the plurality of non-resolvable features, this shift from the expected position indicates the presence of an aberration.
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Citations
13 Claims
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1. A method of detecting aberrations associated with an optical system utilized in a lithographic projection apparatus comprising:
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a radiation system for supplying a projection beam of radiation;
a support structure for supporting patterning means, the patterning means serving to pattern the projection beam according to a desired pattern;
a substrate table for holding a substrate; and
a projection system for projecting the patterned beam onto a target portion of the substrate, said optical system comprising at least one of the radiation system and projection system, said method comprising the steps of;
providing said desired pattern to comprise a monitor having a plurality of non-resolvable features, where the plurality of non-resolvable features is arranged so as to form a predetermined test pattern when projected on the substrate;
projecting the monitor onto the substrate using the projection system, and;
analyzing the position of said predetermined test pattern and the position of the plurality of non-resolvable features in the monitor so as to determine if there is an aberration - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A construction for detecting aberrations in an optical system utilized in a lithographic projection apparatus comprising:
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a radiation system for supplying a projection beam of radiation;
a mask table for holding a mask;
a substrate table for holding a substrate; and
a projection system for projecting a pattern in the mask onto a target portion of the substrate, said optical system comprising at least one of the radiation system and projection system, said construction comprising a mask plate carrying a monitor pattern, said monitor pattern comprising a plurality of non-resolvable features disposed on said mask plate, said plurality of non-resolvable features arranged so as to form a predetermined test pattern on said substrate, said predetermined pattern being utilized to detect said aberrations. - View Dependent Claims (12)
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13. A device manufacturing method comprising the steps of:
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(a) providing a substrate that is at least partially covered by a layer of radiation-sensitive material;
(b) providing a projection beam of radiation using a radiation system;
(c) using patterning means to endow the projection beam with a pattern in its cross-section;
(d) using a projection system to project the patterned beam of radiation onto a target portion of the layer of radiation-sensitive material, wherein, prior to the use of an integrated device pattern in step (d), an aberration monitoring step is performed comprising the steps of;
providing the pattern of step (c) to comprise a monitor having a plurality of non-resolvable features, where the plurality of non-resolvable features is arranged so as to form a predetermined test pattern when projected on the substrate;
projecting the monitor onto the substrate using the projection system, and;
analyzing the position of said predetermined test pattern and the position of the plurality of non-resolvable features in the monitor so as to determine if there is an aberration in at least one of the radiation system and projection system.
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Specification