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Probe using diffuse-reflectance spectroscopy

  • US 20020107448A1
  • Filed: 10/05/2001
  • Published: 08/08/2002
  • Est. Priority Date: 10/06/2000
  • Status: Abandoned Application
First Claim
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1. A device for measuring the thickness of the epithelium layer, the device comprising:

  • a handle, a head, and an optical fiber bundle, wherein said optical fiber bundle comprises a source and a detector, said source comprising first and second respective optical fibers, said first optical fiber positioned at a first angle relative to normal and said second optical fiber positioned at a second angle relative to normal wherein said first and second angles are different.

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