System and method for testing a group of related products

• US 20020116666A1
• Filed: 02/22/2001
• Published: 08/22/2002
• Est. Priority Date: 02/22/2001
• Status: Active Grant

• Current Assignee: National Instruments Corporation (Emerson Electric Company)
• Original Assignee: National Instruments Corporation (Emerson Electric Company)
• Inventors: Perez, Hjalmar, Mandeville, Kurt, Packebush, Paul
• Granted Patent: US 6,907,557 B2
• Time in Patent Office: Days
• US Class Current: 714/38
• CPC Class Codes: G01R 31/318371 Methodologies therefor, e.g. algorithms, procedures

Abstract

A system and method for testing a group of related products or devices. According to one embodiment, the user may first manually create a base test sequence, and child test sequences may then be created based on the base test sequence. The user may include various steps in the base test sequence, such that the base test sequence includes steps that need to be common to most or all of the child test sequences. The user may also configure parameters or properties for each step in the base test sequence, such that the parameter configuration is what is required for most or all of the child test sequences. Initial child test sequences may then be automatically created as instances of the base test sequence. The user may then manually edit the instances of the base test sequence to produce the desired child test sequences, such that each child test sequence is configured to appropriately test a particular product to which the child test sequence corresponds. For example, the user may change a parameter configuration for one or more steps in the child test sequence, may add a step to or remove a step from the child test sequence, etc. In the preferred embodiment, the child test sequences may also be automatically changed or updated in various ways. For example, the user may manually add a new step to the base test sequence, and in response the new step may be automatically added to each child test sequence. As another example, the user may manually change the parameter configuration for a step in the base test sequence, and in response the parameter configuration change may be automatically propagated to each child test sequence.

Claims

1. A method for testing a group of related products, the method comprising:

creating a base test sequence in response to user input, wherein the base test sequence comprises a plurality of test steps;

creating one or more instances of the base test sequence, wherein each instance of the base test sequence comprises the plurality of test steps of the base test sequence;

for each of the one or more instances of the base test sequence, modifying the instance in response to user input to produce one or more child test sequences configured for testing a particular product from the group of related products.

2. The method of claim 1, further comprising:

executing a child test sequence configured for testing a particular product, wherein said executing the child test sequence comprises executing steps in the child test sequence, wherein each step performs a test of the particular product.

3. The method of claim 1,

wherein one or more steps of the base test sequence have an associated parameter configuration;

wherein said modifying the instance in response to user input comprises changing a parameter configuration for one or more steps in the instance.

4. The method of claim 1,

wherein said modifying the instance in response to user input comprises removing a step from the instance.

5. The method of claim 1, further comprising:

adding a new step to the base test sequence in response to user input, subsequently to said creating the one or more instances of the base test sequence;

automatically adding the new step to the one or more child test sequences, in response to said adding the new step to the base test sequence.

6. The method of claim 1, further comprising:

removing a step from the base test sequence in response to user input, subsequently to said creating the one or more instances of the base test sequence;

automatically removing the step from the one or more child test sequences, in response to said removing the step from the base test sequence.

7. The method of claim 1, wherein a step in the base test sequence has an associated parameter configuration, the method further comprising:

changing the parameter configuration in response to user input, subsequently to said creating the one or more instances of the base test sequence;

automatically propagating the parameter configuration change to the one or more child test sequences, in response to said changing the parameter configuration.

8. A method for testing a group of related products, the method comprising:

creating a base test sequence in response to user input, wherein the base test sequence comprises a plurality of test steps;

receiving user input specifying information regarding a desired plurality of child test sequences, wherein the information comprises information specifying how each desired child test sequence differs from the base test sequence;

creating the desired plurality of child test sequences based on the base test sequence and the information regarding the desired plurality of child test sequences.

9. The method of claim 8,

wherein said creating the desired plurality of child test sequences comprises programmatically creating the desired plurality of child test sequences based on the base test sequence and the information regarding the desired plurality of child test sequences.

10. The method of claim 8,

wherein said creating the desired plurality of child test sequences comprises executing a child test sequence generation program;

wherein the child test sequence generation program accesses the base test sequence and the information regarding the desired plurality of child test sequences and programmatically creates the desired plurality of child test sequences based on the base test sequence and the information regarding the desired plurality of child test sequences.

11. A memory medium comprising program instructions for testing a group of related products, wherein the program instructions are executable to implement:

creating a base test sequence in response to user input, wherein the base test sequence comprises a plurality of test steps;

creating one or more instances of the base test sequence, wherein each instance of the base test sequence comprises the plurality of test steps of the base test sequence;

for each of the one or more instances of the base test sequence, modifying the instance in response to user input to produce one or more child test sequences configured for testing a particular product from the group of related products.

12. The memory medium of claim 11, wherein the program instructions are further executable to implement:

executing a child test sequence configured for testing a particular product, wherein said executing the child test sequence comprises executing steps in the child test sequence, wherein each step performs a test of the particular product.

13. The memory medium of claim 11,

wherein one or more steps of the base test sequence have an associated parameter configuration;

wherein said modifying the instance in response to user input comprises changing a parameter configuration for one or more steps in the instance.

14. The memory medium of claim 11,

wherein said modifying the instance in response to user input comprises removing a step from the instance.

15. The memory medium of claim 11, wherein the program instructions are further executable to implement:

adding a new step to the base test sequence in response to user input, subsequently to said creating the one or more instances of the base test sequence;

automatically adding the new step to the one or more child test sequences, in response to said adding the new step to the base test sequence.

16. The memory medium of claim 11, wherein the program instructions are further executable to implement:

removing a step from the base test sequence in response to user input, subsequently to said creating the one or more instances of the base test sequence;

automatically removing the step from the one or more child test sequences, in response to said removing the step from the base test sequence.

17. The memory medium of claim 11, wherein a step in the base test sequence has an associated parameter configuration, the method further comprising:

changing the parameter configuration in response to user input, subsequently to said creating the one or more instances of the base test sequence;

automatically propagating the parameter configuration change to the one or more child test sequences, in response to said changing the parameter configuration.

19. The memory medium of claim 18,

wherein said creating the desired plurality of child test sequences comprises programmatically creating the desired plurality of child test sequences based on the base test sequence and the information regarding the desired plurality of child test sequences.

20. The memory medium of claim 18,

wherein said creating the desired plurality of child test sequences comprises executing a child test sequence generation program;

wherein the child test sequence generation program accesses the base test sequence and the information regarding the desired plurality of child test sequences and programmatically creates the desired plurality of child test sequences based on the base test sequence and the information regarding the desired plurality of child test sequences.

18. A memory medium comprising program instructions for testing a group of related products, wherein the program instructions are executable to implement:

creating a base test sequence in response to user input, wherein the base test sequence comprises a plurality of test steps;

receiving user input specifying information regarding a desired plurality of child test sequences, wherein the information comprises information specifying how each desired child test sequence differs from the base test sequence;

creating the desired plurality of child test sequences based on the base test sequence and the information regarding the desired plurality of child test sequences.

21. A memory medium comprising programs for testing a group of related products, wherein the memory medium stores:

a base test sequence created in response to user input, wherein the base test sequence comprises a plurality of test steps;

one or more instances of the base test sequence, wherein each instance of the base test sequence comprises the plurality of test steps of the base test sequence; and

one or more child test sequences, wherein each of the one or more child test sequences is created from a corresponding one of the one or more instances;

wherein each of the one or more child test sequences are configured for testing a particular product from the group of related products.

22. A memory medium comprising programs for testing a group of related products, wherein the memory medium stores:

a base test sequence created in response to user input, wherein the base test sequence comprises a plurality of test steps;

information regarding a desired plurality of child test sequences, wherein the information comprises information specifying how each desired child test sequence differs from the base test sequence, wherein the information is created in response to user input; and

a child test sequence generation program that is operable to programmatically create the desired plurality of child test sequences based on the base test sequence and the information regarding the desired plurality of child test sequences.