Method of strip insertion detection
First Claim
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1. A method for calibrating a strip sensor in an analytical meter device, the strip sensor having a photodetector and a light source, the method comprising the steps of:
- a. measuring the voltage output difference of said photodetector between when said light source is on and off using a standard having relatively high reflectance;
b. measuring the voltage output difference of said photodetector between when said light source is on and off using a standard having relatively low reflectance;
c. calculating a voltage threshold VTH produced by the strip sensor to be used by said analytical meter device to indicate when a test element has been inserted therein according to the formula;
VTH=KTH[(VHigh−
VHigh—
Off)−
(VLow−
VLow—
Off)]+(VLow−
VLow—
Off) where KTH is a constant;
d. evaluating the value of VTH calculated in step (c) for acceptability according to predetermined criteria;
e. permanently storing VTH in said analytical meter device if evaluated as acceptable in step (d).
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Abstract
A method an apparatus for strip insertion detection in an analytical meter system. The invention allows for individual meter calibration, adaptive thresholding and ambient light correction. Increased performance is economically realized, while providing enhanced meter accuracy in varying light conditions.
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Citations
13 Claims
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1. A method for calibrating a strip sensor in an analytical meter device, the strip sensor having a photodetector and a light source, the method comprising the steps of:
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a. measuring the voltage output difference of said photodetector between when said light source is on and off using a standard having relatively high reflectance;
b. measuring the voltage output difference of said photodetector between when said light source is on and off using a standard having relatively low reflectance;
c. calculating a voltage threshold VTH produced by the strip sensor to be used by said analytical meter device to indicate when a test element has been inserted therein according to the formula;
VTH=KTH[(VHigh−
VHigh— Off)−
(VLow−
VLow— Off)]+(VLow−
VLow— Off)where KTH is a constant;
d. evaluating the value of VTH calculated in step (c) for acceptability according to predetermined criteria;
e. permanently storing VTH in said analytical meter device if evaluated as acceptable in step (d). - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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Specification