Controller having internal durability test cycle driver
First Claim
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1. An actuator assembly comprising:
- a controller integrated into said actuator assembly, said controller including;
memory storing test cycle data;
a processor in communication with said memory, said processor accessing said test cycle data;
a communication port in communication with said processor and in communication with an actuator and a sensor;
wherein during a test mode, said processor provides position commands to said actuator and receives a sensor signal from said sensor, said processor detecting faults in response to said sensor signal and storing faults in said memory.
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Abstract
An exemplary embodiment of the invention is an actuator assembly having a controller integrated into the actuator assembly. The controller includes a memory for storing test cycle data and a processor in communication with the memory. The processor accesses the test cycle data. A communication port is in communication with the processor and in communication with an actuator and a sensor. During a test mode, the processor provides position commands to the actuator and receives a sensor signal from the sensor. The processor detects the presence of faults in response to the sensor signal and stores the faults in the memory.
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Citations
11 Claims
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1. An actuator assembly comprising:
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a controller integrated into said actuator assembly, said controller including;
memory storing test cycle data;
a processor in communication with said memory, said processor accessing said test cycle data;
a communication port in communication with said processor and in communication with an actuator and a sensor;
wherein during a test mode, said processor provides position commands to said actuator and receives a sensor signal from said sensor, said processor detecting faults in response to said sensor signal and storing faults in said memory. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification