MODULATION DOPED THYRISTOR AND COMPLEMENTARY TRANSISTOR COMBINATION FOR A MONOLITHIC OPTOELECTRONIC INTEGRATED CIRCUIT

• US 20020121647A1
• Filed: 03/02/2001
• Published: 09/05/2002
• Est. Priority Date: 03/02/2001
• Status: Active Grant

• Current Assignee: OPEL Solar, Inc. (POET Technologies Inc.), University of Connecticut (State of Connecticut)
• Original Assignee: University of Connecticut (State of Connecticut)
• Inventors: Taylor, Geoff W.
• Granted Patent: US 6,479,844 B2
• Time in Patent Office: Days
• US Class Current: 257/192
• CPC Class Codes: B82Y 20/00 Nanooptics, e.g. quantum optics or photonic crystals
• CPC Class Codes: G02B 6/28 having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals
• CPC Class Codes: G02B 6/2821 using lateral coupling between contiguous fibres to split or combine optical signals
• CPC Class Codes: G02F 1/025 in an optical waveguide structure G02F1/017, G02F1/2257 take precedence
• CPC Class Codes: H01L 27/0605 integrated circuits made of compound material, e.g. AIIIBV
• CPC Class Codes: H01L 29/165 in different semiconductor regions , e.g. heterojunctions
• CPC Class Codes: H01L 29/205 in different semiconductor regions , e.g. heterojunctions
• CPC Class Codes: H01L 29/66227 the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
• CPC Class Codes: H01L 29/7371 Vertical transistors
• CPC Class Codes: H01L 29/74 Thyristor-type devices, e.g. having four-zone regenerative action two-terminal thyristors H01L29/87
• CPC Class Codes: H01L 29/7783 using III-V semiconductor material
• CPC Class Codes: H01L 31/035236 Superlattices; Multiple quantum well structures
• CPC Class Codes: H01L 31/10 characterised by potential barriers, e.g. phototransistors
• CPC Class Codes: H01L 31/1113 the device being a photothyristor

Abstract

A family of high speed transistors and optoelectronic devices is obtained on a monolithic substrate with an epitaxial layer structure comprised of two modulation doped transistor structures, one inverted with respect to the other. The transistor structures are obtained by modification of the Pseudomorphic High Electron Mobility Transistor (PHEMT) structure and are combined in a unique way to create a thyristor structure. The thyristor structure may be used as a digital modulator, a transceiver, an amplifier and a directional coupler. These devices may be realized as either waveguide or vertical cavity devices. The vertical cavity construction enables resonant cavity operation of all device modes. In addition to the multiple optoelectronic properties, the structure also produces inversion channel bipolar devices termed BICFETs having either electrons or holes as the majority carrier and heterostructure FETs with both electron and hole channels. Therefore complementary operation of FET or bipolar circuits is possible.

Claims

1. A multifunctional optoelectronic semiconductor device, comprising an epitaxially grown distributed bragg reflector (DBR) mirror upon which is deposited;

a first sequence of layers to implement a modulation-doped bipolar field-effect transistor with electrons (n type) as its majority carrier, its emitter deposited on said DBR mirror and its collector as a top surface layer, said n type bipolar transistor having a p type inversion channel at a modulation-doped interface performing as a field-effect control element in the role of a conventional base region and said bipolar transistor layer structure also implementing a p channel heterostructure field-effect transistor (PHFBT) layer structure with said emitter layer performing in the role of a gate contact layer for said PHFET;

a second sequence of layers deposited on said first sequence of layers, to implement a modulation-doped bipolar field-effect transistor with holes (p type) as its majority carrier, its collector layer being common with said collector of said n type bipolar transistor and its emitter as a top surface layer, said p type bipolar transistor having an n type inversion channel at a modulation-doped interface performing as a field-effect control element in the role of a conventional base region and said bipolar transistor layer structure also implementing an n channel heterostructure field-effect transistor (NHFET) layer structure with said emitter surface layer performing in the role of a gate contact layer for said NHFET.

2. A multifunctional optoelectronic device in claim 1 wherein said n type bipolar transistor is comprised of a sequence of layers comprising a first bottom layer of N+ GaAs;

a layer of N type (typically 5×

10¹⁷ cm<sup>−

3</sup>) Al_xGa<sub>1−

x</sub>As (typically x=0.7) of 1000-3000 Å

thickness;

a delta-doped layer of N+ type (typically 3×

10¹⁸ cm<sup>−

3</sup>) Al_yGa<sub>1−

y</sub>As (typically y=0.15) of 60-80 Å

thickness;

a layer of undoped Al_yGa<sub>1−

y</sub>As of 200-300 Å

thickness;

a delta-doped layer of P+ type (typically 3-4×

10¹⁸ cm<sup>−

3</sup>) Al_yGa<sub>1−

y</sub>As of 60-80 Å

thickness;

a spacer layer of undoped Al_yGa<sub>1−

y</sub>As of 20-30 Å

;

a spacer layer of undoped GaAs of about 15 Å

;

a series of unstrained GaAs quantum wells with Al_yGa<sub>1−

y</sub>As barriers or a series of 1-3 undoped quantum wells of InGaAsN with GaAs barriers where the % of nitrogen is selected to be i) 0% for a natural emission frequency of 0.98 μ

m, ii) approximately 2% for a natural frequency of 1.3 μ

m, iii) approximately 4%-5% for a natural emission frequency of 1.5 μ

m;

a layer of undoped Al_yGa<sub>1−

y</sub>As of about 4000-10,000 Å

thickness to function as collector of said n type transistor and also wherein said p type transistor begins with said collector as a common collector and deposits the additional sequence of layers consisting of a spacer layer of undoped GaAs of about 100 Å

;

a series of Al_yGa<sub>l−

y</sub>As barriers and unstrained GaAs quantum wells or a series of 1-3 undoped quantum wells of InGaAsN with GaAs barriers where the % of nitrogen is selected to be i) 0% for a natural emission frequency of 0.98 μ

m, ii) approximately 2% for a natural frequency of 1.3 μ

m, iii) approximately 4%-5% for a natural emission frequency of 1.5 μ

m;

a spacer layer of undoped GaAs of about 15 Å

;

a spacer layer of undoped Al_yGa<sub>1−

y</sub>As of 20-30 Å

;

a delta-doped layer of N+ type (typically 3-4×

10¹⁸ cm<sup>−

3</sup>) Al_yGa<sub>1−

y</sub>As of 60-80 Å

;

a layer of undoped Al_yGa<sub>1−

y</sub>As of 200-300 Å

thickness;

a delta-doped layer of P+ type (typically 3×

10¹⁸ cm<sup>−

3</sup>) Al_yGa<sub>1−

y</sub>As of 60-80 Å

thickness;

a layer of P type (typically 5×

10¹⁷ cm<sup>−

3</sup>) Al_xGa<sub>1−

x</sub>As (typically x=0.7) of 1000-3000 Å

thickness;

a layer of P++ type (typically 5×

10¹⁹-10²⁰ cm<sup>−

3</sup>) GaAs or a GaAs and InGaAs combination to act as a metallic contact layer for the emitter of said p type transistor.

3. A multifunctional optoelectronic device constructed from the epitaxial layer sequence as described in claim 1 by applying a fabrication sequence which uses a set of alignment marks being etched for registration of patterns;

N type ions being implanted to produce a pn junction which forms a current steering path and two dimensional conduction for positive carriers into an active area of the structure and also establishes a negative threshold to make depletion transistors;

a refractory metal being defined to form gate electrodes for n channel field-effect transistors or emitter electrodes for p type bipolar transistors and p type contacts for all lasers and detectors, said refractory metal forming a collector electrode for said p channel field-effect transistors by the initial removal of said top P++ surface layer and P+ delta doped sheet, said refractory metal pattern forming optical apertures to allow the flow of optical energy into and out of said optoelectronic device;

N type ions being implanted to form low resistance contacts to said n channel field-effect transistor inversion channel using the refractory metal and its photoresist as a mask to create self-alignment, said inversion channel being produced in said quantum wells of GaAs, strained InGaAs or strained and unstrained InGaAsN by the presence of said modulation doped layer of said p type bipolar transistor;

P type ions being implanted to form low resistance contacts to said p channel field-effect transistor inversion channel using the refractory metal in the role of a collector as a mask to create self-alignment, said inversion channel being produced in the quantum wells of GaAs, strained InGaAs or strained and unstrained InGaAsN by the presence of said modulation doped layer of said p type bipolar transistor;

rapid thermal annealing of said implantations to activate and to perform disordering of selected areas;

formation of active device areas into mesas by the use of a deep etch to expose bottom mirror layers which is then followed by the steam oxidation of AlAs layers completely under said active device;

definition and etching of contact areas to said P+ ion implanted regions, to said N+ ion implanted regions and to said bottom N+ layer performing as said gate contact of said p channel HFET or as said emitter of said n type bipolar transistor;

definition of resist for lift-off procedure of p and n type gold alloys followed by metalization and lift-off of metals in n type and p type regions;

application of polyimide isolation, etching of contact windows and lift-off of interconnect gold metal patterns;

application of distributed bragg reflector mirror layers for lasers and detectors.

4. A device, as described in claim 3, adapted to the operation of an optoelectronic thyristor in which said top P++ emitter is said device anode, said N+ bottom emitter region is said device cathode and said N+ ion implanted source regions which contact said n type inversion channel perform as a high impedance third terminal input node, a device acting as a thyristor electrically with well defined off and on states and a switching voltage which may be modulated with current input from said third terminal, from a maximum value at zero injection current to a minimum value with high injection, said thyristor performing as a VCSEL in its switched on state when said on state current flow exceeds said laser threshold with light emission from said optical aperture and said thyristor performing as a resonant cavity detector in the off state with light entering said optical aperture such that the photogenerated electron-hole pairs may switch said thyristor from said off state to said on state when sufficient charge has been accumulated in one or both of said inversion channels in said thyristor.

5. Devices as described in claim 3 adapted to the implementation of complementary HFET functions in which an N channel HFET is formed on one mesa and a P channel HFET is formed on another mesa, said device gate terminals having a common connection serving as an input node, said device drain terminals having a common connection serving as an output node, said PHFET source node being connected to a positive supply voltage and said NHFET source node being grounded such that complementary operation is obtained.

6. Devices as described in claim 3 adapted to the implementation of complementary bipolar functions in which an n type bipolar (electron majority carrier) transistor is formed on one mesa and a p type bipolar (hole majority carrier) transistor is formed on another mesa, said device source terminals having a common connection serving as an input node, said device collector terminals having a common connection serving as an output node, said p type emitter node being connected to a positive supply voltage and said n type emitter node being grounded such that complementary bipolar operation is obtained.

7. The device, as described in claim 3, adapted to the operation of an active waveguide detector of optical power in which said DBR mirrors applied above and grown below the active layers act as cladding layers for waveguide propagation, said N+ ion implanted source regions removing electron photocurrent from said electron inversion channel, said P++ top emitter and said P+ ion implanted source regions removing hole photocurrent from said hole inversion channel, said bottom N+ gate region being biased to ensure a fully populated p type inversion channel to form a high speed transmission line for hole conduction, said optical input being admitted to said channel region via a passive waveguide which is self-aligned to said active waveguide defined by said refractory metal electrode and said N type waveguiding channel implants, said passive waveguide achieving low insertion loss into said active waveguide by virtue of a slightly larger energy gap in said passive region achieved by impurity free vacancy disordering or similar technique to achieve a minimal change in refractive index and hence near zero reflectivity at said passive/active waveguide interface.

8. The device, as described in claim 3, adapted to the operation of an active waveguide receiver of optical power in which said DBR mirrors applied above and grown below the active layers act as cladding layers for waveguide propagation, said N+ ion implanted source regions being biased by an integrated current source to remove a constant flow of electron photocurrent from said electron inversion channel, said bottom N+ gate region or subcollector node being biased with respect to said p+ emitter contact through a series load element such that switching of said thyristor to its on state occurs with a minimum optical input power when light is admitted to said waveguide and switching of said thyristor back to its off state occurs when said optical signal is terminated, said optical receiver providing an electrical output at the connection node of said thyristor and said series load element, said optical input being admitted to said channel region via a passive waveguide which is self-aligned to said active waveguide defined by said refractory metal electrode and said N type waveguiding channel implants, said passive waveguide achieving low insertion loss into said active waveguide by virtue of a slightly larger energy gap in said passive region achieved by impurity free vacancy disordering or similar technique to achieve a minimal change in refractive index and hence near zero reflectivity at said passive/active waveguide interface.

9. The device, as described in claim 3, adapted to the operation of an active waveguide amplifier of optical power in which said DBR mirrors applied above and grown below the active layers act as cladding layers for waveguide propagation, said N+ ion implanted source regions injecting electrons into said upper electron inversion channel, said top P++ emitter injecting holes from said refractory metal contact and said lower hole inversion channel supplying holes to said upper quantum well in the role of a floating p electrode supplied by holes from said top P++ emitter, said bottom N+ gate region also floating electrically, said optical input being admitted to said active waveguide via a passive waveguide which is self-aligned to the active waveguide defined by said refractory metal electrode and said N type waveguiding channel implants, said passive waveguide achieving low insertion loss into said active waveguide by virtue of a slightly larger energy gap in said passive region achieved by impurity free vacancy disordering or similar technique to achieve a minimal change in refractive index and hence near zero reflectivity at said passive/active waveguide interface, thereby resulting in effectively single pass gain operation for said optical amplifier.

10. The device, as described in claim 3, configured and operated as an optoelectronic thyristor optical amplifier in which said top P++ emitter is said device anode, said N+ bottom emitter region is said device cathode and said N+ ion implanted source regions contact said n type inversion channel as a high impedance third terminal input node, said DBR mirrors applied above and grown below the active layers to act as cladding layers for waveguide propagation, said device being biased at a current level well below the threshold current of said thyristor laser and thus performing as an optical amplifier, said optical input being admitted to said active waveguide of said thyristor optical amplifier via a passive waveguide which is self-aligned to said active waveguide defined by said refractory metal electrode and said N type waveguiding channel implants, said passive waveguide achieving low insertion loss into said active waveguide by virtue of a slightly larger energy gap in said passive region achieved by impurity free vacancy disordering or similar technique to achieve a minimal change in refractive index and hence near zero reflectivity at said passive/active waveguide interface, thereby resulting in effectively single pass gain operation for said optical amplifier.

11. The device, as described in claim 3, adapted to the operation of an active waveguide absorption modulator of optical power in which said DBR mirrors applied above and grown below said active layers act as cladding layers for waveguide propagation, said N+ ion implanted source regions being biased negatively with respect to said P++ emitter contact in order to inject electrons into said upper n type quantum well inversion channel resulting in a filling of said quantum wells, said P+ ion implanted source regions and said N+ lower gate region being connected together and biased positively to act as a source of holes which fills said upper n type quantum well, said injected electrons and injected holes resulting in a shift of the absorption edge in said upper quantum well(s) to higher energies (shorter wavelengths), said shift in absorption edge vastly reducing the absorption of light such that said optical power is propagated through said device with negligible absorption compared to the unshifted state at zero bias in which essentially total absorption is achieved, said optical power being admitted to said active waveguide via a passive waveguide which is self-aligned to the active waveguide defined by said refractory metal electrode and said N type waveguiding channel implants, said passive waveguide achieving low insertion loss into said active waveguide by virtue of a slightly larger energy gap in said passive region achieved by impurity free vacancy disordering or similar technique to achieve a minimal change in refractive index and hence near zero reflectivity at said passive/active waveguide interface, thereby resulting in low insertion loss for said waveguide modulator.

12. The device, as described in claim 3, configured and operated as an optoelectronic thyristor digital optical absorption modulator for optical input signals with active layers sandwiched between DBR mirrors applied above and grown below said active layers to act as cladding layers for waveguide propagation, in which said top P++ emitter is said device anode, said N+ bottom emitter region is said device cathode and said N+ ion implanted source regions contact said n type inversion channel as a high impedance third terminal input node, said modulator having two states, one corresponding to the normally off condition which is highly absorptive and the other corresponding to the normally on state in which both upper and lower quantum well levels are filled with electrons and holes such that the absorption edge in both sets of quantum wells is shifted to higher energies allowing passage of the optical signal through the waveguide with essentially no absorptive loss, said third terminal being biased to a current source such that after passage of said optical input signal, said thyristor is switched back to the off state in order to absorb a following optical signal, said optical input being admitted to said active waveguide of said thyristor optical modulator via a passive waveguide which is self-aligned to said active waveguide defined by said refractory metal electrode and said N type waveguiding channel implants, said passive waveguide achieving low insertion loss into said active waveguide by virtue of a slightly larger energy gap in said passive region achieved by impurity free vacancy disordering or similar technique to achieve a minimal change in refractive index and hence near zero reflectivity at said passive/active waveguide interface, thereby resulting in effectively single pass gain operation for said optical modulator.

13. The device, as described in claim 3, adapted to the operation of a dual active waveguide directional coupler optical switch, comprising two parallel active waveguides separated by an electrically isolating optical coupling region of narrow dimensions, said coupling region being produced by a technique such as impurity disordering wherein the bandgap of said region is increased slightly by thermal processing in the presence of an SiO₂ overlayer, each waveguide being accessed electrically by one source node and one P++ gate/emitter node, such that optical power entering a first waveguide may be coupled evanescently to a second waveguide over a minimum distance with a negligible power component remaining in said first waveguide (cross state) or said optical power may couple completely back to said first waveguide (thru state) with negligible power remaining in said second waveguide, said coupling being initiated by the application of voltages between said gate/emitter and said source nodes of either waveguide, said voltages injecting electrons into said inversion channels resulting in a change in propagation constant of said first waveguide with respect to said second waveguide, said