Gas replacement method and apparatus, and exposure method and apparatus
First Claim
1. A gas replacement method comprising:
- exhausting a gas from a closed chamber which accommodates a substrate with which a thin film is provided; and
adjusting an exhaust amount of said gas from said closed chamber so that deformation of said thin film due to the exhaust is within a predetermined range.
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Accused Products
Abstract
An exposure apparatus comprises a preliminary chamber which accommodates a mask on which a pellicle is attached, an exhaust device which exhausts a gas from the preliminary chamber, a deformation measuring device which measures the deformation of the pellicle, and a control section which regulates the amount of a gas to be exhausted from the preliminary chamber. At the time of replacing a gas in a space by exhausting the gas from the preliminary chamber, the control section adjusts the exhaust amount of the gas from the preliminary chamber based on the result of the measurement made by the deformation measuring device so that the deformation of the pellicle is within a predetermined range. This can ensure stable gas replacement while preventing the pellicle from being damaged.
44 Citations
35 Claims
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1. A gas replacement method comprising:
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exhausting a gas from a closed chamber which accommodates a substrate with which a thin film is provided; and
adjusting an exhaust amount of said gas from said closed chamber so that deformation of said thin film due to the exhaust is within a predetermined range. - View Dependent Claims (2, 3, 4)
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5. A gas replacement method comprising:
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exhausting a gas from a space formed between a substrate and a thin film provided with said substrate; and
adjusting an exhaust amount of said gas from said space so that deformation of said thin film due to the exhaust is within a predetermined range. - View Dependent Claims (6)
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7. A gas replacement method comprising:
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replacing a gas in a space formed between a substrate and a thin film provided with said substrate with a predetermined gas; and
detecting deformation of said thin film when replacing said gas. - View Dependent Claims (8, 9)
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10. A gas replacement apparatus comprising:
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a closed chamber which accommodates a substrate with which a thin film is provided;
an exhaust device which is connected to said closed chamber and exhausts a gas from said closed chamber;
a deformation measuring device which is associated with said thin film and measures deformation of said thin film; and
a control system which is connected to said deformation measuring device and adjusts an exhaust amount of said gas based on a result of the measurement so that said deformation of said thin film is within a predetermined range. - View Dependent Claims (11, 13, 15, 17, 18, 20, 21, 22, 23, 25, 27, 28, 30, 31)
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12. A gas replacement apparatus comprising:
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a closed chamber which accommodates a substrate with which a thin film is provided;
an exhaust device which is connected to said closed chamber and exhausts a gas from said closed chamber;
a pressure measuring device which is provided with said closed chamber and measures a pressure in said closed chamber; and
a control system which is connected to said pressure measuring device and adjusts an exhaust amount of said gas based on a result of that measurement so that said deformation of said thin film is within a predetermined range.
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14. A gas replacement apparatus comprising:
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an exhaust device which is connected to a space formed between a substrate and a thin film to be provided with said substrate and exhausts a gas from said space;
a deformation measuring device which is provided in association with said thin film and measures deformation of said thin film; and
a control system which is connected to said deformation measuring device and adjusts an exhaust amount of said gas based on a result of that measurement so that said deformation of said thin film is within a predetermined range.
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16. A gas replacement apparatus comprising:
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a gas replacement device which is connected to a space formed between a substrate and a thin film provided with said substrate and replaces a gas in said space with a predetermined gas; and
a deformation measuring device which is associated with said thin film and measures deformation of said thin film.
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19. An exposure method comprising:
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accommodating a mask, on which a protection member is provided via a frame, in a closed chamber having at least one of a first space including an optical path of exposure light and a second space adjacent to said first space;
replacing a gas in said closed chamber with a predetermined gas having low absorption characteristic with regard to exposure light;
replacing a gas in a space formed between said protection member and said mask with said predetermined gas according to replacing the gas in said closed chamber; and
irradiating said exposure light onto said mask after the gas replacement and transferring an image of a pattern of said mask onto a substrate.
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24. An exposure method comprising:
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accommodating a mask on which a protection member is provided via a frame in a closed chamber having at least one of a first space including an optical path of exposure light and a second space adjacent to said first space;
replacing a gas in a space formed between said protection member and said mask with a predetermined gas in said closed chamber; and
after said gas in said space formed between said protection member and said mask is replaced with said predetermined gas, irradiating said exposure light onto said mask and transferring an image of a pattern of said mask onto a substrate.
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26. An exposure apparatus comprising:
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a closed chamber which accommodates a mask on which a protection member is provided via a frame, said closed chamber having at least one of a first space including an optical path of exposure light and a second space adjacent to said first space;
a gas replacement apparatus which is provided with said closed chamber and replaces a gas in said closed chamber with a predetermined gas having low absorption characteristic with regard to exposure light; and
a deformation measuring device which is associated with said protection member and measures deformation of said protection member.
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29. An exposure apparatus comprising:
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a closed chamber which accommodates a mask on which a protection member is provided via a frame, said closed chamber having at least one of a first space including an optical path of exposure light and a second space adjacent to said first space;
a gas replacement apparatus which is provided with said closed chamber and replaces a gas in said closed chamber with a predetermined gas having low absorption characteristic with regard to exposure light;
a pressure measuring device which is provided with said closed chamber and measures a pressure in said closed chamber; and
a control device which is connected to said pressure measuring device and controls said gas replacement apparatus based on a result of measurement from said pressure measuring device so that said deformation of said protection member is within a predetermined range.
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32. An exposure apparatus comprising:
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a closed chamber which accommodates a mask on which a protection member is provided via a frame, said closed chamber having at least one of a first space including an optical path of exposure light and a second space adjacent to said first space;
a gas replacement apparatus which is provided with said closed chamber and replaces a gas in a space formed between said protection member and said mask with a predetermined gas having low absorption characteristic with regard to exposure light; and
a deformation measuring device which is associated with said protection member and measures deformation of said protection member. - View Dependent Claims (33, 34, 35)
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Specification