Integrated circuit of an electronic thermometer

• US 20020128791A1
• Filed: 03/08/2001
• Published: 09/12/2002
• Est. Priority Date: 02/20/2001
• Status: Abandoned Application

• Current Assignee: Chih-Wei Hsieh, Min-Yung Chen
• Original Assignee: Chih-Wei Hsieh, Min-Yung Chen
• Inventors: Hsieh, Chih-Wei, Chen, Min-Yung
• Application Number:
  US09/800,658
• Publication Number:
  US 20020128791A1
• Time in Patent Office: Days
• US Class Current: 702/99
• CPC Class Codes: G01K 15/00 Testing or calibrating of thermometers

Abstract

An Integrated Circuit (IC) of an electronic thermometer includes resistors and capacitors combination, logic switch system or formulated compensation parameter table being established therein for calibration of preset objective value of software and hardware utilized by the system to select optimum compensated resistors and capacitors arranged combination or the optimum parameter group within the compensation parameter table, the selected combination being written into the internal established or externally mounted EEPROM or Memory such that the internally established programs in the IC accesses the resistors and capacitors combination or the compensated parameters.

Claims

1. An Integrated Circuit (IC) of an electronic thermometer comprising resistors and capacitors combination, logic switch system or formulated compensation parameter table being established therein for calibration of preset objective value of software and hardware utilized by the system to select optimum compensated resistors and capacitors arranged combination or the optimum parameter group within the compensation parameter table, the selected combination being written into the internal established or externally mounted EEPROM or Memory such that the internally established programs in the IC accesses the resistors and capacitors combination or the compensated parameters.

2. An Integrated Circuit (IC) of an electronic thermometer as set forth in claim 1, wherein the resistors and capacitors combination or formulated compensation parameters are accessed by utilizing the objective value of the software and hardware via the method of connection in series or in parallel to select the optimum compensated resistors and capacitors combination and by the method of increasing the voltage and current to melt off the circuit in order to maintain the selected compensated resistors and capacitors combination or the parameters combination.

3. An Integrated Circuit (IC) of an electronic thermometer as set forth in claim 1, wherein the IC circuit comprises a logic circuit for switching between Celsius degree C. and Fahrenheit degree F. and the stored memorized values are renewed or set to zero after switching, and by a sound or character displaying to show the result of switching.

4. An Integrated Circuit (IC) of an electronic thermometer as set forth in claim 1, wherein the IC comprises a self-test circuit, a specific characters being displayed on the thermometer screen of the test result so as to avoid the confusion of a normal temperature and an abnormal temperature.