Method for determining defect depth using thermal imaging
First Claim
1. Apparatus for determining the thickness of a sample and defect depth using thermal imaging in a variety of plastic, ceramic, metal and other products comprising:
- a pair of flash lamps positioned at a first side of the sample;
an infrared camera positioned near said first side of the sample;
a data acquisition and processing computer;
said data acquisition and processing computer coupled to said flash lamps for triggering said flash lamps, said data acquisition and processing computer coupled to said infrared camera for acquiring and processing thermal image data;
said data acquisition and processing computer processing said thermal image data using a theoretical solution to analyze said thermal image data.
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Abstract
A method and apparatus are provided for determining the thickness of a sample and defect depth using thermal imaging in a variety of plastic, ceramic, metal and other products. A pair of flash lamps is positioned at a first side of the sample. An infrared camera is positioned near the first side of the sample. A data acquisition and processing computer is coupled to the flash lamps for triggering the flash lamps. The data acquisition and processing computer is coupled to the infrared camera for acquiring and processing thermal image data. The thermal image data are processed using a theoretical solution to analyze the thermal image data to determine the thickness of a sample and defect depth.
29 Citations
17 Claims
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1. Apparatus for determining the thickness of a sample and defect depth using thermal imaging in a variety of plastic, ceramic, metal and other products comprising:
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a pair of flash lamps positioned at a first side of the sample;
an infrared camera positioned near said first side of the sample;
a data acquisition and processing computer;
said data acquisition and processing computer coupled to said flash lamps for triggering said flash lamps, said data acquisition and processing computer coupled to said infrared camera for acquiring and processing thermal image data;
said data acquisition and processing computer processing said thermal image data using a theoretical solution to analyze said thermal image data. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 13, 14, 15, 16, 17)
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12. A method for determining the thickness of a sample and defect depth using thermal imaging in a variety of plastic, ceramic, metal and other products comprising the steps of:
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providing a pair of flash lamps positioned at a first side of the sample;
providing an infrared camera positioned near said first side of the sample;
utilizing a data acquisition and processing computer for performing the steps of;
triggering said flash lamp, acquiring and processing thermal image data from said infrared camera;
processing said thermal image data using a theoretical solution to analyze said thermal image data to determine the sample thickness and defect depth.
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Specification