Magnetoelastic sensor for characterizing properties of thin-film/coatings
First Claim
1. An apparatus for determining elasticity characteristics of a thin-film layer, comprising:
- a sensor element having a base magnetostrictive element at least one surface of which is at least partially coated with the thin-film layer, said sensor element operatively arranged to vibrate within a time-varying interrogation magnetic field;
a receiver, remote from said sensor element, to measure a plurality of values for magneto-elastic emission intensity of said sensor element to identify a magneto-elastic resonant frequency value for said sensor element; and
whereby using a value for density of the thin-film layer and a value for mass of said base magnetostrictive element and said magneto-elastic resonant frequency value, at least one of the elasticity characteristics is determined.
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Abstract
An apparatus for determining elasticity characteristics of a thin-film layer. The apparatus comprises a sensor element having a base magnetostrictive element at least one surface of which is at least partially coated with the thin-film layer. The thin-film layer may be of a variety of materials (having a synthetic and/or bio-component) in a state or form capable of being deposited, manually or otherwise, on the base element surface, such as by way of eye-dropper, melting, dripping, brushing, sputtering, spraying, etching, evaporation, dip-coating, laminating, etc. Among suitable thin-film layers for the sensor element of the invention are fluent bio-substances, thin-film deposits used in manufacturing processes, polymeric coatings, paint, an adhesive, and so on. A receiver, preferably remotely located, is used to measure a plurality of values for magneto-elastic emission intensity of the sensor element in either characterization: (a) the measure of the plurality of values is used to identify a magneto-elastic resonant frequency value for the sensor element; and (b) the measure of the plurality of successive values is done at a preselected magneto-elastic frequency.
26 Citations
24 Claims
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1. An apparatus for determining elasticity characteristics of a thin-film layer, comprising:
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a sensor element having a base magnetostrictive element at least one surface of which is at least partially coated with the thin-film layer, said sensor element operatively arranged to vibrate within a time-varying interrogation magnetic field;
a receiver, remote from said sensor element, to measure a plurality of values for magneto-elastic emission intensity of said sensor element to identify a magneto-elastic resonant frequency value for said sensor element; and
whereby using a value for density of the thin-film layer and a value for mass of said base magnetostrictive element and said magneto-elastic resonant frequency value, at least one of the elasticity characteristics is determined. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. An apparatus for determining elasticity characteristics of a thin-film layer of a fluent bio-substance, comprising:
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a sensor element having a base magnetostrictive element at least one surface of which is at least partially coated with the thin-film layer, said sensor element operatively arranged to vibrate within a time-varying interrogation magnetic field;
a receiver, remote from said sensor element, to measure a plurality of successive values for magneto-elastic emission intensity of said sensor element at a preselected magneto-elastic frequency; and
whereby using said values for emission intensity, an elasticity response profile for the bio-substance is produced. - View Dependent Claims (11, 12, 13, 14, 15, 17, 18, 19)
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16. A method for determining elasticity characteristics of a thin-film layer at least partially coating a surface of a base magnetostrictive element, comprising the steps of:
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applying a time-varying interrogation magnetic field to a sensor element comprising the base magnetostrictive element and thin-film layer, operatively arranged to vibrate in response to said interrogation magnetic field;
remotely measuring a plurality of values for magneto-elastic emission intensity of said sensor element to identify a magneto-elastic resonant frequency value therefor; and
using a value for density of the thin-film layer and a value for mass of the base magnetostrictive element and said magneto-elastic resonant frequency value, determining at least one of the elasticity characteristics.
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20. A method for determining elasticity characteristics of a thin-film layer of a fluent bio-substance at least partially coating a surface of a base magnetostrictive element, comprising the steps of:
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applying a time-varying interrogation magnetic field to a sensor element comprising the base magnetostrictive element and thin-film layer, operatively arranged to vibrate in response to said interrogation magnetic field;
remotely measuring, over a response-time interval, a plurality of successive values for magneto-elastic emission intensity of said sensor element at a preselected magneto-elastic frequency; and
using said values for emission intensity, producing an elasticity response profile for the bio-substance. - View Dependent Claims (21, 22, 23, 24)
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Specification