×

X-ray inspection system

  • US 20020172324A1
  • Filed: 04/03/2002
  • Published: 11/21/2002
  • Est. Priority Date: 04/03/2001
  • Status: Active Grant
First Claim
Patent Images

1. An X-ray inspection system that examines an item under inspection located at an inspection region, the system comprising:

  • an X-ray source located at the inspection region that exposes the item under inspection to X-ray radiation, and that is constructed and arranged to be movable in any of a first dimension, a second dimension and a third dimension;

    an X-ray detector located at the inspection region that detects X-ray radiation as modified by the item under inspection, and that is constructed and arranged to be movable in the first dimension and the second dimension;

    a controller coupled to each of the X-ray source and the X-ray detector, that controls movement of the X-ray source and the X-ray detector in the first and second dimensions; and

    a processor coupled to the controller that is configured to receive detection information from the X-ray detector, to process the detection information, and to provide processed information;

    wherein the controller is also configured to control movement of the X-ray source and the X-ray detector independently of each other in any of collinear directions and different directions to provide a plurality of X-ray views of the item under inspection at varying examination angles of the X-ray radiation.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×