Exposure control in an x-ray image detector

• US 20020181648A1
• Filed: 05/20/2002
• Published: 12/05/2002
• Est. Priority Date: 09/20/2000
• Status: Active Grant

• Current Assignee: Koninklijke Philips Electronics N.V. (Koninklijke Philips N.V.)
• Original Assignee: Koninklijke Philips Electronics N.V. (Koninklijke Philips N.V.)
• Inventors: Franklin, Anthony Roy, Ruetten, Walter, Overdick, Michael, Powell, Martin John, Busse, Falko
• Granted Patent: US 6,760,405 B2
• Time in Patent Office: Days
• US Class Current: 378/19
• CPC Class Codes: G01T 1/026 Semiconductor dose-rate meters
• CPC Class Codes: G01T 1/24 with semiconductor detectors
• CPC Class Codes: H04N 23/30 for generating image signals from X-rays
• CPC Class Codes: H04N 5/32 Transforming X-rays cameras or camera modules for generating image signals from X-rays H04N23/30; circuitry of SSIS for transforming X-rays into image signals H04N25/30

Abstract

An X-ray detector apparatus comprises an array of detector pixels (20), each pixel (20) comprising a conversion element (26;260) for converting incident radiation into a charge flow, a charge storage element (28) and a switching device (29) enabling the charge stored to be provided to an output of the pixel (20). A plurality of dose sensing pixels further comprise a dose sensing element (40;50). Charge flow from the conversion element (26;260) during X-ray exposure results in a change in the charge stored on the charge storage element (28) and also results in a dose sensing signal being generated which can be read out from the pixel (20). The dose sensing pixels enable a dose signal to be obtained without reading the charges stored on the pixel charge storage elements, so that dose sensing can be carried out during exposure.

Claims

1. An X-ray detector apparatus comprising an array of detector pixels, each pixel comprising a conversion element for converting incident radiation into a charge flow, a charge storage element and a switching device enabling the charge stored to be provided to an output of the pixel, and wherein a plurality of dose sensing pixels further comprise a dose sensing element, wherein charge flow from the conversion element during X-ray exposure results in a change in the charge stored on the charge storage element and also results in a dose sensing signal being generated which can be read out from the pixel.

2. Apparatus as claimed in claim 1, further comprising a conversion layer for converting an incident X-ray signal into an optical signal, and wherein the conversion element comprises an optical sensor.

3. Apparatus as claimed in claim 2, wherein optical sensor comprises a photodiode.

4. Apparatus as claimed in claim 3, wherein the charge storage element comprises the self-capacitance of the photodiode.

5. Apparatus as claimed in claim 1, wherein the conversion element comprises a photoconductor.

6. An X-ray examination apparatus comprising:

an X-ray source for exposing an object to be examined to X-ray energy; and

an X-ray detector as claimed in any preceding claim, for receiving an X-ray image after attenuation by the object to be examined.

7. Apparatus as claimed in claim any preceding claim, wherein the pixels are arranged in rows and columns, with rows of pixels sharing a row address line and columns of pixels sharing a column readout line, wherein the charge storage element is connected in series with the switching device between a common electrode for all pixels and the column readout line, the switching device being controlled by the row address line.

8. Apparatus as claimed in claim 7, wherein a node is defined between the charge storage element and the switching device, and wherein the dose sensing element of the dose sensing pixels comprises a further charge storage element connected between the node and a dose signal readout line.

9. Apparatus as claimed in claim 7, wherein a node is defined between the charge storage element the switching device, and wherein the dose sensing element of the dose sensing pixels comprises a transistor connected between a dose electrode common for all the dose sensing pixels and a dose signal readout line, the gate of the transistor being connected to the node.

10. Apparatus as claimed in any preceding claim, wherein the dose sensing signals for a plurality of dose sensing pixels are supplied to an individual dose signal readout line.

11. Apparatus as claimed in claim 10, wherein the pixels are arranged in rows and columns, with rows of pixels sharing a row address line and columns of pixels sharing a column readout line, and wherein the dose signal readout lines are parallel to the column readout lines and are arranged alternately with the column readout lines.

12. Apparatus as claimed in claim 11, wherein the dose sensing pixels associated with an individual dose signal readout line are arranged in a block, and wherein pixel dose outputs in the block are connected together in columns with column lines, and a single row connection line is provided for connecting together the pixel dose outputs of different columns in the block.

13. Apparatus as claimed in claim 10, wherein the pixels are arranged in rows and columns, with rows of pixels sharing a row address line and columns of pixels sharing a column readout line, and wherein the dose signal readout lines are parallel to the row address lines and are arranged alternately with the row address lines.

14. Apparatus as claimed in any preceding claim, wherein all pixels are dose sensing pixels.

15. In an X-ray examination apparatus comprising:

an X-ray source for exposing an object to be examined to X-ray energy and an X-ray detector for receiving an X-ray image after attenuation by the object to be examined, comprising an array of detector pixels, each pixel comprising a conversion element for converting incident radiation into a charge flow, a charge storage element and a switching device enabling the charge stored to be provided to an output of the pixel, wherein a plurality of dose sensing pixels further comprise a dose sensing element, wherein charge flow from the conversion element during X-ray exposure results in a change in the charge stored on the charge storage element and also results in a dose sensing signal being generated which can be read out from the pixel,

a method of controlling the X-ray examination apparatus comprising;

exposing the object to be examined with X-ray radiation;

monitoring output signals from selected dose sensing pixels during the exposure;

halting the X-ray exposure in response to the dose sensing signal monitoring; and

reading out the charges stored on the charge storage elements to obtain an X-ray image.