System and method for multiple image analysis
First Claim
1. A system for multiple image analysis comprising:
- a first light source;
a second light source;
a camera; and
a multiple image processor coupled to the first light source, the second light source, and the camera, the multiple image processor causing the first light source and the second light source to turn on and the camera to generate two or more sets of image data.
2 Assignments
0 Petitions
Accused Products
Abstract
A system for analyzing multiple images is provided, such as to locate defects in a test component. The system includes a first light source, such as one that emits blue light, and a second light source, such as one that emits red light. The system also includes a camera, where the camera and the light sources are focused on an area where a test piece is to be placed. A multiple image processor is connected to the first light source, the second light source, and the camera. The multiple image processor causes the first light source and the second light source to turn on, such as in sequence, and also causes the camera to generate two or more sets of image data, such as one set when each of the light sources is illuminated, through the use of filters or tuned pixels, or otherwise.
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Citations
20 Claims
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1. A system for multiple image analysis comprising:
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a first light source;
a second light source;
a camera; and
a multiple image processor coupled to the first light source, the second light source, and the camera, the multiple image processor causing the first light source and the second light source to turn on and the camera to generate two or more sets of image data. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for inspecting a component comprising:
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illuminating the component from a first illumination angle;
receiving first image data of the component;
illuminating the component from a second illumination angle;
receiving second image data of the component; and
using the first image data and the second image data to determine whether a dimension of the component is acceptable. - View Dependent Claims (12, 13, 14, 15, 16, 18, 19, 20)
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17. A method for inspecting a component comprising:
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receiving first image data and second image data of the component;
comparing the first image data to reference image data to generate first difference data;
comparing the second image data to reference image data to generate second difference data; and
generating component dimension data from the first difference data and the second difference data.
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Specification