Electrostatic discharge protection device
First Claim
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1. A method of producing a semiconductor device, the method comprising:
- masking a substrate with a resist, the substrate having no gate structure over the substrate; and
forming a first dope region and a second doped region in the substrate, wherein the first and second doped regions are separated by only the substrate, wherein a spacing between the first and second doped regions is defined by a length of the resist between the first and second doped regions, wherein the method includes forming no gate above the substrate.
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Abstract
An electrostatic discharge (ESD) protection device is provided. The ESD protection device includes a substrate, a first and a second doped region formed in the substrate. The first and second doped regions are separated from each other by only the substrate region. The ESD protection device includes no gate above the first and second doped regions. Furthermore, the distance separating the first and second doped regions is defined by a length of a resist during a process of forming the ESD protection device.
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Citations
55 Claims
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1. A method of producing a semiconductor device, the method comprising:
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masking a substrate with a resist, the substrate having no gate structure over the substrate; and
forming a first dope region and a second doped region in the substrate, wherein the first and second doped regions are separated by only the substrate, wherein a spacing between the first and second doped regions is defined by a length of the resist between the first and second doped regions, wherein the method includes forming no gate above the substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method of producing a semiconductor device, the method comprising:
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providing a substrate having no gate structure over the substrate;
masking a substrate with a resist having openings for forming a first unmasked region and a second unmasked region of the substrate, wherein the unmasked regions are separated by a length of the resist between the unmasked regions;
implanting dopants into the first and second unmasked regions to form a first source/drain region and a second source/drain regions; and
removing the resist, wherein the method includes forming no gate above the substrate. - View Dependent Claims (9, 10, 11, 12, 13, 15, 16, 17, 18, 19)
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14. A method of producing a semiconductor device, the method comprising:
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providing a substrate having no gate structure over the substrate;
masking the substrate with a resist to define a first unmasked region and second unmasked region, the first and second unmasked regions being separated by a distance equaled to a length of a the resist between the first and second unmasked regions;
implanting dopants into the first and second unmasked regions to form a first source/drain region; and
removing the resist, wherein the method includes forming no gate above the substrate.
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20. A method of making a semiconductor, the method comprising:
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providing a substrate having no gate structure formed above the substrate;
forming a first halo region and a second halo region in the substrate;
forming a first lightly doped region within the first halo region;
forming a second lightly doped region within the second halo region;
forming a first source/drain region within the first lightly doped region; and
forming a second source/drain region within the second lightly doped region without forming a gate over the substrate, wherein the method includes forming no gate above the substrate. - View Dependent Claims (21, 22, 23, 24, 25, 27, 28, 29, 30, 31, 32, 33, 35, 36, 37, 38, 40, 41, 42, 43)
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26. A method of making a semiconductor, the method comprising:
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providing a substrate having no gate structure formed above the substrate;
masking the substrate with a resist, the resist having openings for exposing a first exposed area and a second exposed area of the substrate;
forming a first halo region in the first exposed area, and forming a second halo region in the second exposed area;
forming a first lightly doped region within the first halo region;
forming a second lightly doped region within the second halo region;
forming a first source/drain region within the first lightly doped region; and
forming a second source/drain region within the second lightly doped region, wherein the method includes forming no gate above the substrate.
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34. A method of making a semiconductor, the method comprising:
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providing a substrate having no gate structure formed above the substrate;
masking the substrate with a first resist, the first resist having a first opening and a second opening for exposing a first exposed area and a second exposed area of the substrate; and
implanting dopant into the first exposed area to form a first halo region, and implanting dopant into the second exposed area to form a second halo region, wherein the first and second halo regions are separated by a portion of the substrate having a length equal to a length between the first and the second openings of the first resist;
removing the first resist;
masking the substrate with a second resist, the second resist having a first opening and a second opening for exposing the first and second halo regions;
forming a first lightly doped region within the first halo region, and forming a second lightly within the second halo region;
forming a first source/drain region within the first lightly doped region; and
forming a second source/drain region within the second lightly doped region, wherein the method includes forming no gate above the substrate.
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39. A method of making a semiconductor, the method comprising:
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providing a substrate having no gate structure formed above the substrate;
masking the substrate with a first resist, the first resist having a first opening and a second opening for exposing a first exposed area and a second exposed area of the substrate;
implanting dopant into the first exposed area to form a first halo region, and implanting dopant into the second exposed area to form a second halo region, wherein the first and second halo regions are separated by a portion of the substrate having a length equal to a length between the first and the second openings of the first resist;
removing the first resist;
masking the substrate with a second resist, the second resist having a first opening and a second opening for exposing the first and second halo regions;
forming a first lightly doped region within the first halo region, and forming a second lightly within the second halo region, wherein the first and second lightly doped regions are separated by distance equal to a length between the first and the second openings of the second resist;
removing the second resist;
masking the substrate with a third resist, the third resist having a first opening and a second opening for exposing the first and second lightly doped regions; and
forming a first source/drain region within the first lightly doped region, and forming a second source/drain region within the second lightly doped region, wherein the method includes forming no gate above the substrate.
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44. A method of making a semiconductor, the method comprising:
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providing a substrate having no gate structure formed above the substrate;
masking the substrate with a first resist, the first resist having an opening for exposing an exposed area the substrate;
forming a halo region and a lightly doped region in the exposed area;
removing the first resist;
masking the substrate with a second resist, the second resist having a first opening for exposing the halo and the doped regions, and a second opening for exposing a second exposed area of the substrate; and
forming a first source/drain region within the lightly doped region, and forming a second source/drain region in the second exposed area of the substrate, wherein the method includes forming no gate above the substrate. - View Dependent Claims (45, 46, 47, 48, 50, 51, 52, 53, 54, 55)
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49. A method of making a semiconductor, the method comprising:
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providing a substrate having no gate structure formed above the substrate;
masking the substrate with a first resist, the first resist having an opening for exposing an exposed area the substrate;
forming a halo region and a lightly doped region in the exposed area;
removing the first resist;
masking the substrate with a second resist, the second resist having a first opening for exposing a second exposed area of the substrate, and a second opening for exposing a third exposed area of the substrate, and forming a first source/drain region in the second exposed area, and forming a second source/drain region in the third exposed area, wherein the method includes forming no gate above the substrate.
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Specification