Semiconductor programming and testing method and apparatus

• US 20020199142A1
• Filed: 06/26/2002
• Published: 12/26/2002
• Est. Priority Date: 06/26/2001
• Status: Abandoned Application

• Current Assignee: Etalon Systems, Inc.
• Original Assignee: Etalon Systems, Inc.
• Inventors: Gefen, Moshe
• Application Number:
  US10/180,574
• Publication Number:
  US 20020199142A1
• Time in Patent Office: Days
• US Class Current: 714/724
• CPC Class Codes: G01R 31/318505 Test of Modular systems, e.g. Wafers, MCM's
• CPC Class Codes: G01R 31/319 Tester hardware, i.e. output processing circuits

Abstract

Systems and methods relating to semiconductor testing and programming, including semiconductor-chip testing apparatuses, semiconductor-chip programming apparatuses, semiconductor testing integrated-circuit chips (“TIC'"'"'s”), employable in testing and/or programming semiconductor integrated circuits. Such TICS may be full testers, capable of performing tests such as AC, DC, functional, and mixed signal (analog) tests, and/or may be capable of performing design verification and/or characterization.

Claims

1. A system for testing and/or programming at least one integrated circuit, comprising:

a controller;

a memory coupled to said controller by a first bus characterized by a first bandwidth, wherein said memory stores testing and/or programming information received from said controller via said first bus; and

a plurality of circuit modules that are capable of coupling via a third bus to test and/or program at least one integrated circuit based on the testing and/or programming information stored in said memory, wherein said third bus is capable of operating at a third bandwidth greater than said first bandwidth of said first bus.

2. The system according to claim 1, wherein said plurality of circuit modules are configured to access said testing and/or programming information from said memory via a second bus that operates at a second bandwidth less than said third bandwidth.

3. The system according to claim 2, wherein said plurality of circuit modules are configured for one of said plurality of circuit modules to directly access said memory to obtain said testing and/or programming information, and to sequentially communicate said testing and/or programming information to each of the other of said plurality of circuit modules by serial concatenation.

4. The system according to claim 2, wherein said memory is provided as a plurality of independently accessible memory units, and wherein said plurality of testing modules are organized in groups, each group having a plurality of testing modules configured (i) for one of the circuit modules in the group to directly access a respective one of the memory units to obtain said testing and/or program information and (ii) for sequential communication of said testing and/or programming information to each of the other of said plurality of circuit modules in the group by serial concatenation.

5. The system according to claim 2, wherein said memory is provided as a plurality of independently accessible memory units, and each of said circuit modules is configured to access a respective one of the memory units to obtain said testing and/or program information.

6. The system according to claim 5, wherein each of said testing modules is implemented as a respective testing integrated circuit.

7. The system according to claim 6, wherein each of the memory units is integrated on a respective testing integrated circuit.

8. The system according to claim 1, wherein each of said plurality of circuit modules is implemented as a single testing integrated circuit, the number of testing integrated circuits thereby being equal to the number of circuit modules.

9. The system according to claim 1, wherein the memory is implemented as separate memory devices each dedicated to respective circuit modules.

10. The system according to claim 1, wherein the memory is implemented as a memory device shared by said plurality of circuit modules.

11. The system according to claim 1, wherein each of said circuit modules comprises a plurality of pin channels that are each coupled to a respective node of said at least one integrated circuit, wherein different pin channels of a given one of said circuit modules can be configured for concurrently testing and/or programming different ones of said at least one integrated circuit, a given testing integrated circuit module thereby being capable of concurrently testing a plurality of said at least one integrated circuit.

12. The system according to claim 11, wherein said at least one integrated circuit includes integrated circuits having different characteristics, the given one of said circuit modules capable of concurrently testing and/or programming the integrated circuits having different characteristics.

13. The system according to claim 12, wherein the integrated circuits having different characteristics are devices that store distinct program code, the given one of said circuit modules capable of concurrently programming the distinct program code in the integrated circuits having different characteristics.

14. The system according to claim 1, wherein said at least one integrated circuit includes integrated circuits having different characteristics, said plurality of circuit modules capable of concurrently testing and/or programming the integrated circuits having different characteristics.

15. The system according to claim 14, wherein the different characteristics include different time sets.

16. The system according to claim 1, wherein each of said circuit modules comprises a plurality of pin channels that are each coupled to a respective node of said at least one integrated circuit, wherein each of the plurality of pin channels is independently capable of at least DC, AC, and functional testing operations.

17. The system according to claim 1, wherein said testing modules and said at least one integrated circuit are mounted on a loading printed circuit board.

18. The system according to claim 17, wherein said controller is mounted on said loading printed circuit board.

19. The system according to claim 17, wherein said controller is implemented as a personal computer.

20. The system according to claim 1, wherein said at least one integrated circuit are each located on a wafer.

21. The system according to claim 1, wherein said at least one integrated circuit are packaged dies.

54. The system according to claim 1, wherein said third bus operates at a speed specified by said at least one integrated circuit.

22. A method for programming and/or testing at least one integrated circuit, the method comprising:

storing in a memory testing and/or programming information received from a controller via a first bus characterized by a first bandwidth;

accessing the stored testing and/or programming information; and

communicating testing and/or programming signals with said at least one integrated circuit to test and/or program said at least one integrated circuit, the testing and/or programming signals being transmitted to said at least one integrated circuit at a third bandwidth greater than said first bandwidth, said testing and/or programming signals being based on the testing and/or programming information accessed from said memory.

23. The method according to claim 22, wherein said accessing is effected via a second bus having a second bandwidth less than said third bandwidth.

24. The method according to claim 22, wherein said communicating testing and/or programming signals includes outputting signals to said at least one integrated circuit and inputting signals from said at least one integrated circuit.

25. The method according to claim 22, wherein said testing and/or programming signals are operative in effecting AC, DC, and functional testing.

27. The system according to claim 26, wherein said at least one integrated circuit includes at least one memory or programmable device, said system further comprising means for generating a representation of defective locations in the at least one memory or programmable device.

28. The system according to claim 27, further comprising means for programming said at least one memory or programmable device based on said representation of defective locations in the at least one memory or programmable device.

30. The testing and/or programming circuit module according to claim 29, wherein different configurable pin channels are configurable for concurrently testing and/or programming different ones of said at least one integrated circuit, thereby concurrently testing and/or programming a plurality of said at least one integrated circuit.

31. The testing and/or programming circuit module according to claim 30, wherein said at least one integrated circuit includes integrated circuits having different characteristics.

32. The testing and/or programming circuit module system according to claim 31, wherein the integrated circuits having different characteristics are devices that store distinct program code, the testing and/or programming circuit module capable of concurrently programming the distinct program code in the integrated circuits having different characteristics.

33. The testing and/or programming circuit module according to claim 31, wherein the different characteristics include different time sets.

34. The testing and/or programming circuit module according to claim 29, wherein said testing and/or programming information is accessed by said testing and/or programming module via a second bus having a second bandwidth that is less than the bandwidth for the communication by each of the configurable pin channels of testing and/or programming signals to the nodes.

35. The testing and/or programming circuit module according to claim 29, wherein said testing and/or programming information is stored in said memory by a controller via a first bus having a first bandwidth that is less than the bandwidth for the communication by each of the configurable pin channels of testing and/or programming signals to the nodes.

36. The testing and/or programming circuit module according to claim 29, wherein each of the plurality of pin channels is independently capable of at least DC, AC, and functional testing operations.

37. The testing and/or programming circuit module according to claim 36, wherein each of the plurality of pin channels is further independently capable of mixed signal testing.

38. The testing and/or programming circuit module according to claim 37, wherein each of the plurality of pin channels is further independently capable of design verification and characterization.

39. The testing and/or programming circuit module according to claim 29, wherein said control circuit and said plurality of configurable channels are implemented as a single integrated circuit.

40. The testing and/or programming circuit module according to claim 39, wherein said integrated circuit further includes a test pattern generating circuit, a timing measuring circuit, and a formation circuit.

41. The testing and/or programming circuit module according to claim 40, wherein said integrated circuit further includes a failure analysis circuit.

42. The testing and/or programming circuit module according to claim 39, wherein said integrated circuit further includes said memory.

43. The testing and/or programming circuit module according to claim 29, wherein said at least one integrated circuit includes at least one memory or programmable device, said control circuit operative to generate a representation of defective locations in the at least one memory or programmable device.

44. The system according to claim 43, said control circuit further operative in programming said at least one memory or programmable device based on said representation of defective locations in the at least one memory or programmable device.

46. The system according to claim 45, wherein said controller is a personal computer.

47. The system according to claim 45, wherein said controller, said plurality of circuit modules, and said at least one integrated circuit are mounted on a printed circuit board.

49. The method according to claim 48, further comprising programming said plurality of integrated circuits while located in the burn-in oven.

55. The method according to claim 22, wherein the testing and/or programming signals are transmitted to said at least one integrated circuit at a speed specified by said at least one integrated circuit.

56. The system according to claim 26, wherein the testing and/or programming signals are transmitted to said at least one integrated circuit at a speed specified by said at least one integrated circuit.

57. The system according to claim 29, wherein the testing and/or programming signals are transmitted to the respective nodes at a speed specified by said at least one integrated circuit.

26. A system for programming and/or testing at least one integrated circuit, the system comprising:

means for storing testing and/or programming information received from a controller via a first communication link characterized by a first bandwidth; and

means for communicating testing and/or programming signals with said at least one integrated circuit to test and/or program said at least one integrated circuit, the testing and/or programming signals being transmitted to said at least one integrated circuit at a third bandwidth greater than said first bandwidth, said testing and/or programming signals being based on the testing and/or programming information accessed from said means for storing.

29. A testing and/or programming circuit module for testing and/or programming at least one integrated circuit, comprising:

a plurality of configurable pin channels each capable of being coupled to a respective node of said at least one integrated circuit;

a control circuit that is operative in coordinating the communication by each of the configurable pin channels with the respective nodes of testing and/or programming signals based on testing and/or programming information stored in a memory.

45. A system for testing and/or programming at least one integrated circuit, comprising:

a controller that (i) generates test patterns and/or control signals for testing the at least one integrated circuit and/or (ii) stores program code and/or control signals for programming the at least one integrated circuit; and

a plurality of circuit modules that are coupled to said controller and each include a plurality of pin channels that are capable of being coupled to a respective node of said at least one integrated circuit, each circuit module including circuitry to provide at least DC, AC, and functional testing operations and/or programming based on the test patterns, control signals, and/or program code generated and/or stored by said controller.

48. A method for testing a plurality of integrated circuits, comprising:

conducting a burn-in operation on said plurality of integrated circuits located in a burn-in oven; and

performing AC, DC, and functional testing on said plurality of integrated circuits while conducting the burn-in operation.

50. A method for programming a plurality of integrated circuits, comprising:

conducting a burn-in operation on said plurality of integrated circuits located in a burn-in oven; and

programming said plurality of integrated circuits while located in the burn-in oven.

51. The method according to claim 50, wherein said programming is performed while conducting the burn-in operation.

52. The method according to claim 50, wherein said programming is performed after the burn-in operation.

53. A system for testing and/or programming at least one integrated circuit, comprising:

a controller that (i) generates test patterns and/or control signals for testing the at least one integrated circuit and/or (ii) stores program code and/or control signals for programming the at least one integrated circuit; and

a plurality of circuit modules that are coupled to said controller and each include a plurality of pin channels that are capable of being coupled to a respective node of said at least one integrated circuit, each circuit module testing and/or programming said at least one integrated circuit at the speed specified by said at least one integrated circuit, the testing and/or programming based on the test patterns, control signals, and/or program code generated and/or stored by said controller.