Method and apparatus for determining a magnetic field
First Claim
1. A method for determining a magnetic field value of an integrated circuit inside an integrated circuit package, said integrated circuit having a plurality of current carrying lines, said method comprising:
- measuring a first induced voltage due to a current carrying line'"'"'s electromagnetic field, wherein said first induced voltage includes a first electric field induced voltage;
measuring a second induced voltage due to said current carrying line'"'"'s electromagnetic field, such that said second induced voltage includes a second electric field voltage that is substantially equal to said first electric field induced voltage; and
determining said component of said magnetic field based on a difference between said first induced voltage and said second induced voltage.
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Accused Products
Abstract
The present invention provides a magnetic field measuring method and system for determining the magnetic field of an integrated circuit (IC) inside the IC package, including the pre-packaged IC. In one embodiment, induced voltages due only to the magnetic field are determined at measurement heights on the order of the line spacings in an integrated circuit. A magnetic probe is used; the probe has a loop of wire parallel to the current, for measuring the induced voltage of the horizontal component of the magnetic field. The induced voltage due to the electric field is removed by using a calculation including the difference of two measurements. The magnetic field distribution for the integrated circuit may be determined by using the above procedure on a grid like pattern above the IC.
8 Citations
21 Claims
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1. A method for determining a magnetic field value of an integrated circuit inside an integrated circuit package, said integrated circuit having a plurality of current carrying lines, said method comprising:
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measuring a first induced voltage due to a current carrying line'"'"'s electromagnetic field, wherein said first induced voltage includes a first electric field induced voltage;
measuring a second induced voltage due to said current carrying line'"'"'s electromagnetic field, such that said second induced voltage includes a second electric field voltage that is substantially equal to said first electric field induced voltage; and
determining said component of said magnetic field based on a difference between said first induced voltage and said second induced voltage. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method for determining a magnetic field distribution of an electronic circuit of a Large Scale Integrated (LSI) circuit inside said LSI circuit package, comprising:
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determining a first voltage induced in a measuring circuit by an Electro-magnetic field of said electronic circuit, wherein said measuring circuit, when used for determining said first voltage, has a first end coupled to ground and a second end coupled to a voltage measuring device;
determining a second voltage induced in said measuring circuit by said Electro-magnetic field of said electronic circuit, wherein said measuring circuit, when used for determining said second voltage, has said first end coupled to said voltage measuring device and said second end coupled to ground; and
calculating a magnetic field induced voltage using a difference between said first induced voltage and said second induced voltage, wherein a magnetic field at said measuring circuit is proportional to said magnetic field induced voltage. - View Dependent Claims (9, 10, 11, 12, 14, 15, 16, 17, 18, 19, 20)
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13. A magnetic field probe system for determining a magnetic field distribution of an integrated circuit inside an integrated circuit package, comprising:
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a measuring probe for measuring an induced voltage produced by an electromagnetic field of said integrated circuit at a height above said integrated circuit on a same order of magnitude as a distance between said integrated circuit'"'"'s current carrying lines, said measuring probe comprising a first termination point coupled with a second termination point by an electronic circuit;
a voltage measuring device for measuring said induced voltage; and
a switch in which a first end is coupled to said measuring probe via said first and second termination points and a second end is coupled to said voltage measuring device and to ground, wherein when said switch is in a first position, said first termination point is coupled to said voltage measuring device and said second termination point is coupled to ground, and when said switch is in a second position, said first termination point is coupled to ground and said second termination point is coupled to said voltage measuring device.
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21. A computer program product stored on a computer readable medium for determining a magnetic field value of an integrated circuit inside an integrated circuit package, said integrated circuit comprising a line, said computer program product comprising:
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code for determining a first voltage induced in a measuring circuit by an Electro-magnetic field of said line, wherein said measuring circuit, when used for determining said first voltage, has a first end coupled to ground and a second end coupled to a voltage measuring device;
code for determining a second voltage induced in said measuring circuit by said Electro-magnetic field of said line, wherein said measuring circuit, when used for determining said second voltage, uses a switch to couple said first end to said voltage measuring device and said second end to ground; and
code for calculating a magnetic field induced voltage using a difference between said first induced voltage and said second induced voltage, wherein a magnetic field at said measuring circuit is proportional to said magnetic field induced voltage.
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Specification