Apparatus having pattern scrambler for testing a semiconductor device and method for operating same
First Claim
1. An apparatus for testing a device under test (DUT) having a plurality of pins, the apparatus comprising:
- a clock having a clock cycle a plurality of pin electronics channels (PEs) capable of coupling to the plurality of pins on the DUT;
a plurality of timing and format circuits (T/Fs) each capable of mapping a signal to one of the plurality of PEs;
a pattern memory capable of storing a number of bits for testing the DUT, the pattern memory having a plurality of outputs capable of outputting the bits to test the DUT; and
a pattern scrambler coupled between the plurality of outputs and the plurality of T/Fs, the pattern scrambler capable of being programmed to couple bits from one or more of the plurality of outputs to one or more of the plurality of T/Fs, to provide a test pattern to the DUT having a width of from 1 bit wide to a width equal to the number of the plurality of PEs.
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Accused Products
Abstract
A system and method are provided for testing electronic devices. Generally, the system includes: (i) a pattern memory with outputs for storing and outputting bits to the device; and (ii) a pattern scrambler for coupling bits from the outputs to pins on the device to provide a test pattern to the device having a width of from 1 bit to a width equal to the number of outputs. Preferably, the system includes a clock with a clock cycle, and the scrambler can change the width and/or depth of the test pattern on a cycle-by-cycle basis More preferably, the scrambler can change the bits coupled to one or more of the pins on a cycle-by-cycle basis. In one embodiment, the memory simultaneously provides logic vector memory and scan memory for storing logic and scan vectors respectively, and the width/depth of the vectors can be changed on a cycle-by-cycle basis.
29 Citations
23 Claims
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1. An apparatus for testing a device under test (DUT) having a plurality of pins, the apparatus comprising:
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a clock having a clock cycle a plurality of pin electronics channels (PEs) capable of coupling to the plurality of pins on the DUT;
a plurality of timing and format circuits (T/Fs) each capable of mapping a signal to one of the plurality of PEs;
a pattern memory capable of storing a number of bits for testing the DUT, the pattern memory having a plurality of outputs capable of outputting the bits to test the DUT; and
a pattern scrambler coupled between the plurality of outputs and the plurality of T/Fs, the pattern scrambler capable of being programmed to couple bits from one or more of the plurality of outputs to one or more of the plurality of T/Fs, to provide a test pattern to the DUT having a width of from 1 bit wide to a width equal to the number of the plurality of PEs. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A pattern generator for testing at least one device under test (DUT) having a plurality of pins, the pattern generator comprising:
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a pattern memory capable of storing a number of bits for testing the DUT, the pattern memory having a plurality of outputs capable of outputting the bits to test the DUT; and
a pattern scrambler coupled between the plurality of outputs and the plurality of pins on the DUT, the pattern scrambler capable of being programmed to couple bits from one or more of the plurality of outputs to one or more of the plurality of pins on the DUT, to provide a test pattern to the DUT having a width of from 1 bit wide to a width equal to the number of the plurality of outputs. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 16, 18, 19, 20, 21, 22, 23)
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17. A method for testing a device under test (DUT) using a test system including a pattern memory having a plurality of outputs equal to n, and a pattern scrambler coupled between the plurality of outputs and a plurality of pins on the DUT, the method comprising steps of:
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storing a number of bits for testing the DUT in the pattern memory; and
programming the pattern scrambler to output bits from one or more of the plurality of outputs to one or more of the plurality of pins on the DUT, and to provide a test pattern to the DUT having a width of from 1 to n bits.
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Specification