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System and method for non-contact electrical testing employing a CAM derived reference

  • US 20030011380A1
  • Filed: 03/27/2002
  • Published: 01/16/2003
  • Est. Priority Date: 03/28/2001
  • Status: Active Grant
First Claim
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1. A tester for electrically testing a board under test (BUT) for defects, comprising:

  • a sensor operative to provide detection outputs corresponding to a sensed electrical characteristic for selected locations on a BUT; and

    a defect processor;

    receiving said detection outputs, and receiving a reference representing anticipated values corresponding to the detection outputs for the selected BUT locations, said reference including anticipated values that are calculated from information representing said BUT and sensor; and

    said defect processor being operative to output an indication of a possible electrical defect in said BUT by comparing said detection outputs to said reference anticipated values.

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