Systems and methods for localizing and analyzing samples on a bio-sensor chip
First Claim
1. An analytical device comprising:
- a substrate having a first surface;
a crater formed in the first surface of said substrate;
a sensing element integrated within said substrate proximal said crater, said sensing element configured to detect one or more physical properties within said crater; and
a force transduction element located proximal the crater and configured to generate a field that attracts one or more sample particles toward the crater, wherein at least one of said one or more particles is of sufficient size to close the opening in the first surface of the substrate defined by the crater.
3 Assignments
0 Petitions
Accused Products
Abstract
Chips that include one or more particle manipulation mechanisms, or force transduction elements, provided at specific locations to manipulate and localize particles proximal the substrate surface. In one embodiment, individually addressable magnetic control mechanisms such as electric coils are provided at specific locations to create a magnetic field to attract magnetic particles, such a magnetic or magnetizable beads, to those specific locations. In another embodiment, electrostatic control mechanisms such as electrodes are provided to attract and manipulate electrically charged micro-particles. A location may include a crater or well formed in the substrate, or it may include an element on the surface of the substrate. In some embodiments, one or more sensors are located proximal specific locations, e.g. specific craters, so as to analyze specific conditions at each location. In other embodiments, multiple locations share one or more sensors.
238 Citations
45 Claims
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1. An analytical device comprising:
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a substrate having a first surface;
a crater formed in the first surface of said substrate;
a sensing element integrated within said substrate proximal said crater, said sensing element configured to detect one or more physical properties within said crater; and
a force transduction element located proximal the crater and configured to generate a field that attracts one or more sample particles toward the crater, wherein at least one of said one or more particles is of sufficient size to close the opening in the first surface of the substrate defined by the crater. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29)
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15. An analytical device comprising:
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a substrate having a first surface;
a crater formed in the first surface of said substrate;
a lid particle introduced in a fluid medium proximal said crater, wherein said lid particle is of sufficient size to close the opening in the first surface of the substrate defined by the crater; and
a force transduction element located proximal the crater and configured to generate a field that attracts said lid particle toward the crater in response to a control signal so as to close the crater.
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30. An analytical device comprising:
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a substrate having a first surface;
a crater formed in the first surface of said substrate;
a sensing element integrated within said substrate proximal said crater, said sensing element configured to detect one or more physical properties within said crater; and
a sample particle introduced in a fluid medium proximal said crater, wherein said crater is substantially commensurate in shape and size with a portion of said sample particle so as to hold said sample particle in place therein.
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31. An analytical system, comprising:
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a substrate having a first surface;
a crater formed in the first surface of the substrate, said crater defining an opening in the first surface of said substrate; and
means for closing said opening so as to substantially seal off samples trapped in the crater from the surrounding environment. - View Dependent Claims (32, 33, 34, 35, 36, 37, 38, 40, 41)
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39. A method of localizing known amounts of sample materials at each of one or more specific locations on a substrate, each specific location including an individually addressable force transducing element, the method comprising;
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providing a plurality of sample particles proximal the substrate;
selectively activating one or more of said force transducing elements, wherein each activated force transducing element generates a field that attracts said particles to the corresponding specific location; and
detecting, at each activated location, the number of particles attracted to the location.
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42. An analytical device comprising:
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a substrate having a first surface; and
an array of locations patterned on the substrate, each location including;
a crater formed in the first surface of said substrate;
a sensing element integrated within said substrate proximal said crater, said sensing element configured to detect one or more physical properties within said crater; and
a force transduction element located proximal the crater and configured to generate a field that attracts one or more sample particles toward the crater; and
a fluid medium disposed proximal at least a portion of said array of locations, said fluid medium including a plurality of said sample particles. - View Dependent Claims (43, 44, 45)
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Specification