Selectively plated sensor

• US 20030018243A1
• Filed: 06/07/2002
• Published: 01/23/2003
• Est. Priority Date: 07/07/1999
• Status: Abandoned Application

• Current Assignee: David Tobler, Eugene E. Mason, Thomas J. Gerhardt, Yassir AbdulHafiz
• Original Assignee: David Tobler, Eugene E. Mason, Thomas J. Gerhardt, Yassir AbdulHafiz
• Inventors: Tobler, David R., Gerhardt, Thomas J., Abdul-Hafiz, Yassir, Mason, Eugene E.
• Application Number:
  US10/165,615
• Publication Number:
  US 20030018243A1
• Time in Patent Office: Days
• US Class Current: 600/322
• CPC Class Codes: A61B 2562/0233 Special features of optical sensors or probes classified in A61B5/00
• CPC Class Codes: A61B 5/0059 using light, e.g. diagnosis by transillumination, diascopy, fluorescence A61B5/0093, A61B5/1455, A61B5/02416 and A61B5/0261 take precedence
• CPC Class Codes: A61B 5/6829 Foot or ankle
• CPC Class Codes: H05K 1/118 specially for flexible printed circuits, e.g. using folded portions
• CPC Class Codes: H05K 1/189 characterised by the use of a flexible or folded printed circuit H05K3/326 takes precedence
• CPC Class Codes: H05K 3/243 characterised by selective plating, e.g. for finish plating of pads selective plating for making the circuit pattern H05K3/108, H05K3/182
• CPC Class Codes: H05K 3/28 Applying non-metallic protective coatings H05K3/0091 takes precedence; methods for intermediate insulating layers for build-up multilayer circuits H05K3/4673

Abstract

A selectively plated low-noise optical sensor for non-invasive physiological monitoring has an LED emitter that emits light at a known wavelength. The light propagates through a body material and an attenuated signal is received by a photodetector, which produces an electrical signal indicative of the intensity of light energy incident on the detector. The electrical signal is conducted through a plurality of traces to a contact end of the sensor. The contact end allows connection to a connector which communicates the electrical signal to a processor. The emitter and detector are connected to the sensor traces at trace connection pads in the component connection areas. The trace connection pads in the contact area and the connection areas are electroplated with a protective metallic layer. The traces are otherwise covered with a solder mask. In this manner, solderability of the connection pads is enhanced and the traces and connection pads are protected from environmental factors which may cause noise-generating degradation.

Claims

1. An optical probe for non-invasive measurement of characteristics of a medium, comprising:

an emitter which transmits optical radiation;

a detector configured to detect said optical radiation transmitted by said emitter and attenuated by said medium; and

a flexible circuit assembly including said emitter, said detector, and a connector tab, said connector tab adapted to releasably engage a connector, said flexible circuit assembly having electrical circuit paths coupling said emitter and said detector with said connector tab, said electrical circuit paths having component connection areas positioned and adapted to facilitate electrical connection between said paths and said emitter and detector, and a contact area defined on the connector tab and adapted to facilitate electrical connection between said paths and said connector;

wherein the circuit paths in the contact area and component connection areas are coated with a solderable protective coating, and the rest of said circuit paths are coated with non-conductive insulation.

2. The optical probe of claim 1, wherein the circuit paths comprise copper cladding formed on a single side of a polyimide film.

3. The optical probe of claim 1, wherein the insulation comprises a layer of solder mask.

4. The optical probe of claim 3, wherein the solder mask is about 250-750 microinches thick.

5. The optical probe of claim 1, wherein the protective coating comprises a metallic layer.

6. The optical probe of claim 5, wherein the protective coating comprises a layer of gold.

7. The optical probe of claim 6, wherein the layer of gold is overlaid onto a layer of nickel.

8. The optical probe of claim 7, wherein the protective coating is about 25-50 microinches thick.

9. The optical probe of claim 5, wherein the protective coating comprises material chosen from the group consisting of tin, tin over copper, tin/lead alloy over copper, silver and gold.

10. The optical probe of claim 5, including a resistor and a resistor component connection area, the resistor component connection area positioned and adapted to facilitate electrical connection between a first and a second of said electrical circuit paths via said resistor.

11. A flexible circuit assembly for providing electrical communication between at least one component and a connector, comprising a plurality of electrical circuit paths extending between the connector and the component, at least one contact area being defined along the paths, and the component attaches to the paths at one contact area, the circuit paths being covered with a solderable protective coating in the at least one contact area and the circuit paths being otherwise covered with non-conductive insulation.

12. The flexible circuit assembly of claim 11, wherein the non-conductive insulation comprises a coating of solder mask about 250-750 microinches thick.

13. The flexible circuit assembly of claim 11, wherein the electrical circuit paths in the at least one contact area are coated with a conductive metallic material.

14. The flexible circuit assembly of claim 13, wherein the electrical circuit paths in the at least one contact area are coated with nickel overlaid by gold.

15. The flexible circuit assembly of claim 11, wherein the electrical circuit paths include a resistor contact area defined between a first and second circuit path, and said first and second circuit paths are adapted to receive a resistor extending between them.

16. The flexible circuit assembly of claim 15, wherein the first and second circuit paths are coated with a metallic protective layer in the resistor contact area.

17. The flexible circuit assembly of claim 11, including an emitter component and a detector component, said emitter component adapted to transmit optical radiation and said detector component configured to detect said optical radiation transmitted by said emitter and attenuated by a medium disposed between the emitter and detector.

19. The method of claim 18, wherein the flexible substrate is a polyimide film between about 0.75 and 1.25 mil thick and the electrical circuit paths are formed of copper cladding of between about ½

-1½

oz.

20. The method of claim 18, wherein the insulation is applied prior to applying the protective coating.

21. The method of claim 18, wherein the protective coating is formed by first depositing a layer of nickel and subsequently depositing a layer of gold over the layer of nickel.

22. The method of claim 21, wherein the layers of gold and nickel are deposited by electroplating.

23. The method of claim 21, wherein the insulation comprises a layer of solder mask deposited on the film and over the circuit paths.

24. The method of claim 23, additionally comprising exposing the flex circuit to ultraviolet radiation to cure the solder mask.

25. The method of claim 23, wherein the solder mask comprises screenable solder mask.

26. The method of claim 23 wherein the solder mask comprises dry film photo-imageable solder mask.

27. The method of claim 18, additionally comprising defining a resistor component connection area, the resistor component connection area including portions of a first and a second circuit path.

28. The method of claim 27, additionally comprising attaching a resistor to the first and second circuit paths in the resistor component connection area after the protective coating has been applied.

30. The optical probe of claim 29, wherein the protective coating comprises a layer of nickel overlaid by said layer of gold.

31. The optical probe of claim 29, wherein the protective coating is about 25-50 microinches thick.

18. A method for making a flexible circuit assembly for a medical sensor, comprising the steps of:

forming a plurality of electrical circuit paths on at least one side of a flexible substrate;

defining a contact area at a first end of the circuit paths and at least one component connection area at a second end of the circuit paths;

providing an emitter adapted to transmit optical radiation;

providing a detector configured to detect said optical radiation transmitted by said emitter;

coating the electrical circuit paths except for said contact and component connection areas with insulation;

coating the electrical circuit paths in said contact and component connection areas with a solderable protective coating; and

electrically connecting the detector to at least one circuit path in the component connection area.

29. An optical probe for non-invasive measurement of characteristics of a medium, comprising:

an emitter which transmits optical radiation;

a detector configured to detect said optical radiation transmitted by said emitter and attenuated by said medium; and

a flexible circuit assembly including said emitter, said detector, and a connector tab, said flexible circuit assembly having electrical circuit paths connecting said emitter and said detector with said connector tab, said electrical circuit paths being coated with a solderable protective coating comprising a layer of gold.