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Production pattern-recognition artificial neural net (ANN) with event-response expert system (ES)--yieldshieldTM

  • US 20030028353A1
  • Filed: 08/06/2001
  • Published: 02/06/2003
  • Est. Priority Date: 08/06/2001
  • Status: Abandoned Application
First Claim
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1. A system for monitoring a manufacturing production line, said system comprising:

  • an artificial neural network (ANN) for recognizing and classifying production yield patterns; and

    an expert system (ES) coupled to said artificial neural network to provide a knowledge base and apply cognitive heuristics to execute responses based on production yield patterns information received from said artificial neural network.

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