Substrate processing system for performing exposure process in gas atmosphere

• US 20030041971A1
• Filed: 08/23/2002
• Published: 03/06/2003
• Est. Priority Date: 08/28/2001
• Status: Abandoned Application

• Current Assignee: NEC Corporation
• Original Assignee: NEC Corporation
• Inventors: Ikeda, Masaki, Kido, Shusaku, Iio, Yoshihide
• Application Number:
  US10/226,961
• Publication Number:
  US 20030041971A1
• Time in Patent Office: Days
• US Class Current: 156/345.33
• CPC Class Codes: H01J 37/3244 Gas supply means
• CPC Class Codes: H01J 37/32449 Gas control, e.g. control of the gas flow
• CPC Class Codes: H01L 21/67017 Apparatus for fluid treatment H01L21/67126, H01L21/6715 take precedence
• CPC Class Codes: H01L 21/6715 Apparatus for applying a liquid, a resin, an ink or the like H01L21/67126 takes precedence
• CPC Class Codes: H01L 21/67248 Temperature monitoring
• CPC Class Codes: H01L 21/68742 characterised by a lifting arrangement, e.g. lift pins
• CPC Class Codes: H01L 21/68764 characterised by a movable susceptor, stage or support, others than those only rotating on their own vertical axis, e.g. susceptors on a rotating caroussel
• CPC Class Codes: Y02E 10/50 Photovoltaic [PV] energy

Abstract

A substrate processing system which sprays exposure process gas onto a substrate disposed within a chamber. The substrate processing system is used, for example, for performing an exposure process of an organic film formed on a substrate in a gas atmosphere obtained by vaporizing an organic solvent solution for dissolving and reflowing an organic film. The substrate processing system comprises: the chamber having at least one gas inlet and at least one gas outlets; a gas introducing means which introduces the exposure process gas into the chamber via the gas inlet; and a gas distributing means. The gas distributing means separates an inner space of the chamber into a first space into which the exposure process gas is introduced via the gas inlet and a second space in which the substrate is disposed. The gas distributing means has a plurality of openings via which the first space and the second space communicate with each other and introduces the exposure process gas introduced into the first space into the second space via the openings.

Claims

1. A substrate processing system which sprays exposure process gas onto a substrate disposed within a chamber, the substrate processing system comprising:

the chamber having at least one gas inlet and at least one gas outlets;

a gas introducing means which introduces the exposure process gas into the chamber via the gas inlet; and

a gas distributing means;

wherein the gas distributing means separates an inner space of the chamber into a first space into which the exposure process gas is introduced via the gas inlet and a second space in which the substrate is disposed;

the gas distributing means has a plurality of openings via which the first space and the second space communicate with each other; and

the gas distributing means introduces the exposure process gas introduced into the first space into the second space via the openings.

3. A substrate processing system as set forth in claim 1, wherein the chamber has a plurality of gas inlets, and the first space is divided into a plurality of small spaces by surrounding a predetermined number of gas inlets with partitions.

4. A substrate processing system as set forth in claim 3, further comprising a gas flow rate control mechanism for each of the gas inlets.

5. A substrate processing system as set forth in claim 1, further comprising one or more gas diffusing members which are disposed in the first space and which diffuse the exposure process gas introduced via the gas inlet to uniform a density of the exposure process gas within the chamber.

6. A substrate processing system as set forth in claim 1, wherein the gas distributing means comprises a curved plate member which is convex or concave toward the substrate.

7. A substrate processing system as set forth in claim 1, further comprising a gas spouting range defining means which is disposed such that the gas spouting range defining means overlaps the gas distributing means and which closes a predetermined number of openings among the openings formed in the gas distributing means, thereby defining a gas spouting range of the exposure process gas.

8. A substrate processing system as set forth in claim 1, wherein the gas distributing means is rotatable around the center thereof.

11. A substrate processing system as set forth in claim 1, further comprising a stage on which the substrate is placed, the stage being movable up and down.

12. A substrate processing system as set forth in claim 1, further comprising a stage on which the substrate is placed, the stage being rotatable around the center axis thereof.

13. A substrate processing system as set forth in claim 1, further comprising a substrate temperature control means which controls the temperature of the substrate.

14. A substrate processing system as set forth in claim 1, further comprising a gas temperature control means which controls the temperature of the exposure process gas.

15. A substrate processing system as set forth in claim 13, further comprising a stage on which the substrate is placed, and the substrate temperature control means controls the temperature of the substrate by controlling the temperature of the stage.

16. A substrate processing system as set forth in claim 1, wherein the pressure within the chamber is in a range from −

20 KPa to +20 KPa.

17. A substrate processing system as set forth in claim 1, further comprising a plasma generating means which generates plasma within the chamber.

18. A substrate processing system as set forth in claim 17, wherein the plasma generating means comprises an upper electrode disposed above the substrate and a lower electrode disposed below the substrate,

wherein one of the upper electrode and the lower electrode is grounded, and the other one of the upper electrode and the lower electrode is coupled with the ground via a high frequency power source.

19. A substrate processing system as set forth in claim 1, further comprising:

a reduced pressure transport chamber which is communicated with the chamber and which is used for transporting the substrate into the chamber under a reduced pressure condition and for transporting the substrate out from the chamber under a reduced pressure condition; and

a pressure controlled transport chamber which is communicated with the reduced pressure transport chamber, which is used for introducing the substrate from outside under the atmospheric pressure condition and for transporting the substrate into the reduced pressure transport chamber under a reduced pressure condition and which is used for transporting the substrate out from the reduced pressure transport chamber under a reduced pressure condition and for transporting the substrate outside under the atmospheric pressure condition.

2. A substrate processing system which sprays exposure process gas onto each of a plurality of substrates disposed parallel within a chamber in a vertical direction, the substrate processing system comprising:

the chamber having at least one gas inlet and at least one gas outlets;

a gas introducing means which introduces the exposure process gas into the chamber via the gas inlet; and

gas distributing means each of which is provided for corresponding one of the plurality of substrates;

wherein the gas distributing means has a plurality of openings, and

the exposure process gas introduced via the gas inlet into the chamber is sprayed onto the substrate via the openings.

9. A substrate processing system which sprays exposure process gas onto a substrate disposed within a chamber, the substrate processing system comprising:

the chamber having at least one gas inlet and at least one gas outlets;

a gas introducing means which introduces the exposure process gas into the chamber via the gas inlet; and

gas distributing means which sprays the exposure process gas introduced into the chamber onto the substrate;

wherein the gas distributing means is movable within the chamber along an upper wall of the chamber.

10. A substrate processing system as set forth in claim 9, wherein the gas distributing means is rotatable around the center axis thereof.