Insulated gate bipolar transistor, semiconductor device, method of manufacturing insulated-gate bipolar transistor, and method of manufacturing semiconductor device
First Claim
1. An insulated gate bipolar transistor (101, 101a, 102, 102a, 103, 103a, 104, 104a) comprising:
- a semiconductor substrate (1) having first and second major surfaces;
a collector electrode (8) which is located on said first major surface side of said semiconductor substrate (1); and
an emitter electrode (7) and a gate electrode (5) that are located on said second major surface side, wherein said semiconductor substrate (1) comprises;
a collector layer (11) of a first conductive type that is exposed to said first major surface and connected to said collector electrode (8); and
a base layer (12, 13) of a second conductive type that is formed on said collector layer (11) and is not exposed to said first major surface, and wherein said base layer (12, 13) and said collector layer (11) have a characteristic as a free-wheel diode.
1 Assignment
0 Petitions
Accused Products
Abstract
This invention relates to an insulated gate bipolar transistor, a semiconductor device using such a transistor and manufacturing methods of these, and in particular, its object is to eliminate the necessity of connection to a freewheel diode used for bypassing a circulating current.
In order to achieve this object, the concentration of impurities of an N+ buffer layer (12) that forms a junction with a P+ collector layer (11) is increased so that it is possible to reduce an avalanche breakdown voltage of a parasitic diode (D) formed by an N base layer (12, 13) and the P+ collector layer (11). Thus, the reverse voltage resistance of an IGBT (101) is lowered to not more than 5 times the collector-emitter saturated voltage (VCE(sat)).
26 Citations
22 Claims
-
1. An insulated gate bipolar transistor (101, 101a, 102, 102a, 103, 103a, 104, 104a) comprising:
-
a semiconductor substrate (1) having first and second major surfaces;
a collector electrode (8) which is located on said first major surface side of said semiconductor substrate (1); and
an emitter electrode (7) and a gate electrode (5) that are located on said second major surface side, wherein said semiconductor substrate (1) comprises;
a collector layer (11) of a first conductive type that is exposed to said first major surface and connected to said collector electrode (8); and
a base layer (12, 13) of a second conductive type that is formed on said collector layer (11) and is not exposed to said first major surface, and wherein said base layer (12, 13) and said collector layer (11) have a characteristic as a free-wheel diode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
-
-
16. A manufacturing method of an insulated gate bipolar transistor (101, 101a, 102, 102a, 103, 103a, 104, 104a) which comprises a semiconductor substrate (1) having first and second major surfaces, a collector electrode (8) that is located on said first major surface side of said semiconductor substrate (1), and an emitter electrode (7) and a gate electrode (5) that are located on said second major surface side, comprising the steps of:
-
(a) forming said semiconductor substrate (1) so as to provide a collector layer (11) of a first conductive type that is exposed to said first major surface and a base layer (12, 13) of a second conductive type that is formed on said collector layer (11) and is not exposed to said first major surface; and
(b) forming said collector electrode (8) on said first major surface so as to be connected to said collector layer (11), wherein in said step (a), said semiconductor substrate (1) is formed so that said base layer (12, 13) and said collector layer (11) are allowed to have a characteristic as a freewheel diode. - View Dependent Claims (17, 18, 19, 20, 21, 22)
-
Specification