Device for moving a selected station of a holding plate to a predetermined location for interaction with a probe

• US 20030054543A1
• Filed: 11/01/2002
• Published: 03/20/2003
• Est. Priority Date: 06/16/1997
• Status: Abandoned Application

• Current Assignee: Diversa Corporation (BASF SE)
• Original Assignee: Diversa Corporation (BASF SE)
• Inventors: Lafferty, William Michael
• Application Number:
  US10/286,194
• Publication Number:
  US 20030054543A1
• Time in Patent Office: Days
• US Class Current: 435/287.1
• CPC Class Codes: G01N 2035/00158 Elements containing microarrays, i.e. "biochip"
• CPC Class Codes: G01N 2035/0494 Detecting or compensating piositioning errors
• CPC Class Codes: G01N 21/253 for batch operation, i.e. multisample apparatus analytical automats G01N35/00
• CPC Class Codes: G01N 35/109 with two horizontal degrees of freedom

Abstract

A device for positioning the tip of an elongated probe at a selected station of a holding plate includes motors to move the holding plate and a supporting stage within a coordinate plane (m_xy). The elongated probe is also moveable along a probe axis that is oriented normal to the coordinate plane (m_xy). A camera creates a pixel image of an optical marker placed on the stage. The image defines a coordinate plane (p_xy). To relate the coordinate plane (p_xy) to the coordinate plane (m_xy), the optical marker is moved to successive locations in the m_xy plane and a pixel image is obtained at each location. Using the pixel images, a computer calculates the relationship between coordinate planes and uses the relationship to signal the motors to move the holding plate in the m_xy plane and position the selected station on the probe axis for interaction with the probe.

Claims

1. A device for manipulating samples at respective stations of a holding plate, said stations having a station entrance on a first planar surface of said holding plate, said device comprising:

a base;

a probe mounted on said base, said probe having a probe tip for reciprocative movement along a z-axis to interact with said station entrances on said first planar surface of said holding plate;

a stage mounted on said base for supporting said holding plate;

a motor for moving said stage in a first coordinate plane (m_xy) orthogonal to said z-axis;

a detection means for locating said z-axis and said station entrances on said first planar surface of said holding plate in a second coordinate plane (p_xy); and

a computer means for corresponding said first coordinate plane with said second coordinate plane, said computer means being coupled with said motor to align said stage with said probe for movement of said probe to a selected station entrance of said holding plate for manipulating a sample at said selected station.

2. A device as recited in claim 1 wherein said detection means comprises a camera for creating a pixel image and wherein said camera is positioned to receive light that is directed away from said holding plate from said first surface of said holding plate.

3. A device as recited in claim 2 wherein said detection means comprises a mirror mounted on said stage for focusing said camera on said probe tip to locate said z-axis in said second coordinate plane (p_xy).

4. A device as recited in claim 3 further comprising an illumination system for causing a portion of said samples to fluoresce for detection and viewing thereof by said camera.

5. A device as recited in claim 4 further comprising an optical filter to prevent backscattered light from said illumination system from reaching said camera.

6. A device as recited in claim 5 wherein said probe is formed with a bend of approximately ninety degrees (90°

).

7. A device as recited in claim 1 wherein said computer means corresponds said first coordinate plane with said second coordinate plane using least squares techniques.

8. A device as recited in claim 1 wherein said holding plate has more than one thousand said stations.

9. A device for manipulating samples at respective stations of a holding plate, said device comprising:

a motorized means for moving said holding plate in a first coordinate plane (m_xy);

a probe having a probe tip;

means for reciprocating said probe tip along a z-axis orthogonal to said first coordinate plane (m_xy) to interact with a first surface of said holding plate;

a detection means for imaging said first surface of said holding plate and said z-axis in a second coordinate plane (p_xy); and

a computer means for corresponding said first coordinate plane with said second coordinate plane to control the movement of said holding plate by said motorized moving means to position a selected said sample along said z-axis for manipulation of said selected sample by said probe.

10. A device as recited in claim 9 wherein said detection means comprises a camera for creating a pixel image.

11. A device as recited in claim 10 wherein said detection means further comprises a mirror mounted on said stage for focusing said camera on said probe tip to locate said z-axis in said second coordinate plane (p_xy).

12. A device as recited in claim 11 further comprising an illumination system for causing a portion of said samples to fluoresce for detection and viewing thereof by said camera.

13. A device as recited in claim 12 further comprising an optical filter to prevent backscattered light from said illumination system from reaching said camera.

14. A device as recited in claim 9 wherein said computer means corresponds said first coordinate plane with said second coordinate plane using least squares techniques.

15. A method for manipulating a sample at a selected station of a holding plate, said method comprising the steps of:

providing a probe having a probe tip;

positioning said holding plate for movement in a first coordinate plane (m_xy);

imaging a first surface of said holding plate in a second coordinate plane (p_xy);

establishing a relationship between said first coordinate plane (m_xy) and said second coordinate plane (p_xy);

using said relationship to move said holding plate in said first coordinate plane (m_xy) to position said selected sample at a predetermined location in said first coordinate plane;

reciprocating said probe tip along an axis orthogonal to said first coordinate plane (m_xy) to interact with said selected sample from said first surface of said holding plate; and

manipulating said sample using said probe.

16. A method as recited in claim 15 further comprising the step of creating an image having an image of said probe tip to determine the location of said probe tip.

17. A method as recited in claim 16 wherein said holding plate is attached to a moveable stage and said step of creating an image having an image of said probe tip includes the step of moving said stage to position a mirror to create an optical path between said probe tip and a camera.

18. A method as recited in claim 15 wherein said step of establishing a relationship between said first coordinate plane (m_xy) and said second coordinate plane (p_xy) comprises the following steps:

attaching an optical marker to said holding plate;

imaging said holding plate with said optical marker at a first location in said first coordinate plane (m_xy) to obtain a first image location for said optical marker;

moving said holding plate and said optical marker to a second location in said first coordinate plane (m_xy);

measuring the distances along a set of orthogonal axes between said first location and said second location in said first coordinate plane (m_xy);

imaging said holding plate with said optical marker at said second location in said first coordinate plane (m_xy) to obtain a second image location for said optical marker;

calculating the distances along a set of orthogonal axes between said first image location and said second image location in said second coordinate plane (p_xy); and

comparing said measured distances to said calculated distances to determine the relationship between said first coordinate plane (m_xy) and said second coordinate plane (p_xy).

19. A method as recited in claim 15 wherein said step of manipulating said sample using said probe comprises adding a material to said sample.

20. A method as recited in claim 15 wherein said step of manipulating said sample using said probe comprises withdrawing material from said sample.