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Method and apparatus for controlling a temperature-controlled probe

  • US 20030060818A1
  • Filed: 06/28/2002
  • Published: 03/27/2003
  • Est. Priority Date: 04/21/1999
  • Status: Active Grant
First Claim
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1. A method of dynamically controlling power output of a probe that has a probe thermal element and -a probe temperature sensor and is coupled to a system that includes a controller to maintain a target probe temperature without substantial thermal overshoot, the method including the following steps:

  • (a) providing in a memory at least one set of settings for said probe including at least one gain parameter and corresponding predetermined operating characteristics for said probe;

    (b) receiving as a threshold input said target probe temperature;

    (c) receiving a first probe setting corresponding to a desired set of operating characteristics for said probe;

    (d) dynamically selecting from said at least one set of probe settings a set of settings in response to said first probe setting;

    (e) generating an error signal e(t) from a comparison of temperature sensed by said sensor and said target probe temperature;

    (f) providing said controller with a closed-loop discontinuous control function definable in part by;

    Pout=k4,where Pout is an output power control signal, and k4 is a constant, when probe temperature is less than a desired target probe temperature; and

    definable in part by;

    Po=Kp·

    P+Ki·

    I+Kd·

    D


    when probe temperature is within a threshold range of said desired target probe temperature;

    where Pout is an output power control signal, Kp is a proportional gain factor associated with said control function, Ki is an integral gain factor associated with said control function, Kd is a derivative gain factor associated with said control function, and P, I, and D are proportion, integration, and derivation functions associated with said control function; and

    (g) using magnitude of said error signal e(t) to dynamically control at least one said factor of said control function to determine said Pout; and

    (h) controlling power output to said thermal element responsive to said Pout to maintain said target probe temperature.

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