Remote control electron microscope

• US 20030062476A1
• Filed: 09/28/2001
• Published: 04/03/2003
• Est. Priority Date: 09/28/2001
• Status: Abandoned Application

• Current Assignee: JSE Pacific Corporation
• Original Assignee: JSE Pacific Corporation
• Inventors: Wang, Jang Yi
• Application Number:
  US09/968,213
• Publication Number:
  US 20030062476A1
• Time in Patent Office: Days
• US Class Current: 250/306
• CPC Class Codes: A61B 5/0013 Medical image data A61B1/00011, A61B6/56, A61B8/56 take precedence
• CPC Class Codes: A61B 5/0059 using light, e.g. diagnosis by transillumination, diascopy, fluorescence A61B5/0093, A61B5/1455, A61B5/02416 and A61B5/0261 take precedence
• CPC Class Codes: A61B 5/441 Skin evaluation, e.g. for skin disorder diagnosis

Abstract

A remote control electron microscope includes an image taking device for taking image signals and for converting the image signals to radio frequency signals, and an image treating device having a receiver for receiving the radio frequency signal from the image taking device and having a device for demodulating the radio frequency signals to demodulated image signals and for displaying the demodulated image signals in a displayer. The image taking device may be freely moved to any position for appropriately take the required images and for taking the images from the best angles.

Claims

1. A remote control electron microscope comprising:

an image taking device including an image taking member for taking an image signal, and including means for converting the image signal to a radio frequency signal,

an image treating device including a receiver device for receiving the radio frequency signal from said image taking device, and including means for demodulating the radio frequency signal to a demodulated image signal, and

means for displaying the demodulated image signal.

2. The remote control electron microscope according to claim 1, wherein said converting means includes an oscillator coupled to said image taking member for receiving and converting the image signal to the radio frequency signal.

3. The remote control electron microscope according to claim 2 further comprising a low pass filter coupled to said oscillator for filtering unwanted signals and for preventing the unwanted signals from being transmitted to said oscillator.

4. The remote control electron microscope according to claim 3 further comprising a frequency control device coupled to said low pass filter for controlling said low pass filter.

5. The remote control electron microscope according to claim 2, wherein said image taking device includes an antenna, and includes a buffer device, a driving device and a power amplifier coupled between said antenna and said oscillator for treating and sending the radio frequency signal to said antenna.

6. The remote control electron microscope according to claim 1 further comprising an amplifier and a mixer and an oscillator coupled to said receiver device for treating the radio frequency signal.

7. The remote control electron microscope according to claim 6 further comprising a frequency adjusting device coupled to said oscillator for adjusting the radio frequency signal.

8. The remote control electron microscope according to claim 6, wherein said demodulating means includes a frequency demodulation circuit for demodulating the radio frequency signal to a demodulated image signal.

9. The remote control electron microscope according to claim 8 further comprising a medium frequency treating device coupled to said frequency demodulation circuit for frequency compensating purposes.

10. The remote control electron microscope according to claim 8, wherein said image treating device includes an image treating member coupled to said frequency demodulation circuit for treating and maintaining the demodulated image signal.

11. The remote control electron microscope according to claim 10, wherein said image treating member includes at least one amplifier coupled to said frequency demodulation circuit for amplifying the demodulated image signal.

12. The remote control electron microscope according to claim 11 further comprising a limiter device coupled to said at least one amplifier for modifying the demodulated image signal.