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Testing arrangement and testing method

  • US 20030067314A1
  • Filed: 10/18/2002
  • Published: 04/10/2003
  • Est. Priority Date: 02/11/2000
  • Status: Abandoned Application
First Claim
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1. A testing arrangement which comprises a connection (2) to be tested comprising one or more analogue components (11, 12), characterized in that for testing one or more analogue components of the connection (2) the testing arrangement comprises a Boundary Scan-type digital component (21) which comprises one or more contact elements (31 to 33), and through one or more contact elements the Boundary Scan digital component (21) is connected to the connection (2) being tested so that by means of an internal digital Boundary Scan control line (41) of the Boundary Scan digital component (21) and controlled by a controller (51) in the testing arrangement, a voltage-level control according to a digital logic value can be provided to the connection (2) being tested comprising one or more analogue components in at least one location, a measuring instrument (60) which measures the connection (2) being tested comprising one or more analogue components and the Boundary Scan-type digital component connected to the connection for the purpose of measuring the impact of the voltage-level control directed to the connection being tested, and a means (70) for analysing the measurement information of the measuring instrument (60), which determines a testing result concerning one or more analogue components of the connection on the basis of the measurement information of the measuring instrument (60).

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