Apparatus and process for the control of electromagnetic fields on the surface of EMI filter capacitors

• US 20030081370A1
• Filed: 10/15/2001
• Published: 05/01/2003
• Est. Priority Date: 10/15/2001
• Status: Abandoned Application

• Current Assignee: Greatbatch-Sierra, Inc.
• Original Assignee: Greatbatch-Sierra, Inc.
• Inventors: Haskell, Donald K., Stevenson, Robert A.
• Application Number:
  US09/981,150
• Publication Number:
  US 20030081370A1
• Time in Patent Office: Days
• US Class Current: 361/306.1
• CPC Class Codes: H01G 4/35 Feed-through capacitors or anti-noise capacitors

Abstract

In a feedthrough terminal assembly, a guard electrode plate is disposed within the ceramic casing and adjacent to a surface of an electromagnetic interference (EMI) filter capacitor for reducing electromagnetic field stress on that surface. In a related process, the ground electrode plate is optimized utilizing computer generated electrostatic field modeling. The guard electrode plate may be grounded, either to external capacitor surface metallization or internal capacitor surface metallization. Alternatively, the guard electrode plate may float within the casing in a manner where it is electrically isolated from both the active and ground sets of electrode plates of the EMI filter capacitor. A second guard electrode plate may also be disposed within the casing adjacent to an opposite axial surface of the capacitor casing for reducing electromagnetic field stress on that adjacent surface of the casing.

Claims

1. A capacitor assembly, comprising:

a casing of dielectric material;

active and ground sets of electrode plates disposed within the casing to form an electromagnetic interference (EMI) filter capacitor; and

a guard electrode plate disposed within the casing adjacent to a first surface thereof, for reducing electromagnetic field stress on the first surface of the casing.

2. The capacitor assembly of claim 1, including a second guard electrode plate disposed within the casing adjacent to a second surface thereof, for reducing electromagnetic field stress on the second surface of the casing.

3. The capacitor assembly of claim 1, wherein the guard electrode plate is grounded.

4. The capacitor assembly of claim 3, wherein the guard electrode plate is grounded to external capacitor surface metallization.

5. The capacitor assembly of claim 3, wherein the guard electrode plate is grounded to internal capacitor surface metallization.

6. The capacitor assembly of claim 5, wherein the internal capacitor surface metallization is conductively coupled to a grounded pin.

7. The capacitor assembly of claim 1, wherein the guard electrode plate is electrically isolated from both the active and ground sets of electrode plates.

8. The capacitor assembly of claim 7, wherein the guard electrode plate is disposed between an active electrode plate and the first surface of the casing.

9. The capacitor assembly of claim 1, wherein the guard electrode plate is optimized utilizing computer generated electrostatic field modeling.

10. The capacitor assembly of claim 9, wherein the electrostatic field modeling is JASON code electrostatic field modeling.

11. The capacitor assembly of claim 1, including an isolated ground set of electrode plates disposed co-planarly within the casing with the active set of electrode plates and electrically isolated from the active set of electrode plates, wherein the ground set of electrode plates cooperates with the isolated set of electrode plates to define a coupling capacitor for coupling the EMI filter capacitor to a common ground point.

12. A capacitor assembly, comprising:

a casing having first and second electrode plates incased therein in spaced relation to form an electromagnetic interference (EMI) filter capacitor, and at least one terminal pin bore formed axially therethrough;

at least one conductive terminal pin extending through said at least one terminal pin bore in conductive relation with said first electrode plate;

a conductive ferrule having at least one aperture formed axially therethrough, said casing being mounted to said ferrule to extend across and close said at least one ferrule aperture with said second electrode plate in conductive relation with said ferrule;

at least one hermetic seal formed from a dielectric material and extending across and sealing said at least one ferrule aperture at one axial side of said capacitor body, said at least one hermetic seal defining an inboard face presented toward said capacitor body and an outboard face presented away from said capacitor body, said at least one terminal pin extending through said at least one hermetic seal; and

a guard electrode plate disposed within said casing adjacent to a first surface thereof facing the conductive ferrule, for reducing electromagnetic field stress on the first surface of said casing.

13. The capacitor assembly of claim 12, wherein said at least one hermetic seal and said capacitor body cooperatively define an axial gap formed therebetween.

14. The capacitor assembly of claim 12, wherein said first and second electrode plates respectively comprise first and second sets of electrode plates encased in interleaved spaced relation within said capacitor body.

15. The capacitor assembly of claim 12, wherein said capacitor body is formed from a substantially monolithic dielectric material.

16. The capacitor assembly of claim 12, wherein said at least one terminal pin bore comprises a plurality of axially extending terminal pin bores in said capacitor body, and further wherein said at least one conductive terminal pin comprises a corresponding plurality of terminal pins extending respectively through said terminal pin bores and said at least one hermetic seal.

17. The capacitor assembly of claim 16, wherein said at least one hermetic seal comprises a plurality of hermetic seals corresponding to a plurality of ferrule apertures.

18. The capacitor assembly of claim 12, wherein said capacitor body has a generally discoidal shape.

19. The capacitor assembly of claim 12, wherein said capacitor body has a generally rectangular shape.

20. The capacitor assembly of claim 12, including a plurality of axially extending terminal pin bores formed in said capacitor body, and at least one conductive ground pin extending into at least one of the plurality of axially extending terminal pin bores in conductive relation with said second electrode plate.

21. The capacitor assembly of claim 12, wherein the guard electrode plate is grounded.

22. The capacitor assembly of claim 12, wherein the guard electrode plate is electrically isolated from both the first and second electrode plates.

23. The capacitor assembly of claim 22, wherein the guard electrode plate is disposed between an active electrode plate and the first surface of the casing.

24. The capacitor assembly of claim 12, wherein the guard electrode plate is optimized utilizing electrostatic field modeling.

25. The capacitor assembly of claim 24, wherein the electrostatic field modeling is JASON code electrostatic field modeling.

26. The capacitor assembly of claim 12, including an isolated ground plate disposed co-planarly within the casing with the first electrode plate and electrically isolated from the first electrode plate, wherein the second electrode plate cooperates with the isolated ground electrode plate to define a coupling capacitor for coupling the EMI filter capacitor to a common ground point.

27. A process for reducing electromagnetic field stress on the surface of a capacitor in a feedthrough terminal assembly, comprising the steps of:

forming an electromagnetic interference (EMI) filter capacitor of an active electrode plate and a ground electrode plate disposed within a casing of dielectric material having at least one terminal pin bore formed axially therethrough;

including a guard electrode plate within the casing adjacent to a first surface thereof;

placing a terminal assembly comprising at least one conductive terminal pin and a conductive ferrule adjacent to the first surface of the casing such that the terminal pin extend through the terminal pin bore and is conductively coupled to the active electrode plate, and the ground electrode plate is conductively coupled to the ferrule; and

optimizing the guard electrode plate utilizing electrostatic field modeling of the feedthrough terminal assembly.

28. The process of claim 27, wherein the optimizing step utilizes JASON code electrostatic field modeling.

29. The process of claim 27, wherein the optimizing step includes the step of adjusting axial spacing between the guard electrode plate and an adjacent electrode plate within the casing.

30. The process of claim 27, wherein the optimizing step includes the step of adjusting an inner diameter margin space between the terminal pin and an edge of the guard electrode plate.

31. The process of claim 27, including the step of grounding the guard electrode plate.

32. The process of claim 27, wherein the step of including a guard electrode plate within the casing includes the step of placing the guard electrode plate therein so that it is electrically isolated from the terminal pin and a ground.

33. The process of claim 32, wherein the guard electrode plate is dispose between an active electrode plate and the first surface of the casing.

34. A capacitor assembly, comprising:

a casing of dielectric material;

active and ground sets of electrode plates disposed within the casing to form an electromagnetic interference (EMI) filter capacitor; and

means for marking the casing to indicate a side thereof adjacent to an active electrode plate.

35. The capacitor assembly of claim 34, wherein the marking means comprises a fiducial marker indentation in the dielectric material.

36. The capacitor assembly of claim 34, wherein the marking means comprises a raised bump.

37. The capacitor assembly of claim 34, wherein the marking means comprises a color dot.

38. The capacitor assembly of claim 34, including a guard electrode plate disposed within the casing adjacent to a first surface thereof, for reducing electromagnetic field stress on the first surface of the casing.

39. The capacitor assembly of claim 38, including a second guard electrode plate disposed within the casing adjacent to a second surface thereof, for reducing electromagnetic field stress on the second surface of the casing.

40. The capacitor assembly of claim 38, wherein the guard electrode plate is grounded.

41. The capacitor assembly of claim 38, wherein the guard electrode plate is electrically isolated from both the active and ground sets of electrode plates.

42. The capacitor assembly of claim 41, wherein the guard electrode plate is disposed between an active electrode plate and the first surface of the casing.

43. The capacitor assembly of claim 38, wherein the guard electrode plate is optimized utilizing computer generated electrostatic field modeling.

44. The capacitor assembly of claim 38, including an isolated ground set of electrode plates disposed co-planarly within the casing with the active set of electrode plates and electrically isolated from the active set of electrode plates, wherein the ground set of electrode plates cooperates with the isolated set of electrode plates to define a coupling capacitor for coupling the EMI filter capacitor to a common ground point.