Method and system for detection of an analytical chip plate

• US 20030085362A1
• Filed: 11/02/2001
• Published: 05/08/2003
• Est. Priority Date: 11/02/2001
• Status: Abandoned Application

• Current Assignee: Orchid Biosciences Incorporated (Laboratory Corporation Of America Holdings)
• Original Assignee: Orchid Biosciences Incorporated (Laboratory Corporation Of America Holdings)
• Inventors: Bogdanov, Valery
• Application Number:
  US10/004,335
• Publication Number:
  US 20030085362A1
• Time in Patent Office: Days
• US Class Current: 250/458.1
• CPC Class Codes: G01N 2021/6482 Sample cells, cuvettes
• CPC Class Codes: G01N 21/6452 Individual samples arranged in a regular 2D-array, e.g. multiwell plates
• CPC Class Codes: G01N 21/6456 Spatial resolved fluorescence measurements; Imaging

Abstract

An analysis device for analyzing a plate having a first side and a second side comprises a plate holder for holding the plate and an excitation source positioned on the first side of the plate under the plate holder. The laser source generates an excitation beam through the plate. The excitation beam forms an imaging beam on the second side of the plate. An optical assembly is positioned on the second side of the plate and receives the imaging beam. A detector is disposed adjacent to the optical assembly and receives the imaging beam and forms an image of the plate therein.

Claims

1. An analysis device for analyzing an object having a first side and a second side comprising:

an excitation source positioned on a first side of said object, said excitation source generating an excitation beam through said object;

said excitation beam forming a imaging beam on the second side of said object,

an optical assembly positioned on the second side of the object receiving the imaging beam; and

a detector disposed adjacent to said optical assembly on said second side of said object receiving said imaging beam and forming an image of said object therein.

2. An analysis device for a plate having a first side and a second side comprising:

a plate holder holding the plate;

a excitation source positioned on a first side of said plate under said plate holder, said excitation source generating an excitation beam through said plate;

said excitation beam forming an imaging beam on the second side of said plate,

an optical assembly positioned on the second side of the plate receiving the imaging beam; and

a detector disposed adjacent to said optical assembly on said second side of said plate receiving said imaging beam and forming an image of said plate therein.

3. An analysis device as recited in claim 2 wherein said optical assembly comprises a separation filter disposed on a second side of said plate holder receiving the imaging beam;

an imaging lens positioned adjacent to said long pass filter on said second side of said plate;

said imaging beam directed through said separation filter, said imaging lens and said band pass filter.

4. An analysis device as recited in claim 3 wherein said optical assembly comprises a band pass filter disposed adjacent to said imaging lens on said second side of said plate;

said imaging beam directed through said separation filter, said imaging lens and said band pass filter.

5. An analysis device as recited in claim 3 wherein said long pass filter has a surface parallel to said plate.

6. An analysis device as recited in claim 3 further comprising an opaque mask interposed between said separation filter and said imaging lens.

7. An analysis device as recited in claim 3 wherein said opaque mask has a diameter sized to prevent said excitation beam from reaching said detector.

8. An analysis device as recited in claim 3 wherein said long-pass filter comprises a filter having deep-attenuation in a stop-band and sharp transition from the stop-band to a pass-band.

9. An analysis device as recited in claim 8 wherein said separation filter comprises a Raman filter.

10. An analysis device as recited in claim 4 wherein said laser source has an optical axis positioned orthogonal to said plate, said detector, long pass filter, said imaging lens, and said band pass filter coupled disposed along said axis.

11. An analysis device as recited in claim 2 wherein said detector comprises a charge coupled device having a two-dimensional array of detectors.

12. An analysis device as recited in claim 2 wherein said excitation light source comprises fluorescent light source.

13. An analysis device as recited in claim 2 wherein said excitation light source comprises a laser source.

14. An analysis device as recited in claim 2 wherein said laser source has an optical axis positioned at an angle relative to said plate.

15. An analysis device as recited in claim 2 said detector positioned off said optical axis.

16. An analysis device as recited in claim 2 wherein said plate holder is coupled to an X-Y stage.

17. An analysis device as recited in claim 2 wherein said plate holder comprises a plurality of wells defined by a mask, said mask blocking said excitation light outside said wells.

18. An analysis device as recited in claim 2 wherein said plate has a light absorbing well former thereon having openings therethrough, said excitation source generating an excitation beam through said openings and plate.

19. An analysis device for a plate having a first side an second side comprising:

a plate holder holding the plate;

an excitation light source positioned on a first side of side plate under said plate holder, said laser source generating an excitation beam through said plate;

said excitation beam forming an imaging beam at said plate, said excitation light source has an optical axis positioned orthogonal to said plate;

an optical assembly disposed on said optical axis on the second side;

a detector disposed adjacent to said optical assembly;

said imaging beam directed through said long-pass filter, said imaging lens and said band pass filter.

20. An analysis device as recited in claim 19 wherein said optical assembly comprises a long-pass filter and an imaging lens filter.

21. An analysis device as recited in claim 19 wherein said long-pass filter is disposed on a second side of said plate holder along the optical axis receiving the imaging beam.

22. An analysis device as recited in claim 19 wherein said imaging lens positioned adjacent to said long pass filter holder along the optical axis on said second side of said plate.

23. An analysis device as recited in claim 19 wherein said band pass filter disposed adjacent to said imaging lens holder along the optical axis on said second side of said plate.

24. An analysis device as recited in claim 19 wherein said plate has a light absorbing well former thereon.

26. A method as recited in claim 23 wherein said chip plate comprises a plurality of wells defined by a mask and further comprising blocking said excitation light outside said wells with the mask.

27. A method as recited in claim 23 further comprising the step of filtering said imaging beam.

28. A method as recited in claim 23 wherein said step of filtering comprises long pass filtering said imaging beam.

29. A method as recited in claim 23 wherein said step of filtering comprises band pass filtering said imaging beam.

30. A method as recited in claim 23 wherein directing an imaging beam to said detection source through an imaging lens.

31. A method as recited in claim 23 further comprising reflecting a portion of said excitation beam from the optical assembly to said plate.

25. A method for analyzing a plate comprising:

disposing a plate having an array thereon between an excitation source and a detection source;

directing a imaging beam to said detection source through an optical assembly; and

forming an image of said array at said detection source.