Method for etching tungsten using NF3 and Cl2

• US 20030092280A1
• Filed: 11/09/2001
• Published: 05/15/2003
• Est. Priority Date: 11/09/2001
• Status: Abandoned Application

• Current Assignee: Applied Materials Incorporated
• Original Assignee: Applied Materials Incorporated
• Inventors: Lee, Gene H., Kim, Nam-Hun
• Application Number:
  US10/039,333
• Publication Number:
  US 20030092280A1
• Time in Patent Office: Days
• US Class Current: 438/720
• CPC Class Codes: H01L 21/32136 using plasmas
• CPC Class Codes: H01L 21/76885 By forming conductive members before deposition of protective insulating material, e.g. pillars, studs

Abstract

A method for etch a tungsten-containing layer (525) on a substrate (510) substantially anisotropically with good etching selectivity with respect to a hard mask layer, and without forming excessive passivating deposits on the etched features. In the method, the substrate (510) is placed in a plasma zone, and process gas mix comprising NF₃ and Cl₂is introduced into the plasma zone. A plasma is formed from the process gas mix to anisotropically etch the tungsten containing layer (525) to produce patterned tungsten features (535).

Claims

1. A method of anisotropically etching a layer containing tungsten, the layer being disposed on a substrate and having a patterned hard mask layer disposed thereon, the method comprising:

placing the substrate in a plasma zone;

introducing into the plasma zone a process gas mix comprising NF₃ and Cl₂; and

forming a plasma from the process gas mix to etch the tungsten containing layer substantially anisotropically and at an etch rate greater than the rate at which the hard mask layer is etched.

2. The method of claim 1, wherein tungsten containing layer is etched at an etch rate at least twice the rate at which the hard mask layer is etched.

3. The method of claim 1, wherein tungsten containing layer is etched at an etch rate that is about 2.5 greater than the rate at which the hard mask layer is etched.

4. The method of claim 1, wherein the process gas mix is introduced with a volumetric flow ratio of NF₃ and Cl₂ that is selected to provide etched features having a critical dimension loss of less than 4% and having sidewalls that form angles of at least about 88 degrees with a surface of the substrate.

5. The method of claim 1, wherein the gas mix is introduced with a volumetric flow ratio of NF₃:

Cl₂ is in the range of from about 1;

1 to about 1;

2.5.

6. The method of claim 1, wherein the gas mix is introduced with a volumetric flow ratio of NF₃:

Cl₂ is in the range of from about 1;

1.3 to about 1;

2

7. The method of claim 1, wherein the process gas mix consists essentially of NF₃ and Cl₂.

8. The method of claim 1, wherein the process gas mix further comprises a passivator gas.

9. The method of claim 1, wherein the hard mask layer comprises silicon nitride.

10. A method of etching a tungsten containing layer that is covered with a patterned hard mask layer and disposed on a substrate, using a process chamber that has process electrodes therein and an inductor coil adjacent to the process chamber, the method comprising:

placing the substrate on which the tungsten containing layer is disposed into the process chamber;

introducing into the process chamber, a process gas mix comprising NF₃ and Cl₂; and

ionizing the process gas mix to form plasma ions that energetically impinge on the tungsten containing layer and the hard mask layer by applying RF energy to the inductor coil and applying RF energy the process electrodes,

wherein the tungsten containing layer is substantially anisotropically etched at an etch rate greater than the rate at which the hard mask layer is etched.

11. The method of claim 10, wherein tungsten containing layer is etched at an etch rate at least twice the rate at which the hard mask layer is etched.

12. The method of claim 10, wherein tungsten containing layer is etched at an etch rate that is about 2.5 greater than the rate at which the hard mask layer is etched.

13. The method of claim 10, wherein the process gas mix is introduced with a volumetric flow ratio of NF₃ and Cl₂ that is selected to provide etched features having a critical dimension loss of less than 4% and having sidewalls that form angles of at least about 88 degrees with a surface of the substrate.

14. The method of claim 10, wherein the volumetric flow ratio of NF₃:

Cl₂ is from about 1;

1 to about 1;

2.5.

15. The method of claim 10, wherein the volumetric flow ratio of NF₃:

Cl₂ is from about 1;

1.3 to about 1;

2.

16. The method of claim 10, wherein the volumetric flow ratio of NF₃:

Cl₂ is from about 1;

1 to about 2;

1.

17. The method of claim 10, wherein the volumetric flow ratio of NF₃:

Cl₂ is from about 1.3;

1 to about 2;

1.

18. The method of claim 10, wherein the process gas mix consists essentially of NF₃ and Cl₂.

19. A method of etching a tungsten containing layer that is covered with a patterned hard mask layer and disposed on a substrate, using a process chamber that has process electrodes therein and an inductor coil adjacent to the process chamber, the method comprising:

placing the substrate on which the tungsten containing layer is disposed into the process chamber;

introducing into the process chamber, a main etch process gas mix comprising NF₃ and Cl₂;

ionizing the main etch process gas mix to form plasma ions that energetically impinge on the tungsten containing layer and the hard mask layer by applying RF energy to the inductor coil and applying RF energy the process electrodes, wherein the tungsten containing layer is substantially anisotropically etched at a main etch rate greater than the rate at which the hard mask layer is etched;

introducing into the process chamber, an over etch process gas mix comprising Ar and Cl₂; and

ionizing the over etch process gas mix to form plasma ions that energetically impinge on the tungsten containing layer and the hard mask layer by applying RF energy to the inductor coil and applying RF energy the process electrodes, wherein any remaining portion of the tungsten containing layer that is not masked by the hard mask layer is substantially anisotropically etched away.

20. The method of claim 19, wherein tungsten containing layer is etched at a main etch rate at least twice the rate at which the hard mask layer is etched.

21. The method of claim 19, wherein tungsten containing layer is etched at a main etch rate that is about 2.5 greater than the rate at which the hard mask layer is etched.