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Electrical over stress (EOS) monitor

  • US 20030101016A1
  • Filed: 06/27/2002
  • Published: 05/29/2003
  • Est. Priority Date: 11/27/2001
  • Status: Active Grant
First Claim
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1. An apparatus for testing an integrated circuit, comprising:

  • a spike source configured to be coupled to an input of an integrated circuit and responsively provide a signal spike to the input;

    a current sensor configured to couple to a power supply, the power supply coupled to the integrated circuit to provide power to the integrated circuit, the current sensor providing a sensor output related to the current supplied to the integrated circuit from the power supply; and

    diagnostic circuitry coupled to the sensor output configured to provide a failure output in response to a characteristic increase in power supply current sensed by the current sensor in response to an applied signal spike.

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