Imaging FTIR spectrometer

• US 20030103209A1
• Filed: 11/25/2002
• Published: 06/05/2003
• Est. Priority Date: 12/05/2001
• Status: Abandoned Application

• Current Assignee: Bruker Optik Gmbh (Bruker Corporation)
• Original Assignee: Bruker Optik Gmbh (Bruker Corporation)
• Inventors: Simon, Arno
• Application Number:
  US10/302,908
• Publication Number:
  US 20030103209A1
• Time in Patent Office: Days
• US Class Current: 356/456
• CPC Class Codes: G01J 3/2823 Imaging spectrometer
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes

Abstract

The present invention relates to an imaging FTIR spectrometer comprising a housing with an integrated interferometer, sample and detector. The light of the source first passes through the interferometer, then it is focused on the sample which is imaged on the surface of a detector array. The present invention also provides an FTIR spectrometer with a detector array and ADCs integrated on the detector array chip such that each pixel has an individual dedicated ADC.

Claims

1. An infrared spectrometer comprising:

a housing;

an optical light source;

an interferometer disposed within said housing to divide input light emitted by said light source into two partial beams for generating a variable optical path length difference between said two partial beams and to recombine said two partial beams into one output light beam;

means for positioning and accepting a sample in or on said housing, said output light beam being incident on the sample;

an imaging, two dimensional detector array for accepting and analyzing a detector light beam emanating from the sample;

imaging optics disposed for imaging a sample surface, using said detector light beam emanating from the sample, onto said imaging, two dimensional detector array; and

means communicating with an output of said detector to process sample signals.

2. The infrared spectrometer of claim 1, wherein said light source is one of integrated in said housing and flanged to said housing.

3. The infrared spectrometer of claim 1, wherein said detector is one of integrated in said housing and flanged to said housing.

4. The infrared spectrometer of claim 2, wherein said detector is one of integrated in said housing and flanged to said housing.

5. The infrared spectrometer of claim 1, wherein said sample positioning means is integrated in said housing.

6. The infrared spectrometer of claim 2, wherein said sample positioning means is integrated in said housing.

7. The infrared spectrometer of claim 3, wherein said sample positioning means is integrated in said housing.

8. The infrared spectrometer of claim 1, further comprising a conventional detector, said conventional detector being mutually exchangeable with said imaging, two dimensional detector array.

9. The infrared spectrometer of claim 2, further comprising a conventional detector, said conventional detector being mutually exchangeable with said imaging, two dimensional detector array.

10. The infrared spectrometer of claim 3, further comprising a conventional detector, said conventional detector being mutually exchangeable with said imaging, two dimensional detector array.

11. The infrared spectrometer of claim 5, further comprising a conventional detector, said conventional detector being mutually exchangeable with said imaging, two dimensional detector array.

12. The infrared spectrometer of claim 1, further comprising a conventional, non-imaging detector and means for switching said detector light beam between said non-imaging detector and said imaging detector.

13. The infrared spectrometer of claim 2, further comprising a conventional, non-imaging detector and means for switching said detector light beam between said non-imaging detector and said imaging detector.

14. The infrared spectrometer of claim 3, further comprising a conventional, non-imaging detector and means for switching said detector light beam between said non-imaging detector and said imaging detector.

15. The infrared spectrometer of claim 12, wherein said switching means comprises a hinged mirror.

16. The infrared spectrometer of claim 1, wherein said imaging detector and said processing means enable a signal of each pixel or of a group of pixels to be dedicated to a separate digitizing procedure.

17. The infrared spectrometer of claim 2, wherein said imaging detector and said processing means enable a signal of each pixel or of a group of pixels to be dedicated to a separate digitizing procedure.

18. The infrared spectrometer of claim 3, wherein said imaging detector and said processing means enable a signal of each pixel or of a group of pixels to be dedicated to a separate digitizing procedure.

19. The infrared spectrometer of claim 5, wherein said imaging detector and said processing means enable a signal of each pixel or of a group of pixels to be dedicated to a separate digitizing procedure.

20. The infrared spectrometer of claim 16, wherein said signal processing means is integrated into said imaging detector such that each pixel is dedicated to an individual ADC on an array chip.