Method of detecting protrusion of inspection object from palette and method of fabricating semiconductor device
First Claim
1. A method of detecting protrusion of an inspection object from a palette, comprising steps of:
- introducing an inspected object into each of a plurality of pockets provided on the surface of a palette and transporting said palette;
measuring a reflection level of said inspection object stored in each of said plurality of pockets every said palette with a reflection type photoelectric sensor;
obtaining the maximum value and the minimum value of said reflection level from data of every said palette for calculating a dispersion width defined by the difference between the maximum value and the minimum value; and
comparing said dispersion width with a previously set determination threshold for determining whether or not said dispersion width is greater than said determination threshold.
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Accused Products
Abstract
In order to provide a method of detecting protrusion of an inspection object from a palette improved to be capable of making highly precise detection and reducing a socket breakage ratio, an inspection object is introduced into each of a plurality of pockets provided on the surface of a palette, which in turn is transported. A reflection level of the inspection object stored in each of the plurality of pockets is measured every palette with a reflection type photoelectric sensor. The maximum value and the minimum value of the reflection level are obtained from data of every palette, for calculating a dispersion width defined by the difference between the maximum value and the minimum value. The dispersion width is compared with a previously set determination threshold, for determining whether or not the dispersion width is greater than the determination threshold.
10 Citations
7 Claims
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1. A method of detecting protrusion of an inspection object from a palette, comprising steps of:
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introducing an inspected object into each of a plurality of pockets provided on the surface of a palette and transporting said palette;
measuring a reflection level of said inspection object stored in each of said plurality of pockets every said palette with a reflection type photoelectric sensor;
obtaining the maximum value and the minimum value of said reflection level from data of every said palette for calculating a dispersion width defined by the difference between the maximum value and the minimum value; and
comparing said dispersion width with a previously set determination threshold for determining whether or not said dispersion width is greater than said determination threshold. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method of fabricating a semiconductor device comprising steps of:
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introducing an IC into each of a plurality of pockets provided on the surface of a palette and transporting said palette;
measuring a reflection level of said IC stored in each of said plurality of pockets every said palette with a reflection type photoelectric sensor;
obtaining the maximum value and the minimum value of said reflection level from data of every said palette for calculating a dispersion width defined by the difference between the maximum value and the minimum value; and
comparing said dispersion width with a previously set determination threshold for determining whether or not said dispersion width is greater than said determination threshold.
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Specification