Low loss links between wafer probes and load pull tuner
First Claim
1. Means for establishing low loss microwave links between the test port of microwave load pull tuners and microwave wafer probes by extending the tuner'"'"'s transmission airline up to the probe connector, said extension being either part of the said tuner airline itself or a separate unit inserted between the tuner test port and the coaxial or waveguide connector of the wafer probe, said microwave tuners being used either for power load pull testing or for noise measurement testing.
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Abstract
A method for establishing a low loss microwave link between load-pull tuners and microwave wafer probes is presented. This link consists of an extension of the coaxial airline of the tuner, an extension of the tuner slab line or a co-planar waveguide tuner extension that connects directly to wafer probes, a separate airline section or a separate prematching module.
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Citations
12 Claims
- 1. Means for establishing low loss microwave links between the test port of microwave load pull tuners and microwave wafer probes by extending the tuner'"'"'s transmission airline up to the probe connector, said extension being either part of the said tuner airline itself or a separate unit inserted between the tuner test port and the coaxial or waveguide connector of the wafer probe, said microwave tuners being used either for power load pull testing or for noise measurement testing.
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11. A method for replacing the components of the CPWG extension attached to the tuner for maintenance and repair purposes.
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12. A method of aligning the characteristic impedance of the CPWG airline extension by changing the geometrical configuration at the level of the probe tips.
Specification