Method for analysing a diffusing sample by time resolution measurement
First Claim
1. A method of analyzing a scattering sample by time resolved measurement of the light scattered within this sample, characterized in that it comprises the steps of:
- a) illuminating the sample with a temporally coherent and wavelength-modulated incident light beam;
b) producing a succession of interference signals, recorded over a time interval, by superposition of the scattered light obtained at the output of the sample and of light taken from the incident beam illuminating the sample;
c) combining each interference signal with a reference signal (Ref(t,τ
0)) generating a time gate centered on a predetermined delay (τ
0) in order to produce a signal characteristic of the predetermined delay (τ
0);
d) extracting the d.c. component of each signal characteristic of the predetermined delay (τ
0);
e) applying a nonlinear function to each of the d.c. components of the signals characteristic of the predetermined delay (τ
0); and
f) carrying out a linear combination of each of the nonlinear function images of the d.c. components of the signals characteristic of the predetermined delay (τ
0).
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Accused Products
Abstract
The invention concerns a method for analysing a diffusing sample comprising steps which consist in: a) illuminating the sample with a temporally coherent and wavelength-modulated incident light beam; b) producing a succession of interference signals with the diffuse light; c) combining each interference signal with a reference signal (Ref(t,τ0)) generating a time port; d) extracting the continuous component of each signal characteristic of the predetermined delay (τ0)) derived form c); applying a non-linear function on each of the continuous components of the signals characterising the predetermined delay (τ0); and f) averaging each of the images, with said non-linear function, of the continuous components of the signals characterising the predetermined delay (τ0). The invention is useful for observing organs of the human body.
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Citations
13 Claims
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1. A method of analyzing a scattering sample by time resolved measurement of the light scattered within this sample, characterized in that it comprises the steps of:
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a) illuminating the sample with a temporally coherent and wavelength-modulated incident light beam;
b) producing a succession of interference signals, recorded over a time interval, by superposition of the scattered light obtained at the output of the sample and of light taken from the incident beam illuminating the sample;
c) combining each interference signal with a reference signal (Ref(t,τ
0)) generating a time gate centered on a predetermined delay (τ
0) in order to produce a signal characteristic of the predetermined delay (τ
0);
d) extracting the d.c. component of each signal characteristic of the predetermined delay (τ
0);
e) applying a nonlinear function to each of the d.c. components of the signals characteristic of the predetermined delay (τ
0); and
f) carrying out a linear combination of each of the nonlinear function images of the d.c. components of the signals characteristic of the predetermined delay (τ
0). - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An apparatus for analyzing a scattering sample by time resolved measurement of the light scattered within this sample, characterized in that it comprises:
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a) means (16, 18;
100, 104, 102, 106) for illuminating the sample with a temporally coherent and wavelength-modulated incident light beam;
b) an interferometer (11;
109) for producing a succession of interference signals, recorded over a time interval, by superposition of the scattered light obtained at the output of the sample and of light taken from the incident beam illuminating the sample;
c) means (52, 54) for combining each interference signal with a reference signal (Ref(t,τ
0)) generating a time gate centered on a predetermined delay (τ
0) in order to produce a signal characteristic of the predetermined delay (τ
0);
d) means (56) for extracting the d.c. component of each signal characteristic of the predetermined delay (τ
0) ;
e) means (58) for applying a nonlinear function to each of the d.c. components of the signals characteristic of the predetermined delay (τ
0); and
f) means (60) for carrying out a linear combination of each of the nonlinear function images of the d.c. components of the signals characteristic of the predetermined delay (τ
0). - View Dependent Claims (10, 11, 12, 13)
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Specification