Stage apparatus, scanning type exposure apparatus, and device produced with the same
First Claim
1. A scanning type exposure apparatus for transferring a pattern on a mask to a substrate via a projection optical system by synchronously moving the mask and the substrate, the scanning type exposure apparatus comprising:
- a mask stage arranged on a side of an object plane of the projection optical system;
a substrate stage arranged on a side of an image plane of the projection optical system;
a plurality of corner cubes provided on the mask stage and arranged in a second direction perpendicular to a first direction in which the mask is synchronously moved; and
a first interferometer which radiates a measuring beam to the mask stage in the first direction, and receives the measuring beam reflected by one of the plurality of corner cubes selected depending on a position of the mask stage in the second direction.
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Accused Products
Abstract
An exposure apparatus has a triangular shaped stage which is movable in a two-dimensional plane while holding a substrate. The stage has a reflecting surface provided on a side face of the stage so that the surface extends in a specific direction intersecting Y axis and X axis. An interferometer radiates a beam onto the reflecting surface to measure a position of the stage in a direction perpendicular to the specific direction. Using the measured position and an angle of the specific direction, a calculator can calculate the position of the stage on rectangular coordinate system defined by X and Y axes. The size and weight of the stage can be reduced, and the throughput of the exposure apparatus is improved.
101 Citations
191 Claims
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1. A scanning type exposure apparatus for transferring a pattern on a mask to a substrate via a projection optical system by synchronously moving the mask and the substrate, the scanning type exposure apparatus comprising:
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a mask stage arranged on a side of an object plane of the projection optical system;
a substrate stage arranged on a side of an image plane of the projection optical system;
a plurality of corner cubes provided on the mask stage and arranged in a second direction perpendicular to a first direction in which the mask is synchronously moved; and
a first interferometer which radiates a measuring beam to the mask stage in the first direction, and receives the measuring beam reflected by one of the plurality of corner cubes selected depending on a position of the mask stage in the second direction. - View Dependent Claims (2, 3, 4, 5)
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6. A scanning type exposure apparatus for transferring a pattern formed on a mask to a substrate via a projection optical system, while relatively moving the mask and the substrate in a predetermined first direction in synchronization with each other, the scanning type exposure apparatus comprising:
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a mask stage which is two-dimensionally movable while holding the mask;
a substrate stage which is movable in the first direction while holding the substrate;
a first reflecting surface provided on the mask stage and extending in the first direction;
a plurality of corner cubes provided on the mask stage and arranged at predetermined spacing distances in a second direction perpendicular to the first direction;
a first interferometer which measures a position of the mask stage in the first direction by radiating a measuring beam in the first direction onto one of the plurality of corner cubes depending on a position of the mask stage in the second direction, and receiving a reflected light beam therefrom; and
a second interferometer which measures a position of the mask stage in the second direction by radiating a measuring beam in the second direction onto the first reflecting surface, and receiving a reflected light beam therefrom. - View Dependent Claims (7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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23. A scanning exposure method for transferring a pattern formed on a mask to a substrate, while relatively moving a mask stage which holds the mask and a substrate stage which holds the substrate in a predetermined first direction in synchronization with each other, the method comprising:
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a first scanning exposure step of transferring a pattern in a first area on the mask to a predetermined area on the substrate, while radiating a measuring beam onto a first reflecting surface provided on the mask stage to extend in the first direction and receiving a reflected light beam therefrom to manage a position of the mask stage in a second direction, and radiating a measuring beam onto a first corner cube provided on the mask stage and receiving a reflected light beam therefrom to manage a position of the mask stage in the first direction; and
a second scanning exposure step of transferring a pattern in a second area adjoining the first area in the second direction on the mask to the predetermined area on the substrate, while radiating the measuring beam onto the first reflecting surface and receiving a reflected light beam therefrom to manage the position of the mask stage in the second direction, and radiating the measuring beam onto a second corner cube different from the first corner cube provided on the mask stage and receiving a reflected light beam therefrom to manage the position of the mask stage in the first direction. - View Dependent Claims (24, 25, 155)
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26. A method for producing a scanning type exposure apparatus which transfers a pattern on a mask to a substrate via a projection optical system by synchronously moving the mask and the substrate, the method comprising:
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providing the projection optical system;
providing a mask stage arranged on a side of an object plane of the projection optical system;
providing a substrate stage arranged on a side of an image plane of the projection optical system;
providing a plurality of corner cubes on the mask stage to be arranged in a second direction perpendicular to a first direction in which the mask is synchronously moved; and
providing a first interferometer which radiates a measuring beam to the mask stage in the first direction, and receives the measuring beam reflected by one of the plurality of corner cubes selected depending on a position of the mask stage in the second direction. - View Dependent Claims (27)
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28. A method for producing a scanning type exposure apparatus which transfers a pattern formed on a mask to a substrate via a projection optical system, while relatively moving the mask and the substrate in a first direction in synchronization with each other, the method comprising:
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providing the projection optical system;
providing a mask stage which is two-dimensionally movable while holding the mask;
providing a substrate stage which is movable in the first direction while holding the substrate;
providing a first reflecting surface on the mask stage to extend in the first direction;
providing a plurality of corner cubes on the mask stage to be arranged at predetermined spacing distances in a second direction perpendicular to the first direction;
providing a first interferometer which measures a position of the mask stage in the first direction by radiating a measuring beam in the first direction onto one of the plurality of corner cubes depending on a position of the mask stage in the second direction, and receiving a reflected light beam therefrom; and
providing a second interferometer which measures a position of the mask stage in the second direction by radiating a measuring beam in the second direction onto the first reflecting surface, and receiving a reflected light beam therefrom. - View Dependent Claims (29, 30)
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31. A scanning exposure method for transferring a pattern on a mask onto a substrate by reciprocatively moving the mask in a first direction to irradiate, with an illumination light beam, first and second areas respectively arranged in a second direction perpendicular to the first direction on the mask, and moving the substrate in synchronization with the movement of the mask, the method comprising:
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driving a mask stage in the first direction on the basis of an output of an interferometer which radiates a measuring beam to a first mirror provided on the mask stage which holds the mask in order to irradiate the first area on the mask with the illumination light beam; and
driving the mask stage in the first direction while radiating the measuring beam of the interferometer onto a second mirror which is different from the first mirror provided on the mask stage in order to irradiate the second area on the mask with the illumination light beam. - View Dependent Claims (32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 156)
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46. A scanning exposure method for transferring a pattern on a mask onto a substrate by reciprocatively moving the mask in a first direction to irradiate, with an illumination light beam, first and second areas respectively arranged in a second direction perpendicular to the first direction on the mask, and moving the substrate in synchronization with the movement of the mask, wherein:
the mask is moved without any stop between illumination of the illumination light beam onto the first area on the mask and illumination of the illumination light beam onto the second area on the mask. - View Dependent Claims (157)
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47. A scanning exposure method for transferring a circuit pattern onto a substrate, comprising:
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a first step of moving a mask having first and second divided patterns of the circuit pattern in a first direction to irradiate the first divided pattern with an illumination light beam, and moving the substrate in synchronization with the movement of the mask to transfer the first divided pattern to a comparted area on the substrate; and
a second step of moving the mask in the first direction, i.e., in the direction opposite to that used in the first step to irradiate the second divided pattern with the illumination light beam, and moving the substrate in synchronization with the movement of the mask to transfer the second divided pattern to the comparted area. - View Dependent Claims (48, 158)
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49. A stage apparatus comprising:
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a first movable member which is movable in a two-dimensional plane while holding a substrate;
a first reflecting surface which is provided on the first movable member to extend in a direction intersecting a predetermined first axis and a second axis perpendicular thereto in the two-dimensional plane;
a first interferometer which measures a position of the first movable member in a third axis direction by perpendicularly radiating a measuring beam onto the first reflecting surface and receiving a reflected light beam therefrom; and
a calculating unit which calculates a position coordinate on a rectangular coordinate system defined by the first axis and the second axis of the first movable member, on the basis of a measured value obtained by the first interferometer. - View Dependent Claims (50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70, 71, 104, 186, 187, 188, 189)
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72. A scanning type exposure apparatus for exposing a substrate by transferring a pattern formed on a mask onto the substrate, the apparatus comprising:
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a stage apparatus including a substrate stage which is movable in a two-dimensional plane while holding the substrate, a first reflecting surface which is provided on the substrate stage to extend in a direction intersecting a predetermined first axis and a second axis perpendicular thereto in the two-dimensional plane, a first interferometer which measures a position of the substrate stage in a third axis direction by perpendicularly radiating a measuring beam onto the first reflecting surface and receiving a reflected light beam therefrom, and a calculating unit which calculates a position coordinate on a rectangular coordinate system defined by the first axis and the second axis of the substrate stage, on the basis of a measured value obtained by the first interferometer;
a mask stage which holds the mask; and
a stage control system which relatively moves the mask stage and the substrate stage in synchronization with each other in a direction of the first axis, wherein;
the pattern formed on the mask is transferred to the substrate on the substrate stage during the relative movement of the mask stage and the substrate stage effected by the stage control system. - View Dependent Claims (73, 74, 75, 76, 77, 78, 79, 80, 81, 82, 83, 84, 85, 86, 87, 88)
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89. A scanning type exposure apparatus for exposing a photosensitive substrate with a pattern by synchronously moving a mask formed with the pattern and the photosensitive substrate across an area onto which an energy beam is radiated, the apparatus comprising:
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a mask stage which is movable while placing the mask thereon;
a substrate stage which is movable while placing the photosensitive substrate thereon, the substrate stage having, on a side wall, at least first, second, and third reflecting surfaces, and the first, second and third reflecting surfaces or extension lines thereof forming a triangle; and
an interferometer system which radiates measuring beams to the first, second, and third reflecting surfaces respectively. - View Dependent Claims (90, 91, 92, 93, 94)
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95. A stage apparatus comprising:
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a base board;
a first movable member which is movable relative to the base board and holds a substrate;
a second movable member which arranges the first movable member thereon, the second movable member being arranged on the base board and being movable relative to the base board and the first movable member respectively; and
a driving unit which moves the first movable member in a two-dimensional plane, wherein;
the second movable member is moved in accordance with a reaction force generated by the movement of the first movable member. - View Dependent Claims (96, 97, 98, 99, 100, 101, 102, 103, 105, 106, 107)
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108. A scanning type exposure apparatus comprising:
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a stage apparatus including a base board;
a first movable member which is movable relative to the base board and holds a substrate;
a second movable member which arranges the first movable member thereon, the second movable member being arranged on the base board and being movable relative to the base board and the first movable member respectively; and
a driving unit which moves the first movable member in a two-dimensional plane;
wherein the second movable member is moved in accordance with a reaction force generated by the movement of the first movable member;
a mask stage which holds a mask;
a projection optical system having an optical axis perpendicular to the mask and the substrate respectively;
a first pedestal which supports the projection optical system and suspends the base board thereby; and
a vibration-preventive apparatus which supports the first pedestal, wherein;
a pattern on the mask is transferred onto the substrate via the projection optical system by synchronously moving the mask and the substrate by the aid of the mask stage and the stage apparatus. - View Dependent Claims (109, 110, 111, 112, 113, 114, 115, 116)
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117. An exposure apparatus for transferring a pattern on a mask onto a substrate, comprising:
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a base board;
at least two first movable members each of which is movable relative to the base board and holds the substrate respectively;
a second movable member which places the respective first movable members thereon, the second movable member being arranged on the base board and being movable relative to the base board and each of the first movable members respectively; and
a driving unit which drives the respective first movable members in a two-dimensional plane, wherein;
the second movable member is moved in accordance with a reaction force brought about when the respective first movable members are driven; and
the substrate, to which the pattern on the mask is transferred, is held by each of the first movable members. - View Dependent Claims (118, 119)
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120. A scanning type exposure apparatus for transferring a pattern on a mask onto a substrate by synchronously moving the mask and the substrate, the apparatus comprising:
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a substrate stage which places the substrate thereon, the substrate stage having a first reflecting surface extending in a direction intersecting a first direction in which the substrate is synchronously moved and a second direction perpendicular thereto respectively, and a second reflecting surface extending in the second direction; and
first and second interferometers which radiate measuring beams onto the first and second reflecting surfaces respectively. - View Dependent Claims (121, 122, 123, 124, 125, 126)
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127. An exposure method for transferring a pattern on a mask onto a photosensitive substrate by synchronously moving the mask and the photosensitive substrate, wherein:
exposure operation is performed while controlling a position of the photosensitive substrate in at least the non-scanning direction which is perpendicular to a synchronous movement direction for the photosensitive substrate, of the non-scanning direction and the synchronous movement direction for the photosensitive substrate, with a first measuring beam in a direction different from a non-scanning direction. - View Dependent Claims (128, 166)
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129. An exposure method for transferring a pattern on a mask onto a photosensitive substrate, wherein:
a position of the photosensitive substrate is controlled with a measuring beam in a direction different from a first direction in which first and second areas are arranged and a second direction perpendicular thereto, between transfer of the pattern to the first area on the photosensitive substrate and transfer of the pattern to the second area adjacent to the first area on the photosensitive substrate. - View Dependent Claims (130, 131)
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132. A method for producing a stage apparatus, comprising:
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providing a first movable member which is movable in a two-dimensional plane while holding a substrate;
providing a first reflecting surface on the first movable member to extend in a direction intersecting a predetermined first axis and a second axis perpendicular thereto in the two-dimensional plane;
providing a first interferometer which measures a position of the first movable member in a third axis direction by perpendicularly radiating a measuring beam onto the first reflecting surface and receiving a reflected light beam therefrom; and
providing a calculating unit which calculates a position coordinate on a rectangular coordinate system defined by the first axis and the second axis of the first movable member, on the basis of a measured value obtained by the first interferometer. - View Dependent Claims (133, 134)
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135. A method for producing a scanning type exposure apparatus which exposes a substrate by transferring a pattern formed on a mask onto the substrate, the method comprising:
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producing a stage apparatus by providing a substrate stage which is movable in a two-dimensional plane while holding the substrate, a first reflecting surface which is provided on the substrate stage to extend in a direction intersecting a predetermined first axis and a second axis perpendicular thereto in the two-dimensional plane, a first interferometer which measures a position of the substrate stage in a third axis direction by perpendicularly radiating a measuring beam onto the first reflecting surface and receiving a reflected light beam therefrom, and a calculating unit which calculates a position coordinate on a rectangular coordinate system defined by the first axis and the second axis of the substrate stage, on the basis of a measured value obtained by the first interferometer respectively;
providing a mask stage which holds the mask; and
providing a stage control system which relatively moves the mask stage and the substrate stage in synchronization with each other in a direction of the first axis, wherein;
the scanning type exposure apparatus is operated such that the pattern formed on the mask is transferred to the substrate on the substrate stage during relative movement of the mask stage and the substrate stage effected by the stage control system.
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136. A method for producing a stage apparatus, comprising:
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providing a base board;
providing a first movable member which is movable relative to the base board which holds a substrate;
arranging, on the base board, a second movable member which arranges the first movable member thereon, the second movable member being movable relative to the base board and the first movable member respectively; and
providing a driving unit which moves the first movable member in a two-dimensional plane, wherein;
the stage apparatus is constructed such that the second movable member is moved in accordance with a reaction force generated by the movement of the first movable member.
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137. A method for producing a scanning type exposure apparatus, comprising:
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producing a stage apparatus by providing a base board;
a first movable member which is movable relative to the base board and holds a substrate;
a second movable member which arranges the first movable member thereon, the second movable member being arranged on the base board and being movable relative to the base board and the first movable member respectively; and
a driving unit which moves the first movable member in a two-dimensional plane respectively;
whereby the second movable member is moved in accordance with a reaction force generated by the movement of the first movable member;
providing a mask stage which holds a mask;
providing a projection optical system having an optical axis perpendicular to the mask and the substrate respectively;
providing a first pedestal which supports the projection optical system and suspends the base board thereby; and
providing a vibration-preventive apparatus which supports the first pedestal, wherein;
the scanning type exposure apparatus is operated such that a pattern on the mask is transferred onto the substrate via the projection optical system by synchronously moving the mask and the substrate by the aid of the mask stage and the stage apparatus.
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138. A method for producing a scanning type exposure apparatus which transfers a pattern on a mask onto a substrate by synchronously moving the mask and the substrate, the method comprising:
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providing a substrate stage which places the substrate thereon;
providing, on the substrate stage, a first reflecting surface extending in a direction intersecting a first direction in which the substrate is synchronously moved and a second direction perpendicular thereto respectively, and a second reflecting surface extending in the second direction; and
providing first and second interferometers which radiates measuring beams onto the first and second reflecting surfaces respectively.
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139. A scanning type exposure apparatus for successively transferring a pattern on a mask to a plurality of shot areas on a photosensitive substrate by synchronously-moving the mask and-the photosensitive substrate, the apparatus comprising:
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a substrate stage which is movable in a two-dimensional plane while holding the photosensitive substrate;
a mask stage which is movable while holding the mask; and
a stage control system which controls both of the substrate and mask stages so that run-up operation for exposure for the next shot is performed for the substrate stage after completion of exposure simultaneously with stepping operation in a non-scanning direction for the exposure for the next shot in a concurrent manner, and the stepping operation in the non-scanning direction is completed before a synchronous settling period for the both stages before the exposure for the next shot. - View Dependent Claims (140)
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141. A scanning exposure method for successively transferring a pattern on a mask to a plurality of comparted areas on a substrate, the method comprising:
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synchronously moving the mask and the substrate to perform scanning exposure for a certain comparted area of the plurality of comparted areas; and
starting acceleration of the substrate in a first direction in which the substrate is synchronously moved before completing stepping operation for the substrate in a second direction after completing the scanning exposure for the certain comparted area in order to perform scanning exposure for another comparted area adjacent to the certain comparted area in the second direction perpendicular to the first direction, and completing the stepping operation before synchronous settling period for the mask and the substrate before the scanning exposure for the another comparted area. - View Dependent Claims (142, 143, 144, 145, 146, 147, 148, 149, 150, 151, 152, 153, 154, 167, 168, 169, 178)
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159. A scanning exposure method for successively transferring a pattern on a mask to a first comparted area and a second comparted area on a substrate, arranged in a second direction perpendicular to a first direction in which the substrate is synchronously moved, by synchronously moving the mask and the substrate, the method comprising:
starting acceleration of the substrate and acceleration of the mask in order to perform scanning exposure for the second comparted area before a velocity component of the substrate in the second direction is zero after completing scanning exposure for the first comparted area. - View Dependent Claims (160, 161, 162, 163, 164, 165, 170, 171)
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172. A scanning exposure method for successively transferring a pattern on a mask to a first comparted area and a second comparted area on a substrate, arranged in a second direction perpendicular to a first direction in which the substrate is synchronously moved, by synchronously moving the mask and the substrate, wherein:
during a period between first scanning exposure for the first comparted area and second scanning exposure for the second comparted area, acceleration of the substrate in the second direction is started before a velocity component of the substrate in the first direction is zero after completing the first scanning exposure, and acceleration of the substrate in the first direction and acceleration of the mask are started before a velocity component of the substrate in the second direction is zero. - View Dependent Claims (173, 174, 175, 176, 177, 190, 191)
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179. A scanning exposure method for transferring a pattern on a mask to one or more comparted areas on a substrate by synchronously moving the mask and the substrate, wherein:
at least one of the mask and the substrate is accelerated in a direction of the synchronous movement on the basis of a rate of acceleration variation curve along which a rate of acceleration is gradually converged to zero, prior to the synchronous movement of the mask and the substrate when scanning exposure-is performed for the respective comparted areas. - View Dependent Claims (180)
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181. A scanning exposure method for successively transferring a pattern on a mask to a first comparted area and a second comparted area on a substrate, arranged in a second direction perpendicular to a first direction in which the substrate is synchronously moved, by synchronously moving the mask and the substrate, comprising:
performing scanning exposure for at least the first comparted area, wherein at least one of the mask and the substrate is accelerated in the first direction on the basis-of a rate of acceleration variation curve along which a rate of acceleration is gradually converged to zero prior to the synchronous movement of the mask and the substrate, and the at least one of the mask and the substrate is decelerated in the first direction at a constant rate of deceleration after completing the synchronous movement. - View Dependent Claims (182)
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183. A scanning exposure method for transferring a pattern on a mask onto a substrate by synchronously moving the mask and the substrate with respect to an area onto which an energy beam is radiated, the method comprising:
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starting the movement of the mask and the substrate while accelerating the mask and the substrate;
allowing the mask and the substrate to arrive at a constant velocity while continuously decreasing a rate of acceleration of one of the mask and the substrate; and
executing scanning exposure when the mask and the substrate are moved at the constant velocity. - View Dependent Claims (184)
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185. A method for producing a scanning type exposure apparatus which successively transfers a pattern on a mask to a plurality of shot areas on a photosensitive substrate by synchronously moving the mask and the photosensitive substrate, the method comprising:
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providing a substrate stage which is movable in a two-dimensional plane while holding the photosensitive substrate;
providing a mask stage which is movable while holding the mask; and
providing a stage control system which controls the both stages so that run-up operation for exposure for the next shot is performed for the substrate stage after completion of exposure simultaneously with stepping operation in a non-scanning direction for the exposure for the next shot in a concurrent manner, and the stepping operation in the non-scanning direction is completed before a synchronous settling period for the both stages before the exposure for the next shot.
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Specification