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Apparatus and method for dynamic diagnostic testing of integrated circuits

  • US 20030146761A1
  • Filed: 08/26/2002
  • Published: 08/07/2003
  • Est. Priority Date: 02/01/2002
  • Status: Active Grant
First Claim
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1. A method for measuring electrical characteristics of an integrated circuit, said method comprising:

  • injecting a test signal into said integrated circuit by stimulating predetermined areas of said integrated circuit using a stimulating energy source;

    detecting an electrical activity within said integrated circuit in response to said injected test signal using a detector; and

    determining said characteristics of said integrated circuit based on said detected electrical activity.

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