Time variant defect correcting method and apparatus in infrared thermal imaging system

• US 20030146975A1
• Filed: 05/31/2002
• Published: 08/07/2003
• Est. Priority Date: 02/07/2002
• Status: Abandoned Application

• Current Assignee: Samsung Thales Company Limited (Hanwha Corporation)
• Original Assignee: Samsung Thales Company Limited (Hanwha Corporation)
• Inventors: Ko, Jin-Sin, Joung, Shi-Chang
• Application Number:
  US10/159,472
• Publication Number:
  US 20030146975A1
• Time in Patent Office: Days
• US Class Current: 348/164
• CPC Class Codes: H04N 25/671 for non-uniformity detection or correction
• CPC Class Codes: H04N 25/683 by defect estimation performed on the scene signal, e.g. real time or on the fly detection
• CPC Class Codes: H04N 5/33 Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20

Abstract

There is provided a time variant defect correcting method in an infrared thermal imaging system. Digital video signals representing a frame are received and it is determined whether a first pixel from the frame is likely to be a defect. If the first pixel is likely to be a defect, the number of defect determinations for the first pixel is counted and the count value is compared with a threshold count. If the count value is equal to or less than the threshold count, digital video signals representing a next frame are received and it is determined whether the first pixel in the next frame is likely to be a defect. If the count value exceeds the threshold count, the first pixel is registered as a defect and corrected.

Claims

1. A time variant defect correcting method for an infrared thermal imaging system, comprising the steps of:

(1) receiving digital video signals representing a frame;

(2) determining whether a first pixel from the frame is likely to be a defect;

(3) counting the number of defect determinations for the first pixel if the first pixel is likely to be a defect;

(4) comparing the count value with a threshold count;

(5) receiving digital video signals representing a next frame and determining whether a next pixel in a position corresponding to the first pixel in the next frame is likely to be a defect, if the count value is equal to or less than the threshold count; and

(6) defect correcting the first pixel if the count value exceeds the threshold count.

2. The time variant defect correcting method of claim 1, wherein the step of (2) comprises the steps of:

calculating a plurality of edge values of the first pixel with respect to at least two of pixels adjacent to the first pixel; and

determining that the first pixel is likely to be a defect if each of the plurality of edge values exceeds a threshold edge value.

3. The time variant defect correcting method of claim 1, wherein the step of (2) comprises the steps of:

calculating a plurality of edge values of the first pixel with respect to at least two of pixels adjacent to the first pixel;

calculating the average display level of the adjacent pixels if each of the edge values exceeds a threshold edge value;

calculating the difference between the calculated average display level and the average display level of the adjacent pixels in a previous frame; and

determining that the first pixel is likely to be a defect if the difference exceeds a predetermined threshold average difference.

4. The time variant defect correcting method of claim 2, wherein the plurality of edge values of the first pixel with respect to the at least two adjacent pixels are calculated by |2×

A−

(B+C)| where A is the display level of the first pixel and B and C are the display levels of pixels adjacent to the first pixel in a vertical, horizontal, or diagonal direction.

5. The time variant defect correcting method of claim 3, wherein the plurality of edge values of the first pixel with respect to the at least two adjacent pixels are calculated by |2×

A−

(B+C)| where A is the display level of the first pixel and B and C are the display levels of pixels adjacent to the first pixel in a vertical, horizontal, or diagonal direction.

6. The time variant defect correcting method of claim 3, wherein the threshold average difference is set according to a temperature uniformness and motion degree of an input thermal image by a manufacturer or a user.

7. The time variant defect correcting method of claim 1, further comprising the step of determining whether a second pixel in the frame is likely to be a defect, if the first pixel is not likely to be a defect in the step of (2).

8. The time variant defect correcting method of claim 1, wherein the defect correcting is performed by replacing a display level of the first pixel with an average display level of the adjacent pixels.

9. The time variant defect correcting method of claim 1, wherein the defect correcting is performed by replacing a display level of the first pixel with an display level of one of the adjacent pixels.

10. A time variant defect correcting method in an infrared thermal imaging system, comprising the steps of:

receiving digital video signals representing a frame;

calculating edge values of a first pixel in the frame with respect to at least two of pixels adjacent to the first pixel;

counting the number of defect determinations made for the first pixel if the edge values exceed a threshold edge value;

receiving digital video signals representing a next frame and calculating the edge values of a next pixel that has a position corresponding to the first pixel in the next frame with respect to at least two of pixels adjacent to the pixel, if the count value is equal to or less than a threshold count; and

registering the first pixel as a defect and correcting the defect, if the count value exceeds the threshold count.

11. A time variant defect correcting method in an infrared thermal imaging system, comprising the steps of:

receiving digital video signals representing a frame;

calculating edge values of a first pixel in the frame with respect to at least two of pixels adjacent to the first pixel;

calculating an average display level of the adjacent pixels if the edge values exceed a threshold edge value;

calculating the difference between the calculated average display level and the average display level of the adjacent pixels in a previous frame;

counting the number of defect determinations made for the first pixel if the difference exceeds a threshold average difference;

receiving digital video signals representing a next frame and calculating the edge values of the first pixel in the next frame with respect to at least two of pixels adjacent the first pixel, if the count value is equal to or less than a threshold count; and

registering the first pixel as a defect and correcting the defect, if the count value exceeds the threshold count.

12. A time variant defect correcting apparatus in an infrared thermal imaging system, comprising:

a first memory for receiving digital video signals representing a frame at every frame period;

an image processor for determining whether a first pixel from the frame is likely to be a defect, counting a number of defect determinations for the first pixel if the first pixel is likely to be a defect, comparing the count value with a threshold count, receiving digital video signals representing a next frame and determining whether a next pixel that has a position corresponding to the first pixel in the next frame is likely to be a defect, if the count value is equal to or less than the count threshold, and registering the first pixel as a defect and correcting the defect, if the count value exceeds the threshold count; and

a second memory for storing the location of the first pixel registered as a defect.

13. The time variant defect correcting apparatus of claim 12, wherein the image processor calculates the edge values of the first pixel with respect to at least two of pixels adjacent to the first pixel, and determines that the first pixel is likely to be a defect if the edge values exceed a threshold edge value.

14. The time variant defect correcting apparatus of claim 12, wherein the image processor calculates the edge values of the first pixel with respect to at least two of pixels adjacent to the first pixel, calculates the average display level of the adjacent pixels if the edge values exceed a threshold edge value, calculates the difference between the calculated average display level and the average display level of the adjacent pixels in a previous frame, and determines that the first pixel is likely to be a defect if the difference exceeds a predetermined threshold average difference.

15. The time variant defect correcting apparatus of claim 14, wherein the threshold average difference is set according to a temperature uniformness and motion degree of an input thermal image by a manufacturer or a user.

16. The time variant defect correcting apparatus of claim 12, wherein the image processor corrects the defect by replacing a display level of the first pixel registered as a defect with an average display level of the adjacent pixels.

17. The time variant defect correcting apparatus of claim 12, wherein the image processor corrects the defect by replacing a display level of the first pixel registered as a defect with a display level of one of the adjacent pixels.

18. A memory medium including code for correcting time variant defects, the code when executed causes an infrared thermal imaging system to perform steps comprising;

(1) receiving digital video signals representing a frame;

(2) determining whether a first pixel from the frame is likely to be a defect;

(3) counting the number of defect determinations for the first pixel if the first pixel is likely to be a defect;

(4) comparing the count value with a threshold count;

(5) receiving digital video signals representing a next frame and determining whether a next pixel in a position corresponding to the first pixel in the next frame is likely to be a defect, if the count value is equal to or less than the threshold count; and

(6) defect correcting the first pixel if the count value exceeds the threshold count.

19. The memory medium of claim 18, wherein the step of (2) comprises the steps of:

calculating a plurality of edge values of the first pixel with respect to at least two of pixels adjacent to the first pixel; and

determining that the first pixel is likely to be a defect if each of the plurality of edge values exceeds a threshold edge value.

20. The memory medium of claim 19, wherein the step of (2) comprises the steps of:

calculating a plurality of edge values of the first pixel with respect to at least two of pixels adjacent to the first pixel;

calculating the average display level of the adjacent pixels if each of the edge values exceeds a threshold edge value;

calculating the difference between the calculated average display level and the average display level of the adjacent pixels in a previous frame; and

determining that the first pixel is likely to be a defect if the difference exceeds a predetermined threshold average difference.