Deposition of tungsten films
First Claim
1. A method of forming a composite tungsten film, comprising:
- sequentially depositing tungsten nucleation layers and tungsten bulk layers on a substrate to form a composite tungsten layer, wherein each of the tungsten nucleation layers and the tungsten bulk layers have a thickness less than about 300 Å
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Abstract
A method of forming a composite tungsten film on a substrate is described. The composite tungsten film comprises sequentially deposited tungsten nucleation layers and tungsten bulk layers. Each of the tungsten nucleation layers and the tungsten bulk layers have a thickness less than about 300 Å. The tungsten nucleation layers and the tungsten bulk layers are formed one over the other until a desired thickness for the composite tungsten film is achieved. The resulting composite tungsten film exhibits good film morphology. The tungsten nucleation layers may be formed using a cyclical deposition process by alternately adsorbing a tungsten-containing precursor and a reducing gas on the substrate. The tungsten bulk layers may be formed using a chemical vapor deposition (CVD) process by thermally decomposing a tungsten-containing precursor.
219 Citations
43 Claims
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1. A method of forming a composite tungsten film, comprising:
sequentially depositing tungsten nucleation layers and tungsten bulk layers on a substrate to form a composite tungsten layer, wherein each of the tungsten nucleation layers and the tungsten bulk layers have a thickness less than about 300 Å
.- View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A method of forming a composite tungsten film, comprising:
sequentially depositing tungsten nucleation layers and tungsten bulk layers on a substrate to form a composite tungsten layer, wherein each of the tungsten nucleation layers is deposited by alternately adsorbing a tungsten-containing precursor and a reducing gas on the substrate and wherein each of the tungsten bulk layers is deposited by thermally decomposing a gas mixture comprising a tungsten-containing precursor. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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28. A method of forming a composite tungsten film for use in a memory cell, comprising:
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providing a substrate structure, wherein the substrate structure includes an insulating material having at least one aperture therein; and
sequentially depositing tungsten nucleation layers and tungsten bulk layers on a substrate to form a composite tungsten layer, wherein each of the tungsten nucleation layers and the tungsten bulk layers have a thickness less than about 300 Å
. - View Dependent Claims (29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43)
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Specification