Temperature calibration using on-chip electrical fuses

• US 20030158683A1
• Filed: 02/19/2002
• Published: 08/21/2003
• Est. Priority Date: 02/19/2002
• Status: Abandoned Application

• Current Assignee: Sun Microsystems Incorporated (Oracle Corporation)
• Original Assignee: Sun Microsystems Incorporated (Oracle Corporation)
• Inventors: Liu, Dean, Gauthier, Claude, Gold, Spencer, Amick, Brian, Zarrineh, Kamran, Trivedi, Pradeep
• Application Number:
  US10/078,760
• Publication Number:
  US 20030158683A1
• Time in Patent Office: Days
• US Class Current: 702/99
• CPC Class Codes: G01D 3/022 having an ideal characteristic, map or correction data stored in a digital memory
• CPC Class Codes: G01K 15/00 Testing or calibrating of thermometers

Abstract

An integrated circuit that uses electrical fuses to store calibration information of a thermal monitoring device residing on the integrated circuit is provided. Such an integrated circuit allows a service processor of a computer system to query the integrated circuit for calibration information so that an accurate actual temperature measurement may be determined. Further, a method for reading and storing temperature calibration information on-chip is provided.

Claims

1. An integrated circuit, comprising:

a thermal monitoring device; and

an electrical fuse register,

wherein the electrical fuse register is used to store calibration information of the thermal monitoring device.

2. The integrated circuit of claim 1, wherein the thermal monitoring device is a thermal sensor disposed on the integrated circuit.

3. The integrated circuit of claim 1, further comprising:

a test processor unit comprising the electrical fuse register, and wherein the test processor unit controls the thermal monitoring device.

4. The integrated circuit of claim 1, wherein the test processor unit is accessible by a service processor.

5. The integrated circuit of claim 1, wherein the electrical fuse register comprises:

a first plurality of electrical fuses that are used to represent a calibration value of the thermal monitoring device; and

a second plurality of electrical fuses that are used to represent a temperature at which the calibration value of the thermal monitoring device was attained.

6. The integrated circuit of claim 5, wherein the value of the first and second pluralities of electrical fuses are digital words that can be read out from a test processor unit residing on the integrated circuit.

7. A method for storing temperature calibration information of a thermal sensor on an integrated circuit, comprising:

taking a calibration measurement of the thermal sensor; and

storing the calibration measurement into an electrical fuse register, wherein the electrical fuse register resides on the integrated circuit,

wherein taking the calibration measurement of the thermal sensor occurs at a known temperature.

8. The method of claim 7, further comprising:

storing a value of the known temperature into the electrical fuse register.

9. The method of claim 7, wherein the thermal sensor is disposed on the integrated circuit.

10. The method of claim 7, wherein the electrical fuse register is associated with the thermal sensor.

11. The method of claim 7, wherein a calibration sensor takes the calibration measurement of the thermal sensor, and wherein the calibration sensor operates independent of the integrated circuit.

12. A method for determining an actual temperature at a location on an integrated circuit, comprising:

taking a calibration measurement, at a known temperature, from a thermal monitoring device disposed at the location;

storing the calibration measurement in an electrical fuse register disposed on the integrated circuit; and

reading out the calibration measurement from the electrical fuse register,

wherein the actual temperature at the location is determined based on the known temperature and the calibration measurement.

13. The method of claim 12, further comprising:

storing a value of the known temperature in the electrical fuse register.

14. The method of claim 12, wherein the thermal monitoring device is a thermal sensor.

15. The method of claim 12, wherein a calibration sensor, operating independent of the integrated circuit, takes the calibration measurement from the thermal monitoring device and stores the calibration measurement in the electrical fuse register.

16. The method of claim 12, wherein fuses within the electrical fuse register represent binary values that can be read out to a service processor, wherein the service processor determines the actual temperature dependent on the binary values.

17. A method for determining a temperature on an integrated circuit, comprising:

a step for taking a calibration information of a thermal sensor residing on the integrated circuit;

a step for storing the calibration information on the integrated circuit; and

a step for reading out the calibration information when the temperature needs to be determined.

18. An integrated circuit, comprising:

means for storing calibration information on the integrated circuit; and

means for reading out the calibration information when a temperature on the integrated circuit needs to be determined.